Impact of mixing of disturbed bonding states on time-dependent dielectric breakdown in SiO2 thin films
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2017 ◽
Vol 35
(2)
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pp. 021509
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2004 ◽
Vol 151
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pp. G795
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1993 ◽
Vol 140
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pp. L133-L135
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2021 ◽
Vol 68
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pp. 2220-2225
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2007 ◽
Vol 46
(No. 28)
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pp. L691-L692
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