(Ta1−xNbx)2O5 films produced by atomic layer deposition: Temperature dependent dielectric spectroscopy and room-temperature I–V characteristics
2003 ◽
Vol 93
(12)
◽
pp. 10146-10147
◽
Atomic layer deposition temperature dependent minority carrier generation in ZrO2/GeO2/Ge capacitors
2011 ◽
Vol 29
(1)
◽
pp. 01A806
◽
Keyword(s):
2017 ◽
Vol 35
(1)
◽
pp. 01B127
◽
2018 ◽
Vol 65
(10)
◽
pp. 4513-4519
2020 ◽
Vol 124
(47)
◽
pp. 25846-25858
Keyword(s):