scholarly journals Automated technology of forming high-precision aspheric optics for multipurpose optical systems

2020 ◽  
Vol 709 ◽  
pp. 044096
Author(s):  
V A Gorshkov ◽  
A S Nevrov ◽  
A V Smirnova
Keyword(s):  
High Precision ◽  
Optical Systems ◽  
Aspheric Optics ◽  
Automated Technology

Creep, Hysteresis, and Vibration Compensation for Piezoactuators: Atomic Force Microscopy Application

1999 ◽  
Vol 123 (1) ◽  
pp. 35-43 ◽  
Author(s):  
D. Croft ◽  
G. Shed ◽  
S. Devasia
Keyword(s):  
High Precision ◽  
Scanning Probe Microscopy ◽  
High Speed ◽  
Scanning Probe ◽  
Optical Systems ◽  
Positioning Precision ◽  
Force Microscopy ◽  
Atomic Force ◽  
Vibration Compensation ◽  
Adverse Affects

This article studies ultra-high-precision positioning with piezoactuators and illustrates the results with an example Scanning Probe Microscopy (SPM) application. Loss of positioning precision in piezoactuators occurs (1) due to hysteresis during long range applications, (2) due to creep effects when positioning is needed over extended periods of time, and (3) due to induced vibrations during high-speed positioning. This loss in precision restricts the use of piezoactuators in high-speed positioning applications like SPM-based nanofabrication, and ultra-high-precision optical systems. An integrated inversion-based approach is presented in this article to compensate for all three adverse affects—creep, hysteresis, and vibrations. The method is applied to an Atomic Force Microscope (AFM) and experimental results are presented that demonstrate substantial improvements in positioning precision and operating speed.

High precision metrology of domes and aspheric optics

2005 ◽  
Author(s):  
Paul E. Murphy ◽  
Jon Fleig ◽  
Greg Forbes ◽  
Marc Tricard
Keyword(s):  
High Precision ◽  
Aspheric Optics ◽  
Precision Metrology

A process for shaping high-precision optical components for ground- and space-based electrooptic systems

2019 ◽  
pp. 77-88
Author(s):  
Vladimir A. GORSHKOV ◽  
Alexey S. SAVELYEV ◽  
Artem S. NEVROV ◽  
Aleksandra V. SMIRNOVA
Keyword(s):  
Standard Deviation ◽  
High Precision ◽  
Surface Shape ◽  
Optical Systems ◽  
Optical Elements ◽  
Optical Components ◽  
Earth Remote Sensing ◽  
Aspheric Surfaces ◽  
Shape Precision ◽  
Surface Shaping

The paper reviews advanced process for manufacturing high-precision optical components used in space-based electrooptic systems for scientific research and Earth remote sensing. It presents an integrated process for automatic shaping (TESAF) of aspheric surfaces, including off-axis surfaces, of optical elements for electrooptic systems. This paper discusses various methods for shaping optical parts with virtually any degree of asphericity and various values of the off-axis parameter (off-axis aspherics) achieving surface shape precision to within λ/60…λ/80 (λ = 0.6328 micron) by the standard deviation criteria. The paper also presents the newly developed off-axis collimators, designed to shape a reference wavefront within a broad spectral range from ultraviolet to infrared radiation. In particular, a mirror collimator with an adaptive off-axis mirror that is capable of changing the wavefront that is being formed in order to obtain the response function of the electrooptical system under study. Optical systems built using the TESAF process are already successfully used. Key words: surface shaping, aspheric surface, surface interferogram, standard deviation.

Effects of Alpha-Cellulose Supply on the Working Life of MCF Slurry in MCF Polishing

2020 ◽  
Author(s):  
Yuta Nonaka ◽  
Mitsuyoshi Nomura ◽  
Tatsuya Fujii ◽  
Tsunehisa Suzuki ◽  
Yongbo Wu
Keyword(s):  
High Precision ◽  
Single Point ◽  
Brittle Materials ◽  
Surface Damage ◽  
Diamond Turning ◽  
Optical Systems ◽  
Smart Devices ◽  
Tool Marks ◽  
Hard And Brittle Materials ◽  
Inspection Systems

Abstract High precision surfaces exhibit prominent capabilities for enhancing the imaging quality, expanding the visibility of equipment, simplifying structures, and reducing total costs of optical systems. Hence, they are regarded as essential optical surfaces for replacing traditional elements to modify optical systems, including space systems, optical inspection systems, and smart devices. Single point diamond turning (SPDT) and ultra-precision grinding have been adopted preliminarily to manufacture high-quality elements. However, these processes create sub-surface damage and tool marks on the work surface. To meet performance requirements, polishing is critical for post-processing to improve the quality of the products. MCF (Magnetic Compound Fluid) polishing, which is one of polishing methods using magnetic fields, is a processing method for finishing hard and brittle materials with high accuracy. Previous research has shown that MCF polishing is effective for hard and brittle materials. However, despite the high cost of the magnetic fluid that is a component of the MCF slurry, the MCF slurry used for polishing has been discarded. Another major issue was that unused MCF slurry could not be used due to drying. The purpose of this study is to recycle MCF slurry to solve this problem, and to develop high precision finishing technology. Therefore, in this study, a novel MCF polishing method using ultrasonic atomization is proposed, and the effects of α-cellulose on the MCF polishing are investigated. In addition, in order to make it possible to reuse the MCF slurry, In addition, experiments are conducted to enable reuse of MCF slurry.

scholarly journals 3D VIDEO MEASURING SYSTEM FOR TESTING OF MANUFACTURE OF PARTS THE HIGH PRECISION PROCESSING

2021 ◽  
pp. 32-36
Author(s):  
Serhii Prokopchenko ◽  
Volodymyr Voskresenskyi
Keyword(s):  
High Precision ◽  
Video Processing ◽  
Economic Effect ◽  
Statistical Processing ◽  
3D Video ◽  
Measuring System ◽  
Optical Systems ◽  
Non Destructive Testing ◽  
Destructive Testing ◽  
Non Destructive

During the control of technological processes of manufacturing various parts, which are required to increase the accuracy of processing, it is necessary to adhere to the systematic measurement of their geometric dimensions, tolerances, compliance with the shape and location of the surfaces of the parts. To date, this type of non-destructive testing is carried out using special optical systems and allows you to study different products, regardless of their type, design features and structure of the materials from which they are made. That is, the visual-optical method of measurement is one of the most important methods of non-destructive testing in production. In the article the authors shared practical experience in the selection and optimal use of 3D video measuring system with limited resources. The choice of manufacturer and model (type) of video measuring system was made depending on the complexity of the measurement tasks. First of all, the error of measurement results was evaluated, which was determined by technical indicators and the composition of software functionality. For control in the manufacture of high-precision mechanical parts, the basic requirements for technical parameters and software of the video measuring system are defined. Emphasis is placed on the economic effect by reducing the time of measurement of linear dimensions and angles in the plane of the controlled parts, while using high-quality functionality of video processing, which significantly reduces the likelihood of operator error. The choice between manual and automated measurement systems is justified: the main factors are the capacity and the required amount of measurements. Evaluated as a positive ability to save information files in Exel, Word, and SPC for statistical processing of information to improve the quality of parts. Features of video measuring systems concerning: implementation of innovative metrological solutions - multisensory metrology, namely - inclusion in the program of measurements of optical, laser and contact research; Reverse Engineering of previous versions of parts for which drawings have already been lost and CAD models are not available.

Weak Measurements in Nano-optics

2020 ◽  
Vol 5 (3) ◽  
pp. 191-213
Author(s):  
Niladri Modak ◽  
Ankit K. Singh ◽  
Shyamal Guchhait ◽  
Athira BS ◽  
Mandira Pal ◽  
...  
Keyword(s):  
High Precision ◽  
Spectral Response ◽  
Weak Measurement ◽  
Optical Systems ◽  
Physical Parameters ◽  
Weak Measurements ◽  
Temporal Shift ◽  
Measuring Device ◽  
Weak Value ◽  
Weak Value Amplification

Background: Weak measurement involves weak coupling between the system and the measuring device (pointer) enables large amplification and high precision measurement of small physical parameters. The outcome of this special measurement procedure involving nearly mutually orthogonal pre- and post-selection of states in such weakly interacting systems leads to weak value that can become exceedingly large and lie outside the eigenvalue spectrum of the measured observable. This unprecedented ability of weak value amplification of small physical parameters has been successfully exploited for various metrological applications in the optical domain and beyond. Even though it is a quantum mechanical concept, it can be understood using the classical electromagnetic theory of light and thus can be realized in classical optics. Objective: Here, we briefly review the basic concepts of weak measurement and weak value amplification, provide illustrative examples of its implementation in various optical domains. The applications involve measuring ultra-sensitive beam deflections, high precision measurements of angular rotation, phase shift, temporal shift, frequency shift and so forth, and expand this extraordinary concept in the domain of nano-optics and plasmonics. Methods: In order to perform weak value amplification, we have used Gaussian beam and spectral response as the pointer subsequently. The polarization state associated with the pointer is used as pre and post-selection device. Results: We reveal the weak value amplification of sub-wavelength optical effects namely the Goos-Hänchen shift and the spin hall shift. Further, we demonstrate weak measurements using spectral line shape of resonance as a natural pointer, enabling weak value amplification beyond the conventional limit, demonstrating natural weak value amplification in plasmonic Fano resonances and so forth. The discussed concepts could have useful implications in various nano-optical systems to amplify tiny signals or effects. Conclusion: The emerging prospects of weak value amplification towards the development of novel optical weak measurement devices for metrological applications are extensively discussed.

Automatic measurement of SAED patterns from asbestos minerals

1988 ◽  
Vol 46 ◽  
pp. 846-847
Author(s):  
J. C. Russ ◽  
T. Taguchi ◽  
P. M. Peters ◽  
E. Chatfield ◽  
J. C. Russ ◽  
...  
Keyword(s):  
Diffraction Pattern ◽  
High Precision ◽  
Diffraction Data ◽  
Automatic Measurement ◽  
Automatic Method ◽  
Important Method ◽  
X Ray ◽  
Integrated Intensity ◽  
Asbestiform Minerals ◽  
True Center

Conventional SAD patterns as obtained in the TEM present difficulties for identification of materials such as asbestiform minerals, although diffraction data is considered to be an important method for making this purpose. The preferred orientation of the fibers and the spotty patterns that are obtained do not readily lend themselves to measurement of the integrated intensity values for each d-spacing, and even the d-spacings may be hard to determine precisely because the true center location for the broken rings requires estimation. We have implemented an automatic method for diffraction pattern measurement to overcome these problems. It automatically locates the center of patterns with high precision, measures the radius of each ring of spots in the pattern, and integrates the density of spots in that ring. The resulting spectrum of intensity vs. radius is then used just as a conventional X-ray diffractometer scan would be, to locate peaks and produce a list of d,I values suitable for search/match comparison to known or expected phases.

On effects of non-systematic reflections on weak-beam images of partial dislocations

1991 ◽  
Vol 49 ◽  
pp. 688-689
Author(s):  
K. Z. Botros ◽  
S. S. Sheinin
Keyword(s):  
High Precision ◽  
Stacking Fault ◽  
Important Application ◽  
Stacking Fault Energy ◽  
Sharp Peak ◽  
Weak Beam ◽  
Partial Dislocations ◽  
Deviation Parameter ◽  
Beam Diffraction

The main features of weak beam images of dislocations were first described by Cockayne et al. using calculations of intensity profiles based on the kinematical and two beam dynamical theories. The feature of weak beam images which is of particular interest in this investigation is that intensity profiles exhibit a sharp peak located at a position very close to the position of the dislocation in the crystal. This property of weak beam images of dislocations has an important application in the determination of stacking fault energy of crystals. This can easily be done since the separation of the partial dislocations bounding a stacking fault ribbon can be measured with high precision, assuming of course that the weak beam relationship between the positions of the image and the dislocation is valid. In order to carry out measurements such as these in practice the specimen must be tilted to "good" weak beam diffraction conditions, which implies utilizing high values of the deviation parameter Sg.

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