Study for online range monitoring with the interaction vertex imaging method

2017 ◽  
Vol 62 (24) ◽  
pp. 9220-9239 ◽  
Author(s):  
Ch Finck ◽  
Y Karakaya ◽  
V Reithinger ◽  
R Rescigno ◽  
J Baudot ◽  
...  
Author(s):  
Devin Hymers ◽  
Eva Marie Kasanda ◽  
Vinzenz Bildstein ◽  
Joelle Easter ◽  
Andrea Richard ◽  
...  

Abstract Heavy-ion therapy, particularly using scanned (active) beam delivery, provides a precise and highly conformal dose distribution, with maximum dose deposition for each pencil beam at its endpoint (Bragg peak), and low entrance and exit dose. To take full advantage of this precision, robust range verification methods are required; these methods ensure that the Bragg peak is positioned correctly in the patient and the dose is delivered as prescribed. Relative range verification allows intra-fraction monitoring of Bragg peak spacing to ensure full coverage with each fraction, as well as inter-fraction monitoring to ensure all fractions are delivered consistently. To validate the proposed filtered Interaction Vertex Imaging method for relative range verification, a 16O beam was used to deliver 12 Bragg peak positions in a 40 mm poly-(methyl methacrylate) phantom. Secondary particles produced in the phantom were monitored using position-sensitive silicon detectors. Events recorded on these detectors, along with a measurement of the treatment beam axis, were used to reconstruct the sites of origin of these secondary particles in the phantom. The distal edge of the depth distribution of these reconstructed points was determined with logistic fits, and the translation in depth required to minimize the χ2 statistic between these fits was used to compute the range shift between any two Bragg peak positions. In all cases, the range shift was determined with sub-millimeter precision, to a standard deviation of the mean of 220(10) μm. This result validates filtered Interaction Vertex Imaging as a reliable relative range verification method, which should be capable of monitoring each energy step in each fraction of a scanned heavy-ion treatment plan.


Author(s):  
T. Y. Tan ◽  
W. K. Tice

In studying ion implanted semiconductors and fast neutron irradiated metals, the need for characterizing small dislocation loops having diameters of a few hundred angstrom units usually arises. The weak beam imaging method is a powerful technique for analyzing these loops. Because of the large reduction in stacking fault (SF) fringe spacing at large sg, this method allows for a rapid determination of whether the loop is faulted, and, hence, whether it is a perfect or a Frank partial loop. This method was first used by Bicknell to image small faulted loops in boron implanted silicon. He explained the fringe spacing by kinematical theory, i.e., ≃l/(Sg) in the fault fringe in depth oscillation. The fault image contrast formation mechanism is, however, really more complicated.


Author(s):  
Akira Tonomura

Electron holography is a two-step imaging method. However, the ultimate performance of holographic imaging is mainly determined by the brightness of the electron beam used in the hologram-formation process. In our 350kV holography electron microscope (see Fig. 1), the decrease in the inherently high brightness of field-emitted electrons is minimized by superposing a magnetic lens in the gun, for a resulting value of 2 × 109 A/cm2 sr. This high brightness has lead to the following distinguished features. The minimum spacing (d) of carrier fringes is d = 0.09 Å, thus allowing a reconstructed image with a resolution, at least in principle, as high as 3d=0.3 Å. The precision in phase measurement can be as high as 2π/100, since the position of fringes can be known precisely from a high-contrast hologram formed under highly collimated illumination. Dynamic observation becomes possible because the current density is high.


2011 ◽  
Vol 59 (S 01) ◽  
Author(s):  
S Ihlenburg ◽  
A Rüffer ◽  
T Radkow ◽  
A Purbojo ◽  
M Glöckler ◽  
...  

2008 ◽  
Vol 39 (01) ◽  
Author(s):  
AJ Fallgatter ◽  
AC Ehlis ◽  
MM Richter ◽  
M Schecklmann ◽  
MM Plichta

2013 ◽  
Vol E96.B (7) ◽  
pp. 2014-2023 ◽  
Author(s):  
Ryo YAMAGUCHI ◽  
Shouhei KIDERA ◽  
Tetsuo KIRIMOTO

Sign in / Sign up

Export Citation Format

Share Document