Characterization of microstates for confined systems and associated scale-dependent continuum fields via Fourier coefficients

2001 ◽  
Vol 34 (33) ◽  
pp. 6495-6508 ◽  
Author(s):  
A I Murdoch ◽  
D Bedeaux
Keyword(s):  
Fourier Coefficients ◽  
Confined Systems

scholarly journals On a characterization of compactness and the Abel-Poisson summability of fourier coefficients in Banach spaces

Filomat ◽  
2016 ◽  
Vol 30 (4) ◽  
pp. 1061-1068
Author(s):  
Seda Öztürk
Keyword(s):  
Banach Space ◽  
Topological Group ◽  
Integral Representation ◽  
Unit Circle ◽  
Banach Spaces ◽  
Fourier Coefficients ◽  
Linear Representation ◽  
Complex Banach Space ◽  
Continuous Linear

In this paper, for an isometric strongly continuous linear representation denoted by ? of the topological group of the unit circle in complex Banach space, we study an integral representation for Abel-Poisson mean A?r (x) of the Fourier coefficients family of an element x, and it is proved that this family is Abel-Poisson summable to x. Finally, we give some tests which are related to characterizations of relatively compactness of a subset by means of Abel-Poisson operator A?r and ?.

Characterization of Siegel cusp forms by the growth of their Fourier coefficients

2013 ◽  
Vol 359 (1-2) ◽  
pp. 169-188 ◽  
Author(s):  
Siegfried Böcherer ◽  
Soumya Das
Keyword(s):  
Fourier Coefficients ◽  
Cusp Forms

A characterization of degree two Siegel cusp forms by the growth of their Fourier coefficients

2014 ◽  
Vol 26 (5) ◽  
Author(s):  
Winfried Kohnen ◽  
Yves Martin
Keyword(s):  
Modular Forms ◽  
Fourier Coefficients ◽  
Siegel Modular Forms ◽  
Cusp Forms ◽  
Jacobi Forms

AbstractWe characterize all cusp forms among the degree two Siegel modular forms by the growth of their Fourier coefficients. We also give a similar result for Jacobi forms over the group

scholarly journals On Approximations by Trigonometric Polynomials of Classes of Functions Defined by Moduli of Smoothness

2017 ◽  
Vol 2017 ◽  
pp. 1-11
Author(s):  
Nimete Sh. Berisha ◽  
Faton M. Berisha ◽  
Mikhail K. Potapov ◽  
Marjan Dema
Keyword(s):  
Fourier Coefficients ◽  
Sufficient Conditions ◽  
Integral Representations ◽  
Necessary And Sufficient Conditions ◽  
Moduli Of Smoothness ◽  
Trigonometric Polynomials ◽  
Type Classes ◽  
Necessary And Sufficient

In this paper, we give a characterization of Nikol’skiĭ-Besov type classes of functions, given by integral representations of moduli of smoothness, in terms of series over the moduli of smoothness. Also, necessary and sufficient conditions in terms of monotone or lacunary Fourier coefficients for a function to belong to such a class are given. In order to prove our results, we make use of certain recent reverse Copson-type and Leindler-type inequalities.

Characterization of Crystalline Defects Using CBED Techniques

1990 ◽  
Vol 48 (2) ◽  
pp. 520-521
Author(s):  
R. Pérez
Keyword(s):  
Fourier Coefficients ◽  
Stacking Faults ◽  
Small Region ◽  
Dynamical Theory ◽  
Convergent Beam Electron Diffraction ◽  
Zero Order ◽  
Image Contrast ◽  
Convergent Beam ◽  
Theoretical Simulations

Convergent beam electron diffraction (CBED) is a technique widely used for obtaining crystallographic information from a small region in a specimen. In recent years CBED technique have been mainly used for the symmetry characterization of perfect crystals. However, the study of crystals containing defects by CBED have received little attention in the literature1-4. The results presented in this communication explore some of the image contrast characteristics obtained in theoretical simulations of zero-order laue zone (ZOLZ) reflections. These calculations have been carried out for crystalline specimens wich contain dislocations or stacking faults. The theoretical simulations are based on the multibeam form of the dynamical theory using ato mic scattering factors reported by Doyle and Turner5. The Fourier coefficients of the lattice pottential were Debye-Waller corrected in all cases. Some of the most important parameters which have strong influence on image contrast have been explored. These include, the thickness of the specimen, the depth of defect in the specimen, the multibeam effects, the nature of the defects etc.

Morphological Characterization of Mycobacteriophage R1

1974 ◽  
Vol 32 ◽  
pp. 254-255
Author(s):  
B. L. Soloff ◽  
T. A. Rado
Keyword(s):  
Carbon Source ◽  
Stationary Phase ◽  
Growth Phase ◽  
Minimal Medium ◽  
Morphological Characterization ◽  
Logarithmic Growth Phase ◽  
Complete Lysis ◽  
Lysogenic Culture ◽  
Logarithmic Growth

Mycobacteriophage R1 was originally isolated from a lysogenic culture of M. butyricum. The virus was propagated on a leucine-requiring derivative of M. smegmatis, 607 leu−, isolated by nitrosoguanidine mutagenesis of typestrain ATCC 607. Growth was accomplished in a minimal medium containing glycerol and glucose as carbon source and enriched by the addition of 80 μg/ ml L-leucine. Bacteria in early logarithmic growth phase were infected with virus at a multiplicity of 5, and incubated with aeration for 8 hours. The partially lysed suspension was diluted 1:10 in growth medium and incubated for a further 8 hours. This permitted stationary phase cells to re-enter logarithmic growth and resulted in complete lysis of the culture.

AEM analysis of crystallization in Ti-based amorphous alloys

1983 ◽  
Vol 41 ◽  
pp. 270-271
Author(s):  
A.R. Pelton ◽  
A.F. Marshall ◽  
Y.S. Lee
Keyword(s):  
Magnetic Properties ◽  
Amorphous Alloys ◽  
Amorphous Materials ◽  
Isothermal Annealing ◽  
Amorphous Matrix ◽  
Nucleation And Growth ◽  
Current Interest ◽  
Amorphous Films ◽  
Electrical And Magnetic Properties

Amorphous materials are of current interest due to their desirable mechanical, electrical and magnetic properties. Furthermore, crystallizing amorphous alloys provides an avenue for discerning sequential and competitive phases thus allowing access to otherwise inaccessible crystalline structures. Previous studies have shown the benefits of using AEM to determine crystal structures and compositions of partially crystallized alloys. The present paper will discuss the AEM characterization of crystallized Cu-Ti and Ni-Ti amorphous films.Cu60Ti40: The amorphous alloy Cu60Ti40, when continuously heated, forms a simple intermediate, macrocrystalline phase which then transforms to the ordered, equilibrium Cu3Ti2 phase. However, contrary to what one would expect from kinetic considerations, isothermal annealing below the isochronal crystallization temperature results in direct nucleation and growth of Cu3Ti2 from the amorphous matrix.

Characterization of Coherent, Ordered Precipitates in Nickel-Base Alloys

1973 ◽  
Vol 31 ◽  
pp. 144-145
Author(s):  
B. H. Kear ◽  
J. M. Oblak
Keyword(s):  
Stable Phase ◽  
Nickel Base Superalloy ◽  
Alloy 718 ◽  
Commercial Alloy ◽  
Precipitate Morphology ◽  
Continuous Precipitation ◽  
Nickel Base ◽  
Base Superalloy ◽  
Strengthening Precipitate

A nickel-base superalloy is essentially a Ni/Cr solid solution hardened by additions of Al (Ti, Nb, etc.) to precipitate a coherent, ordered phase. In most commercial alloy systems, e.g. B-1900, IN-100 and Mar-M200, the stable precipitate is Ni3 (Al,Ti) γ′, with an LI2structure. In A lloy 901 the normal precipitate is metastable Nis Ti3 γ′ ; the stable phase is a hexagonal Do2 4 structure. In Alloy 718 the strengthening precipitate is metastable γ″, which has a body-centered tetragonal D022 structure.Precipitate MorphologyIn most systems the ordered γ′ phase forms by a continuous precipitation re-action, which gives rise to a uniform intragranular dispersion of precipitate particles. For zero γ/γ′ misfit, the γ′ precipitates assume a spheroidal.

The Use of Advanced Analytical Techniques for Characterization of the Chemical, Physical, and Crystallographic Nature of a Surface

1973 ◽  
Vol 31 ◽  
pp. 132-133 ◽  
Author(s):  
R. E. Herfert
Keyword(s):  
Surface Characterization ◽  
Analytical Techniques ◽  
X Ray Diffraction ◽  
Depth Of Penetration ◽  
X Ray ◽  
The Past ◽  
Transmission Electron ◽  
Scanning Electron

Studies of the nature of a surface, either metallic or nonmetallic, in the past, have been limited to the instrumentation available for these measurements. In the past, optical microscopy, replica transmission electron microscopy, electron or X-ray diffraction and optical or X-ray spectroscopy have provided the means of surface characterization. Actually, some of these techniques are not purely surface; the depth of penetration may be a few thousands of an inch. Within the last five years, instrumentation has been made available which now makes it practical for use to study the outer few 100A of layers and characterize it completely from a chemical, physical, and crystallographic standpoint. The scanning electron microscope (SEM) provides a means of viewing the surface of a material in situ to magnifications as high as 250,000X.

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