scholarly journals Characterization of TaSi2–Si composites for use as wide‐bandpass optical elements for synchrotron radiation

1996 ◽  
Vol 79 (9) ◽  
pp. 6803-6810 ◽  
Author(s):  
S. R. Stock ◽  
Z. U. Rek ◽  
M. S. Goorsky
Keyword(s):  
Synchrotron Radiation ◽  
Optical Elements

Characterization of Rh/Si multilayer structure by HREM and HAADF

1992 ◽  
Vol 50 (1) ◽  
pp. 122-123
Author(s):  
Y. Cheng ◽  
J. Liu ◽  
M.B. Stearns ◽  
D.G. Steams
Keyword(s):  
Normal Incidence ◽  
High Resolution Electron Microscopy ◽  
X Rays ◽  
Beam Direction ◽  
Cross Sectional ◽  
Optical Elements ◽  
Resolution Electron ◽  
Point To Point ◽  
Better Than

The Rh/Si multilayer (ML) thin films are promising optical elements for soft x-rays since they have a calculated normal incidence reflectivity of ∼60% at a x-ray wavelength of ∼13 nm. However, a reflectivity of only 28% has been attained to date for ML fabricated by dc magnetron sputtering. In order to determine the cause of this degraded reflectivity the microstructure of this ML was examined on cross-sectional specimens with two high-resolution electron microscopy (HREM and HAADF) techniques.Cross-sectional specimens were made from an as-prepared ML sample and from the same ML annealed at 298 °C for 1 and 100 hours. The specimens were imaged using a JEM-4000EX TEM operating at 400 kV with a point-to-point resolution of better than 0.17 nm. The specimens were viewed along Si [110] projection of the substrate, with the (001) Si surface plane parallel to the beam direction.

scholarly journals Characterization of two types of cesium-bearing microparticles emitted from the Fukushima accident via multiple synchrotron radiation analyses

2020 ◽  
Vol 10 (1) ◽  
Author(s):  
Hikaru Miura ◽  
Yuichi Kurihara ◽  
Masayoshi Yamamoto ◽  
Aya Sakaguchi ◽  
Noriko Yamaguchi ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
Fukushima Accident

scholarly journals Precise and nondestructive characterization of a ‘buried’ nanostructure in a polymer thin film using synchrotron radiation ultra-small angle X-ray scattering

2012 ◽  
Vol 45 (3) ◽  
pp. 307-312 ◽  
Author(s):  
Takamichi Shinohara ◽  
Tomoko Shirahase ◽  
Daiki Murakami ◽  
Taiki Hoshino ◽  
Moriya Kikuchi ◽  
...  
Keyword(s):  
Thin Film ◽  
Synchrotron Radiation ◽  
Small Angle ◽  
Polymer Thin Film ◽  
X Ray ◽  
X Ray Scattering ◽  
Nondestructive Characterization ◽  
Ray Scattering

3-Dimensional Characterization of Polycrystalline Bulk Materials Using High-Energy Synchrotron Radiation

2007 ◽  
Vol 539-543 ◽  
pp. 2353-2358 ◽  
Author(s):  
Ulrich Lienert ◽  
Jonathan Almer ◽  
Bo Jakobsen ◽  
Wolfgang Pantleon ◽  
Henning Friis Poulsen ◽  
...  
Keyword(s):  
High Resolution ◽  
Synchrotron Radiation ◽  
High Energy ◽  
Mapping Technique ◽  
X Ray Diffraction ◽  
Bulk Materials ◽  
Reciprocal Space Mapping ◽  
3 Dimensional ◽  
Individual Grains

The implementation of 3-Dimensional X-Ray Diffraction (3DXRD) Microscopy at the Advanced Photon Source is described. The technique enables the non-destructive structural characterization of polycrystalline bulk materials and is therefore suitable for in situ studies during thermo-mechanical processing. High energy synchrotron radiation and area detectors are employed. First, a forward modeling approach for the reconstruction of grain boundaries from high resolution diffraction images is described. Second, a high resolution reciprocal space mapping technique of individual grains is presented.

scholarly journals Crystallization and preliminary X-ray characterization of the 2,4′-dihydroxyacetophenone dioxygenase fromAlcaligenessp. 4HAP

2014 ◽  
Vol 70 (6) ◽  
pp. 823-826 ◽  
Author(s):  
G. Beaven ◽  
A. Bowyer ◽  
P. Erskine ◽  
S. P. Wood ◽  
A. McCoy ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
Formic Acid ◽  
Molecular Oxygen ◽  
Aromatic Ring ◽  
Bond Cleavage ◽  
Its Sequence ◽  
Hydroxybenzoic Acid ◽  
X Ray

The enzyme 2,4′-dihydroxyacetophenone dioxygenase (or DAD) catalyses the conversion of 2,4′-dihydroxyacetophenone to 4-hydroxybenzoic acid and formic acid with the incorporation of molecular oxygen. Whilst the vast majority of dioxygenases cleave within the aromatic ring of the substrate, DAD is very unusual in that it is involved in C—C bond cleavage in a substituent of the aromatic ring. There is evidence that the enzyme is a homotetramer of 20.3 kDa subunits each containing nonhaem iron and its sequence suggests that it belongs to the cupin family of dioxygenases. By the use of limited chymotrypsinolysis, the DAD enzyme fromAlcaligenessp. 4HAP has been crystallized in a form that diffracts synchrotron radiation to a resolution of 2.2 Å.

scholarly journals Static Atomic Displacements in Crystalline Solid Solution Alloys

1996 ◽  
Vol 437 ◽  
Author(s):  
Gene Ice ◽  
Cullie Sparks ◽  
J. Lee Robertson ◽  
J. Ernest Epperson ◽  
Xiaogang Jiang
Keyword(s):  
Synchrotron Radiation ◽  
Crystalline Solid ◽  
Local Order ◽  
Chemical Order ◽  
X Ray ◽  
Atomic Displacements ◽  
X Ray Scattering ◽  
New Information ◽  
Z Contrast

AbstractAtom size differences induce static displacements from an average alloy lattice and play an important role in controlling alloy phase stability and properties. The details of this role however, are difficult to study; chemical order and displacements are strongly interrelated and static displacements are hard to measure. Diffuse x-ray scattering measurements with tunable-synchrotron radiation can now measure element-specific static displacements with an accuracy of ± 0.1 pm and can simultaneously measure local chemical order out to 20 shells or more. Ideal alloys for diffuse scattering analysis with synchrotron radiation, are those that have previously been the most intractable: alloys with small Z contrast, alloys with only local order and alloys with small size differences. The combination of precise characterization of local chemical order and precise measurement of static displacement provides new information that challenges existing alloy models. We report on an ongoing systematic study of static displacements in the Fe/Ni/Cr alloys and compare the observed static displacements to the static displacements predicted by current theories. The availability of more brilliant 3rd generation hard x-ray sources will greatly enhance these measurements.

Characterization of resonance domain diffractive optical elements

2005 ◽  
Author(s):  
Michael A. Golub ◽  
Leon Eisen ◽  
Asher A. Friesem ◽  
Michael Meyklyar
Keyword(s):  
Diffractive Optical Elements ◽  
Optical Elements ◽  
Resonance Domain

Characterization of III-nitride Based Schottky UV Detectors with Wide Detectable Wavelength Range (360–10 nm) using Synchrotron Radiation

2003 ◽  
Vol 798 ◽  
Author(s):  
Atsushi Motogaito ◽  
Kazumasa Hiramatsu ◽  
Yasuhiro Shibata ◽  
Hironobu Watanabe ◽  
Hideto Miyake ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
Schottky Barrier ◽  
Wavelength Range ◽  
Epitaxial Layer ◽  
Device Performance ◽  
Uv Detectors ◽  
X Ray ◽  
High Responsivity ◽  
Vacuum Uv

ABSTRACTCharacterizations of transparent Schottky barrier GaN and AlGaN UV detectors in the vacuum UV (VUV) and soft X-ray (SX) region using synchrotron radiation are described. In the GaN UV detectors, the responsivity achieved about 0.05 A/W at 95 eV (13 nm). Thus, their device performance is shown between 3.4 and 100 eV (10 and 360 nm). Furthermore, the high responsivity spectra were realized by using AlGaN Schottky UV detectors consisting of Al0.5Ga0.5N on AlN epitaxial layer.

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