New insights in the passivation of high-k/InP through interface characterization and metal–oxide–semiconductor field effect transistor demonstration: Impact of crystal orientation
2013 ◽
Vol 113
(1)
◽
pp. 013711
◽
Min Xu
◽
Jiangjiang J. Gu
◽
Chen Wang
◽
D. M. Zhernokletov
◽
R. M. Wallace
◽
...