Influence of superlattice and antiphase domain boundaries on dielectric loss in Ba[Mg1∕3(Nbx∕4Ta(4−x)∕4)2∕3]O3 ceramics

2005 ◽  
Vol 87 (10) ◽  
pp. 102905 ◽  
Author(s):  
Chen-Fu Lin ◽  
Horng-Hwa Lu ◽  
Tien-I Chang ◽  
Jow-Lay Huang
Author(s):  
P. R. Swann ◽  
W. R. Duff ◽  
R. M. Fisher

Recently we have investigated the phase equilibria and antiphase domain structures of Fe-Al alloys containing from 18 to 50 at.% Al by transmission electron microscopy and Mössbauer techniques. This study has revealed that none of the published phase diagrams are correct, although the one proposed by Rimlinger agrees most closely with our results to be published separately. In this paper observations by transmission electron microscopy relating to the nucleation of disorder in Fe-24% Al will be described. Figure 1 shows the structure after heating this alloy to 776.6°C and quenching. The white areas are B2 micro-domains corresponding to regions of disorder which form at the annealing temperature and re-order during the quench. By examining specimens heated in a temperature gradient of 2°C/cm it is possible to determine the effect of temperature on the disordering reaction very precisely. It was found that disorder begins at existing antiphase domain boundaries but that at a slightly higher temperature (1°C) it also occurs by homogeneous nucleation within the domains. A small (∼ .01°C) further increase in temperature caused these micro-domains to completely fill the specimen.


Author(s):  
Y. H. Liu

Ordered Ni3Fe crystals possess a LI2 type superlattice similar to the Cu3Au structure. The difference in slip behavior of the superlattice as compared with that of a disordered phase has been well established. Cottrell first postulated that the increase in resistance for slip in the superlattice structure is attributed to the presence of antiphase domain boundaries. Following Cottrell's domain hardening mechanism, numerous workers have proposed other refined models also involving the presence of domain boundaries. Using the anomalous X-ray diffraction technique, Davies and Stoloff have shown that the hardness of the Ni3Fe superlattice varies with the domain size. So far, no direct observation of antiphase domain boundaries in Ni3Fe has been reported. Because the atomic scattering factors of the elements in NijFe are so close, the superlattice reflections are not easily detected. Furthermore, the domain configurations in NioFe are thought to be independent of the crystallographic orientations.


Author(s):  
Z.M. Wang ◽  
J.P. Zhang

High resolution electron microscopy reveals that antiphase domain boundaries in β-Ni3Nb have a hexagonal unit cell with lattice parameters ah=aβ and ch=bβ, where aβ and bβ are of the orthogonal β matrix. (See Figure 1.) Some of these boundaries can creep “upstairs” leaving an incoherent area, as shown in region P. When the stepped boundaries meet each other, they do not lose their own character. Our consideration in this work is to estimate the influnce of the natural misfit δ{(ab-aβ)/aβ≠0}. Defining the displacement field at the boundary as a phase modulation Φ(x), following the Frenkel-Kontorova model [2], we consider the boundary area to be made up of a two unit chain, the upper portion of which can move and the lower portion of the β matrix type, assumed to be fixed. (See the schematic pattern in Figure 2(a)).


2021 ◽  
Vol 103 (6) ◽  
Author(s):  
Bo Yuan ◽  
Subin Kim ◽  
Sae Hwan Chun ◽  
Wentao Jin ◽  
C. S. Nelson ◽  
...  

1991 ◽  
Vol 220 ◽  
Author(s):  
J. B. Posthill ◽  
D. P. Malta ◽  
R. Venkatasubramanian ◽  
P. R. Sharps ◽  
M. L. Timmons ◽  
...  

ABSTRACTInvestigation has continued into the use of SixGe1−x multilayer structures (MLS) as a buffer layer between a Si substrate and a GaAs epitaxial layer in order to accommodate the 4.1% lattice mismatch. SixGe1−x 4-layer and 5-layer structures terminating in pure Ge have been grown using molecular beam epitaxy. Subsequent GaAs heteroepitaxy has allowed evaluation of these various GaAs/SixGe1−xMLS/Si (100) structures. Antiphase domain boundaries have been eliminated using vicinal Si (100) substrates tilted 6° off-axis toward [011], and the etch pit density in GaAs grown on a 5-layer SixGe1−x MLS on vicinal Si (lOO) was measured to be 106 cm−2.


1994 ◽  
Vol 75 (1) ◽  
pp. 143-152 ◽  
Author(s):  
Ph. Komninou ◽  
J. Stoemenos ◽  
G. P. Dimitrakopulos ◽  
Th. Karakostas

1993 ◽  
Vol 319 ◽  
Author(s):  
Long-Qing Chen

AbstractA computer simulation technique based on the Master Equation Method (MEM) is developed for modeling the spatial distribution of vacancies during ordering and subsequent domain coalescence and coarsening. A vacancy mechanism is assumed for the atomic diffusion and the single-site approximation is employed. It is demonstrated that vacancies strongly segregate into the antiphase domain boundaries (APBs) during coarsening, resulting in the vacancy concentration at APBs more than an order of magnitude higher than that inside the ordered domains. As the antiphase domains coarsen, the vacancy concentration at the APBs continues to increase and its spatial s segregation profile moves accompanying the APB migration. The effect of vacancy concentration on the antiphase domain coarsening kinetics is discussed.


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