scholarly journals Effect of doping atoms in the surface morphology of dense palladium-based diffusion membrane-filters

2021 ◽  
Vol 2103 (1) ◽  
pp. 012228
Author(s):  
O V Akimova ◽  
I S Tereshina ◽  
T P Kaminskaya
Keyword(s):  
Electron Microscopy ◽  
Surface Topology ◽  
Force Microscopy ◽  
Diffusion Filter ◽  
Membrane Filters ◽  
Atomic Force ◽  
Microscopy Data ◽  
The Individual ◽  
Scanning Electron ◽  
Diffusion Membrane

Abstract Atomic force microscopy (AFM) and high-precision scanning electron microscopy methods were used to study the morphology of the surface of diffusion filter-membranes Pd-Pb. Analysis of the AFM microscopy data and microelectronic photographs showed the individual features of the formation of the membrane alloy’s surface topology. The predisposition of the alloy to cavitation was revealed both in the technological process of manufacturing filter-membranes and under exposure to hydrogen.

Etching Treatment Effect on Surface Morphology of Dental Structures

2017 ◽  
Vol 68 (11) ◽  
pp. 2700-2703 ◽  
Author(s):  
Kamel Earar ◽  
Vasile Iulian Antoniac ◽  
Sorana Baciu ◽  
Simion Bran ◽  
Florin Onisor ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Surface Morphology ◽  
Phosphoric Acid ◽  
Human Teeth ◽  
Strong Bond ◽  
Force Microscopy ◽  
Atomic Force ◽  
Human Dentine ◽  
Dental Surface ◽  
Scanning Electron

This study examined and compared surface of human dentine after acidic etching with hydrogen peroxide, phosphoric acid liquid and gel. Surface demineralization of dentin is necessary for a strong bond of adhesive at dental surface. Split human teeth were used. After application of mentioned substances at dentin level measures of the contact angle and surface morphology were employed. Surface morphology was analyzed with the help of scanning electron microscopy and atomic force microscopy. Liquid phosphoric acid yielded highest demineralization showing better hydrophobicity than the rest, thus having more contact surface. Surface roughness are less evident and formed surface micropores of 4 �m remained open after wash and air dry providing better adhesive canalicular penetration and subsequent bond.

scholarly journals Corrosion Behavior and Mechanical Properties of a Nanocomposite Superhydrophobic Coating

Coatings ◽  
2021 ◽  
Vol 11 (6) ◽  
pp. 652
Author(s):  
Divine Sebastian ◽  
Chun-Wei Yao ◽  
Lutfun Nipa ◽  
Ian Lian ◽  
Gary Twu
Keyword(s):  
Electron Microscopy ◽  
Mechanical Properties ◽  
Scanning Electron Microscopy ◽  
Atomic Force Microscopy ◽  
Nanocomposite Coating ◽  
Superhydrophobic Coating ◽  
Force Microscopy ◽  
Atomic Force ◽  
Microscopy Images ◽  
Scanning Electron

In this work, a mechanically durable anticorrosion superhydrophobic coating is developed using a nanocomposite coating solution composed of silica nanoparticles and epoxy resin. The nanocomposite coating developed was tested for its superhydrophobic behavior using goniometry; surface morphology using scanning electron microscopy and atomic force microscopy; elemental composition using energy dispersive X-ray spectroscopy; corrosion resistance using atomic force microscopy; and potentiodynamic polarization measurements. The nanocomposite coating possesses hierarchical micro/nanostructures, according to the scanning electron microscopy images, and the presence of such structures was further confirmed by the atomic force microscopy images. The developed nanocomposite coating was found to be highly superhydrophobic as well as corrosion resistant, according to the results from static contact angle measurement and potentiodynamic polarization measurement, respectively. The abrasion resistance and mechanical durability of the nanocomposite coating were studied by abrasion tests, and the mechanical properties such as reduced modulus and Berkovich hardness were evaluated with the aid of nanoindentation tests.

Lateral Size of Self-Patterned Nanostructures Controlled by Multi-Step Deposition

2005 ◽  
Vol 106 ◽  
pp. 117-122 ◽  
Author(s):  
Izabela Szafraniak ◽  
Dietrich Hesse ◽  
Marin Alexe
Keyword(s):  
Electron Microscopy ◽  
Ultrathin Films ◽  
Lateral Size ◽  
X Ray Diffraction ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force ◽  
Non Volatile Memory ◽  
Ferroelectric Capacitors ◽  
Scanning Electron

Self-patterning presents an appealing alternative to lithography for the production of arrays of nanoscale ferroelectric capacitors for use in high density non-volatile memory devices. Recently a self-patterning method, based on the use of the instability of ultrathin films during hightemperature treatments, was used to fabricate nanosized ferroelectrics. This paper reports the use of the method for the preparation of PZT nanoislands on different single crystalline substrates - SrTiO3, MgO and LaAlO3. Moreover, a multi-step deposition procedure in order to control lateral the dimension of the crystals was introduced. The nanostructures obtained were studied by atomic force microscopy, scanning electron microscopy and X-ray diffraction.

Si+ Implantation and Activation in GaN Comparison of GaN on Sapphire and GaN on Silicon

2012 ◽  
Vol 711 ◽  
pp. 213-217 ◽  
Author(s):  
Anne Elisabeth Bazin ◽  
Frédéric Cayrel ◽  
Mohamed Lamhamdi ◽  
Arnaud Yvon ◽  
Jean Christophe Houdbert ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Ohmic Contacts ◽  
Silicon Oxide ◽  
Electrical Activation ◽  
Specific Contact Resistance ◽  
Force Microscopy ◽  
Atomic Force ◽  
Specific Contact ◽  
Good Behaviour ◽  
Scanning Electron

In this paper, we evaluated gallium nitride heteroepitaxially grown on sapphire (GaN/Sa) and grown on silicon (GaN/Si) faced to implantation doping. Si+ was implanted on low doped n-type epilayers in order to create a plateau around 1020at.cm-3. All the samples were capped with a silicon oxide and annealed between 1000°C and 1150°C. The surface quality was evaluated in terms of roughness, pit density and maximum pit diameter using Atomic Force Microscopy (AFM) and Scanning Electron Microscopy (SEM). Finally, the dopant electrical activation was studied with Ti-Al contacts using the circular Transfert Length Method (c-TLM). This study shows that low Specific Contact Resistance (SCR) values of 8x10-5Ω.cm2 and 6x10-6Ω.cm2 are respectively obtained on GaN/Sa sample annealed at 1150°C-2min and on GaN/Si sample annealed at 1150°C-30s, proving that good ohmic contacts are obtained on both materials. Nevertheless, a compromise has to be done between the low SCR values obtained and the GaN surface degradation, observed by AFM and SEM after the different annealing treatments and which could affect the good behaviour of the GaN devices.

ELECTROCHEMICAL INVESTIGATION OF 2-THIOHYDANTOIN DERIVATIVES AS CORROSION INHIBITORS FOR MILD STEEL IN ACIDIC MEDIUM

2021 ◽  
Author(s):  
Petar Stanić ◽  
◽  
Nataša Vukićević ◽  
Vesna Cvetković ◽  
Miroslav Pavlović ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Mild Steel ◽  
Acidic Medium ◽  
Corrosion Inhibitors ◽  
Electrochemical Impedance ◽  
Electrochemical Investigation ◽  
Force Microscopy ◽  
Atomic Force ◽  
Hcl Solution ◽  
Scanning Electron

Four 2-thiohydantoin derivatives were synthesized and their corrosion inhibition properties on mild steel (MS) in 0.5M HCl solution was evaluated using usual gravimetric and electrochemical methods (weight loss, potentiodynamic polarization, electrochemical impedance spectroscopy (EIS). Morphology of the metal surface was characterized by scanning electron microscopy (SEM) and atomic force microscopy (AFM). The study has shown that these compounds provide good protection for mild steel against corrosion in the acidic medium.

Comparative Study of Field Emission-Scanning Electron Microscopy and Atomic Force Microscopy to Assess Self-assembled Monolayer Coverage on Any Type of Substrate

1999 ◽  
Vol 5 (6) ◽  
pp. 413-419 ◽  
Author(s):  
Bernardo R.A. Neves ◽  
Michael E. Salmon ◽  
Phillip E. Russell ◽  
E. Barry Troughton
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Atomic Force Microscopy ◽  
Comparative Study ◽  
Field Emission ◽  
Self Assembled Monolayer ◽  
Force Microscopy ◽  
Atomic Force ◽  
Self Assembled ◽  
Scanning Electron

Abstract: In this work, we show how field emission–scanning electron microscopy (FE-SEM) can be a useful tool for the study of self-assembled monolayer systems. We have carried out a comparative study using FE-SEM and atomic force microscopy (AFM) to assess the morphology and coverage of self-assembled monolayers (SAM) on different substrates. The results show that FE-SEM images present the same qualitative information obtained by AFM images when the SAM is deposited on a smooth substrate (e.g., mica). Further experiments with rough substrates (e.g., Al grains on glass) show that FE-SEM is capable of unambiguously identifying SAMs on any type of substrate, whereas AFM has significant difficulties in identifying SAMs on rough surfaces.

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