The cubic and rod-shaped powders of indium tin oxide were synthesized at a stable temperature reaction for 18h using the surfactant aid hydrothermal method under various conditions. The cubic and rod-shaped powder size changes with the concentration of the precursor. The finished products of indium tin oxide can be obtained by calcination at 500°C for 2h in air. Characterization was conducted using scanning electron microscopy (SEM), energy dispersive spectrometry (EDS), X-ray diffractometry (XRD), thermogravimetric analyzer/differential thermal analysis (TG/DTA) and the Brunauer-Emmett-Teller (BET). XRD analysis shows that the conditions of this experiment can produce pure ITO powders. The characterization of cubic and rod-shaped ITO powders is also discussed.
The cubic and rod-shaped powders of indium tin oxide were synthesized at a stable temperature reaction for 18h using the surfactant aid hydrothermal method under various conditions. The cubic and rod-shaped powder size changes with the concentration of the precursor. The finished products of indium tin oxide can be obtained by calcination at 500°C for 2h in air. Characterization was conducted using scanning electron microscopy (SEM), energy dispersive spectrometry (EDS), X-ray diffractometry (XRD), thermogravimetric analyzer/differential thermal analysis (TG/DTA) and the Brunauer-Emmett-Teller (BET). XRD analysis shows that the conditions of this experiment can produce pure ITO powders. The characterization of cubic and rod-shaped ITO powders is also discussed.
AbstractRapid progress in the development of new electronic materials and the steady maturation of silicon-based technologies has resulted in a host of novel electronic devices in which the active region of the structure is confined to an interface or a surface. The chemical, electronic, and physical characterization of surfaces and interfaces in semiconductors and insulators is of critical importance to manufacturing process control as well as to the fundamental electron physics and materials science which support microelectronic device research.
Characterization of functionalized glass and indium tin oxide surfaces as substrates for super-resolution microscopy