Phase structure development as preheating UHMWPE powder temperature changes in the micro-UPM process

2015 ◽  
Vol 26 (1) ◽  
pp. 015014 ◽  
Author(s):  
Xiong Liang ◽  
Xiaoyu Wu ◽  
Bin Xu ◽  
Jiang Ma ◽  
Zhiyuan Liu ◽  
...  
1996 ◽  
Vol 28 (2) ◽  
pp. 106-139 ◽  
Author(s):  
Ivan Fortelný ◽  
Josef Kovář ◽  
Michael Stephan

1994 ◽  
Vol 53 (4) ◽  
pp. 387-404 ◽  
Author(s):  
L. D'Orazio ◽  
C. Mancarella ◽  
E. Martuscelli ◽  
G. Sticotti ◽  
R. Ghisellini

Polymer ◽  
2000 ◽  
Vol 41 (12) ◽  
pp. 4747-4749 ◽  
Author(s):  
Y.H Kim ◽  
M Okamoto ◽  
T Kotaka ◽  
T Ougizawa ◽  
T Tchiba ◽  
...  

Author(s):  
Yeshayahu Talmon

To achieve complete microstructural characterization of self-aggregating systems, one needs direct images in addition to quantitative information from non-imaging, e.g., scattering or Theological measurements, techniques. Cryo-TEM enables us to image fluid microstructures at better than one nanometer resolution, with minimal specimen preparation artifacts. Direct images are used to determine the “building blocks” of the fluid microstructure; these are used to build reliable physical models with which quantitative information from techniques such as small-angle x-ray or neutron scattering can be analyzed.To prepare vitrified specimens of microstructured fluids, we have developed the Controlled Environment Vitrification System (CEVS), that enables us to prepare samples under controlled temperature and humidity conditions, thus minimizing microstructural rearrangement due to volatile evaporation or temperature changes. The CEVS may be used to trigger on-the-grid processes to induce formation of new phases, or to study intermediate, transient structures during change of phase (“time-resolved cryo-TEM”). Recently we have developed a new CEVS, where temperature and humidity are controlled by continuous flow of a mixture of humidified and dry air streams.


2019 ◽  
pp. 9-13
Author(s):  
V.Ya. Mendeleyev ◽  
V.A. Petrov ◽  
A.V. Yashin ◽  
A.I. Vangonen ◽  
O.K. Taganov

Determining the surface temperature of materials with unknown emissivity is studied. A method for determining the surface temperature using a standard sample of average spectral normal emissivity in the wavelength range of 1,65–1,80 μm and an industrially produced Metis M322 pyrometer operating in the same wavelength range. The surface temperature of studied samples of the composite material and platinum was determined experimentally from the temperature of a standard sample located on the studied surfaces. The relative error in determining the surface temperature of the studied materials, introduced by the proposed method, was calculated taking into account the temperatures of the platinum and the composite material, determined from the temperature of the standard sample located on the studied surfaces, and from the temperature of the studied surfaces in the absence of the standard sample. The relative errors thus obtained did not exceed 1,7 % for the composite material and 0,5% for the platinum at surface temperatures of about 973 K. It was also found that: the inaccuracy of a priori data on the emissivity of the standard sample in the range (–0,01; 0,01) relative to the average emissivity increases the relative error in determining the temperature of the composite material by 0,68 %, and the installation of a standard sample on the studied materials leads to temperature changes on the periphery of the surface not exceeding 0,47 % for composite material and 0,05 % for platinum.


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