Rapid and accurate determination of the median lethal dose (LD50) and its error with a small computer

1977 ◽  
Vol 3 (5-6) ◽  
pp. 797-809 ◽  
Author(s):  
Arthur P. Rosiello ◽  
John M. Essigmann ◽  
Gerald N. Wogan
2018 ◽  
Vol 30 (4-5) ◽  
pp. 195-202 ◽  
Author(s):  
Jillian M. Staugler ◽  
Michael C. Babin ◽  
M. Claire Matthews ◽  
Matthew K. Brittain ◽  
Mark R. Perry

2013 ◽  
Vol 20 (1) ◽  
pp. 1 ◽  
Author(s):  
Anupuma Raina ◽  
Mohineesh Chandra ◽  
TirathD Dogra ◽  
Jaya Raj ◽  
Monika Pahuja

2020 ◽  
Vol 1480 (1) ◽  
pp. 136-145
Author(s):  
Nathaniel C. Rice ◽  
Noah A. Rauscher ◽  
Mark C. Moffett ◽  
Todd M. Myers

2012 ◽  
Vol 24 (2) ◽  
pp. 105-109 ◽  
Author(s):  
Kamalakar Chatla ◽  
Patricia S. Gaunt ◽  
Larry Hanson ◽  
Dana X. Gao ◽  
Robert Wills

Author(s):  
R.D. Leapman ◽  
P. Rez ◽  
D.F. Mayers

Microanalysis by EELS has been developing rapidly and though the general form of the spectrum is now understood there is a need to put the technique on a more quantitative basis (1,2). Certain aspects important for microanalysis include: (i) accurate determination of the partial cross sections, σx(α,ΔE) for core excitation when scattering lies inside collection angle a and energy range ΔE above the edge, (ii) behavior of the background intensity due to excitation of less strongly bound electrons, necessary for extrapolation beneath the signal of interest, (iii) departures from the simple hydrogenic K-edge seen in L and M losses, effecting σx and complicating microanalysis. Such problems might be approached empirically but here we describe how computation can elucidate the spectrum shape.The inelastic cross section differential with respect to energy transfer E and momentum transfer q for electrons of energy E0 and velocity v can be written as


Author(s):  
M.A. Gribelyuk ◽  
M. Rühle

A new method is suggested for the accurate determination of the incident beam direction K, crystal thickness t and the coordinates of the basic reciprocal lattice vectors V1 and V2 (Fig. 1) of the ZOLZ plans in pixels of the digitized 2-D CBED pattern. For a given structure model and some estimated values Vest and Kest of some point O in the CBED pattern a set of line scans AkBk is chosen so that all the scans are located within CBED disks.The points on line scans AkBk are conjugate to those on A0B0 since they are shifted by the reciprocal vector gk with respect to each other. As many conjugate scans are considered as CBED disks fall into the energy filtered region of the experimental pattern. Electron intensities of the transmitted beam I0 and diffracted beams Igk for all points on conjugate scans are found as a function of crystal thickness t on the basis of the full dynamical calculation.


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