Tin Oxide and Indium doped Tin Oxide (SnO2:In) thin films were deposited on glass and SiliconÂ substratesÂ byÂ thermal evaporation technique.Â X-ray diffraction pattern of Â pure SnO2 and SnO2:In thin films annealed at 650oC and the results showedÂ that the structure have tetragonal phase with preferred orientation in (110) plane. AFM studies showed an inhibition of grain growth with increase in indium concentration. SEM studies of pureÂ SnO2 and Â Indium doped tin oxide (SnO2:In) ) thin films showed that the films with regular distribution of particles and they have spherical shape.Â Optical properties such asÂ Transmission , optical band-gap have been measured and calculated.
In this work, CdS thin films were synthesized by sol-gel method (spin coating
technique) on glass substrates to investigate the optical behavior of the film.
Methods: Different substrate spin coating speeds of 2400, 3000, 3600 rpm and different Ni
dopant concentrations of 0 wt.%, 2.5 wt.%, 5 wt.%) were investigated. The optical properties of
thin films such as refraction index, extinction coefficient, dielectric constant and optical band gap
energy of the layers were discussed using spectroscopic ellipsometry method in the wavelength
range of 300 to 900 nm.
It can be deduced that substrate rotation speed and dopant concentration has influenced
the optical properties of thin films. By decreasing rotation speed of the substrate which results in
films with more thicknesses, more optical interferences were appeared in the results.
The samples doped with Ni comparing to pure ones have had more optical band gap
Thin films of PbS were prepared onto glass substrates by using a simple and cost effective CBD method. Influence of deposition time on structural, morphology and optical properties have been investigated systematically. The XRD analysis revealed that
PbS films are polycrystalline with preferred orientation in (200) direction. Enhancement in crystallinity and PbS crystallite size has
been observed with increase in deposition time. Formation of single phase PbS thin films has been further confirmed by Raman spectroscopy. The surface morphology analysis revealed the formation of prismatic and pebble-like PbS particles and with increase in
deposition time these PbS particles are separated from each other without secondary growth. The data obtained from the EDX spectra
shows the formation of high-quality but slightly sulfur rich PbS thin films over the entire range of deposition time studied. All films
show increase in absorption with increase in deposition time and a strong absorption in the visible and sub-band gap regime of NIR
range of the spectrum with red shift in band edge. The optical band gap shows decreasing trend, as deposition time increases but it is
higher than the band gap of bulk PbS.