scholarly journals Recent advances in ultrafast X-ray sources

2019 ◽  
Vol 377 (2145) ◽  
pp. 20180384 ◽  
Author(s):  
Robert Schoenlein ◽  
Thomas Elsaesser ◽  
Karsten Holldack ◽  
Zhirong Huang ◽  
Henry Kapteyn ◽  
...  
Keyword(s):  
Structural Dynamics ◽  
Materials Science ◽  
X Rays ◽  
X Ray ◽  
High Order Harmonic ◽  
Recent Advances ◽  
Electronic Motion ◽  
Femtosecond Regime ◽  
Indispensable Tool ◽  
And Function

Over more than a century, X-rays have transformed our understanding of the fundamental structure of matter and have been an indispensable tool for chemistry, physics, biology, materials science and related fields. Recent advances in ultrafast X-ray sources operating in the femtosecond to attosecond regimes have opened an important new frontier in X-ray science. These advances now enable: (i) sensitive probing of structural dynamics in matter on the fundamental timescales of atomic motion, (ii) element-specific probing of electronic structure and charge dynamics on fundamental timescales of electronic motion, and (iii) powerful new approaches for unravelling the coupling between electronic and atomic structural dynamics that underpin the properties and function of matter. Most notable is the recent realization of X-ray free-electron lasers (XFELs) with numerous new XFEL facilities in operation or under development worldwide. Advances in XFELs are complemented by advances in synchrotron-based and table-top laser-plasma X-ray sources now operating in the femtosecond regime, and laser-based high-order harmonic XUV sources operating in the attosecond regime. This article is part of the theme issue ‘Measurement of ultrafast electronic and structural dynamics with X-rays’.

Recent Developments In Monochromatic Microprobe X-Ray Fluorescence (MMXRF)

1998 ◽  
Vol 4 (S2) ◽  
pp. 378-379
Author(s):  
Z. W. Chen ◽  
D. B. Wittry
Keyword(s):  
Materials Science ◽  
High Vacuum ◽  
Three Dimensional ◽  
High Sensitivity ◽  
X Rays ◽  
Fluorescence Excitation ◽  
X Ray ◽  
Quantitative Microanalysis ◽  
Recent Developments ◽  
Fifth Order

A monochromatic x-ray microprobe based on a laboratory source has recently been developed in our laboratory and used for fluorescence excitation. This technique provides high sensitivity (ppm to ppb), nondestructive, quantitative microanalysis with minimum sample preparation and does not require a high vacuum specimen chamber. It is expected that this technique (MMXRF) will have important applications in materials science, geological sciences and biological science.Three-dimensional focusing of x-rays can be obtained by using diffraction from doubly curved crystals. In our MMXRF setup, a small x-ray source was produced by the bombardment of a selected target with a focused electron beam and a toroidal mica diffractor with Johann pointfocusing geometry was used to focus characteristic x-rays from the source. In the previous work ∼ 108 photons/s were obtained in a Cu Kα probe of 75 μm × 43 μm in the specimen plane using the fifth order reflection of the (002) planes of mica.

scholarly journals Recent Advances in Ultrafast Structural Techniques

2019 ◽  
Vol 9 (7) ◽  
pp. 1427 ◽  
Author(s):  
Germán Sciaini
Keyword(s):  
Structural Dynamics ◽  
Free Electron Laser ◽  
Review Article ◽  
Chemical Processes ◽  
Plasma Sources ◽  
X Ray ◽  
Recent Advances ◽  
Technological Developments ◽  
Computer Simulators ◽  
Electron Pulses

A review that summarizes the most recent technological developments in the field of ultrafast structural dynamics with focus on the use of ultrashort X-ray and electron pulses follows. Atomistic views of chemical processes and phase transformations have long been the exclusive domain of computer simulators. The advent of femtosecond (fs) hard X-ray and fs-electron diffraction techniques made it possible to bring such a level of scrutiny to the experimental area. The following review article provides a summary of the main ultrafast techniques that enabled the generation of atomically resolved movies utilizing ultrashort X-ray and electron pulses. Recent advances are discussed with emphasis on synchrotron-based methods, tabletop fs-X-ray plasma sources, ultrabright fs-electron diffractometers, and timing techniques developed to further improve the temporal resolution and fully exploit the use of intense and ultrashort X-ray free electron laser (XFEL) pulses.

scholarly journals Time-Resolved X-Ray Microscopy for Materials Science

2019 ◽  
Vol 49 (1) ◽  
pp. 389-415 ◽  
Author(s):  
Haidan Wen ◽  
Mathew J. Cherukara ◽  
Martin V. Holt
Keyword(s):  
Large Scale ◽  
Materials Science ◽  
Time Resolved ◽  
X Ray ◽  
X Ray Imaging ◽  
Materials Research ◽  
Microscopic Studies ◽  
Nanoscale Imaging ◽  
Indispensable Tool ◽  
The Time Domain

X-ray microscopy has been an indispensable tool to image nanoscale properties for materials research. One of its recent advances is extending microscopic studies to the time domain to visualize the dynamics of nanoscale phenomena. Large-scale X-ray facilities have been the powerhouse of time-resolved X-ray microscopy. Their upgrades, including a significant reduction of the X-ray emittance at storage rings (SRs) and fully coherent ultrashort X-ray pulses at free-electron lasers (FELs), will lead to new developments in instrumentation and will open new scientific opportunities for X-ray imaging of nanoscale dynamics with the simultaneous attainment of unprecedentedly high spatial and temporal resolutions. This review presents recent progress in and the outlook for time-resolved X-ray microscopy in the context of ultrafast nanoscale imaging and its applications to condensed matter physics and materials science.

scholarly journals Optical control, selection and analysis of population dynamics in ultrafast protein X-ray crystallography

2019 ◽  
Vol 377 (2145) ◽  
pp. 20170474 ◽  
Author(s):  
Christopher D. M. Hutchison ◽  
Jasper J. van Thor
Keyword(s):  
Structural Dynamics ◽  
Time Domain ◽  
Optical Pumping ◽  
High Repetition Rate ◽  
X Rays ◽  
X Ray Diffraction ◽  
X Ray ◽  
Vibrational Coherence ◽  
X Ray Crystallography ◽  
Ultrafast Optical

Ultrafast pump-probe X-ray crystallography has now been established at X-ray free electron lasers that operate at hard X-ray energies. We discuss the performance and development of current applications in terms of the available data quality and sensitivity to detect and analyse structural dynamics. A discussion of technical capabilities expected at future high repetition rate applications as well as future non-collinear multi-pulse schemes focuses on the possibility to advance the technique to the practical application of the X-ray crystallographic equivalent of an impulse time-domain Raman measurement of vibrational coherence. Furthermore, we present calculations of the magnitude of population differences and distributions prepared with ultrafast optical pumping of single crystals in the typical serial femtosecond crystallography geometry, which are developed for the general uniaxial and biaxial cases. The results present opportunities for polarization resolved anisotropic X-ray diffraction analysis of photochemical populations for the ultrafast time domain. This article is part of the theme issue ‘Measurement of ultrafast electronic and structural dynamics with X-rays’.

The XFM beamline at the Australian Synchrotron

2020 ◽  
Vol 27 (5) ◽  
pp. 1447-1458 ◽  
Author(s):  
Daryl L. Howard ◽  
Martin D. de Jonge ◽  
Nader Afshar ◽  
Chris G. Ryan ◽  
Robin Kirkham ◽  
...  
Keyword(s):  
Materials Science ◽  
Energy Detection ◽  
Array Detector ◽  
X Rays ◽  
X Ray Diffraction ◽  
High Definition ◽  
Large Area ◽  
X Ray ◽  
Diffraction Microscopy ◽  
System Time

The X-ray fluorescence microscopy (XFM) beamline is an in-vacuum undulator-based X-ray fluorescence (XRF) microprobe beamline at the 3 GeV Australian Synchrotron. The beamline delivers hard X-rays in the 4–27 keV energy range, permitting K emission to Cd and L and M emission for all other heavier elements. With a practical low-energy detection cut-off of approximately 1.5 keV, low-Z detection is constrained to Si, with Al detectable under favourable circumstances. The beamline has two scanning stations: a Kirkpatrick–Baez mirror microprobe, which produces a focal spot of 2 µm × 2 µm FWHM, and a large-area scanning `milliprobe', which has the beam size defined by slits. Energy-dispersive detector systems include the Maia 384, Vortex-EM and Vortex-ME3 for XRF measurement, and the EIGER2 X 1 Mpixel array detector for scanning X-ray diffraction microscopy measurements. The beamline uses event-mode data acquisition that eliminates detector system time overheads, and motion control overheads are significantly reduced through the application of an efficient raster scanning algorithm. The minimal overheads, in conjunction with short dwell times per pixel, have allowed XFM to establish techniques such as full spectroscopic XANES fluorescence imaging, XRF tomography, fly scanning ptychography and high-definition XRF imaging over large areas. XFM provides diverse analysis capabilities in the fields of medicine, biology, geology, materials science and cultural heritage. This paper discusses the beamline status, scientific showcases and future upgrades.

Imaging with Soft X-Rays

1988 ◽  
Vol 143 ◽  
Author(s):  
D. M. Shinozaki
Keyword(s):  
Synchrotron Radiation ◽  
X Rays ◽  
X Ray ◽  
Recent Advances ◽  
X Ray Imaging

AbstractA review of recent advances in soft X-ray imaging using synchrotron radiation is given.

scholarly journals Recent Advances in X-Ray Astronomy

1995 ◽  
Vol 10 ◽  
pp. 3-16
Author(s):  
Yasuo Tanaka
Keyword(s):  
Wide Temperature Range ◽  
X Rays ◽  
New Era ◽  
X Ray ◽  
Temperature Range ◽  
Rocket Flight ◽  
Recent Advances ◽  
Multi Wavelength ◽  
The Universe ◽  
Made In

X-ray astronomy was born in June 1962 with a totally unexpected discovery of a bright X-ray source (presently known as Sco X-1) in a historic rocket flight conducted by Riccardo Giacconi, Herb Gursky, Frank Paolini and late Bruno Rossi. In the last 30 years, astronomy through the newly opened window has made a dramatic expansion.The universe contains enormously rich varieties which had been left unexplored until recent times. From 40’s through 60’s, new wavelength windows, radio, infrared and X-rays successively opened. As a result, the presence of objects and regions distributed over an extremely wide temperature range from a few Kelvin through hundreds of millions of Kelvin were discovered. A burst of surprising discoveries made in 60’s marked the opening of a whole new era of multi-wavelength astronomy.

X-Ray Diffraction – The Magic Wand

2020 ◽  
Vol 42 (3) ◽  
pp. 317-317
Author(s):  
Iqra Zubair Awan Iqra Zubair Awan
Keyword(s):  
Materials Science ◽  
Review Paper ◽  
Medical Community ◽  
X Rays ◽  
X Ray Diffraction ◽  
Medical Sciences ◽  
X Ray ◽  
Magic Wand ◽  
History Of ◽  
Engineering Materials

This review paper covers one of the most important discoveries of the last century, viz. X-ray diffraction. It has made enormous contribution to chemistry, physics, engineering, materials science, crystallography and above all medical sciences. The review covers the history of X-rays detection and production, its uses/ applications. The scientific and medical community will forever be indebted to Rand#246;ntgen for this invaluable discovery and to those who perfected its application.

The Use of X-Ray Photoelectron Spectroscopy in Materials Science

1991 ◽  
Vol 35 (B) ◽  
pp. 869-882 ◽  
Author(s):  
James Castle
Keyword(s):  
Surface Analysis ◽  
Photoelectron Spectroscopy ◽  
Materials Science ◽  
Polymer Surface ◽  
Surface Region ◽  
Binding Energies ◽  
Particulate Composites ◽  
X Rays ◽  
Additional Advantage ◽  
X Ray

AbstractThis review will attempt to show how XPS now makes an important contribution to Materials Science and to highlight the developments which have brought it to this position. XPS is now a mature technique for surface analysis but it has in addition a major role as a specialised tool, being essential to studies in which derivitization methods are used to tag surface groups.The requirements of users in this field have led to the development of X-ray sources which were not envisaged in the early development of the spectroscopy. The usual sources of aluminium Kα and magnesium Kα have limitations for those elements beyond magnesium in the periodic table which would have the Is lino as the principal peak - aluminium, silicon, oulphur and phosphorus for example. Higher energy sources such as silicon Kα or zirconium and silver Lα have made it possible to utilise the Is lines up to chlorine and have the additional advantage that a strong and well resolved series of Auger lines also becomes available. The higher energy radiations are thus particularly suited to the determination of relaxation energies in materials by use of relative shifts between the photo- and Auger lines of the spectrum. Such has been the utility of such relaxation energies that use is often made of Auger lines derived from the Bremmstrahlung component of the normal x-ray sources to make a similar measurement. This measurement is used in the study of insulating ceramics in which electrostatic charging makes measurement of binding energies uncertain.Modern materials technology is particularly concerned with the manufacture of composites; particulate, fibre and laminate composites are all well known and the key to their success often lies within the interface between the phases. Transfer of load across the interface places particular requirements on adhesion at the phase boundary and an understanding of the locus of failure during destructive testing is crucial to the development of satisfactory bonding processes. In coated and laminated products there is no problem in the use of XPS, with its excellent chemical sensitivity but there is a problem of increasing magnitude in fibre and particulate composites as the substructures become finer. This stems, of course, from the difficulty of providing a focused source of X-rays of sufficient magnitude. Imaging XPS is slowly becoming a reality with several systems having a capability of 10μm now available, and one of the markets for such instruments is that of composite materials.There are important areas of Materials Science in which XPS has been displaced by other techniques such as SIMS. One such area is that of polymer surface analysis. The selectivity of XPS for substituent groups in the surface region is not good. Derivitization methods have made an impact, enabling acidic or basic groups to be determined, but SIMS, which has the ability to detach molecular clusters, has obvious advantages which will become increasingly exploited aa the problems of charging become solved. Until then however XPS will continue to find a role in polymer research and development.

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