scholarly journals The Change of Phase Due to the Passage of Electric Waves through Thin Plates and the Index of Refraction of Water for Such Waves, with Applications to the Optics of Thin Films and Prisms

1908 ◽  
Vol 26 (1) ◽  
pp. 61-97
Author(s):  
Wm. R. Blair
Author(s):  
Michael E. Thomas

This chapter emphasizes the linear optical properties of solids as a function of frequency and temperature. Such information is basic to understanding the performance of optical fibers, lenses, dielectric and metallic mirrors, window materials, thin films, and solid-state photonic devices in general. Optical properties are comprehensively covered in terms of mathematical models of the complex index of refraction based on those discussed in Chapters 4 and 5. Parameters for these models are listed in Appendix 4. A general review of solid-state properties precedes this development because the choice of an optical material requires consideration of thermal, mechanical, chemical, and physical properties as well. This section introduces the classification of optical materials and surveys other material properties that must be considered as part of total optical system design involving solidstate optics. Solid-state materials can be classified in several ways. The following are relevant to optical materials. Three general classes of solids are insulators, semiconductors, and metals. Insulators and semiconductors are used in a variety of ways, such as lenses, windows materials, fibers, and thin films. Semiconductors are used in electrooptic devices and optical detectors. Metals are used as reflectors and high-pass filters in the ultraviolet. This type of classification is a function of the material’s electronic bandgap. Materials with a large room-temperature bandgap (Eg > 3eV) are insulators. Materials with bandgaps between 0 and 3 eV are semiconductors. Metals have no observable bandgap because the conduction and valence bands overlap. Optical properties change drastically from below the bandgap, where the medium is transparent, to above the bandgap, where the medium is highly reflective and opaque. Thus, knowledge of its location is important. Appendix 4 lists the bandgaps of a wide variety of optical materials. To characterize a medium within the region of transparency requires an understanding of the mechanisms of low-level absorption and scattering. These mechanisms are classified as intrinsic or extrinsic. Intrinsic properties are the fundamental properties of a perfect material, caused by lattice vibrations, electronic transitions, and so on, of the atoms composing the material.


1991 ◽  
Vol 223 ◽  
Author(s):  
U. J. Gibson

ABSTRACTIon bombardment during growth of thin films has been shown to be a powerful technique for alteration of a wide variety of film properties from index of refraction and stoichiometry to density and abrasion resistance. A brief review of the deposition processes and ion effects of relevance to the production of optical films is presented. Application of the technique to some particular problems in films with both optical and protective roles, and the use of ion beams to alter the chemical composition and hence index of films will be discussed. Both homogeneous and spatially non-uniform coatings will be discussed, including generation of multilayer filters and gradient index structures in waveguiding films.


Author(s):  
Anna Garahan ◽  
Laurent Pilon ◽  
Juan Yin ◽  
Indu Saxena

This paper aims at developing numerically validated models for predicting the through-plane effective index of refraction and absorption index of nanocomposite thin-films. First, models for the effective optical properties are derived from previously reported analysis applying the volume averaging theory (VAT) to the Maxwell's equations. The transmittance and reflectance of nanoporous thin-films are computed by solving the Maxwell's equations and the associated boundary conditions at all interfaces using finite element methods. The effective optical properties of the films are retrieved by minimizing the root mean square of the relative errors between the computed and theoretical transmittance and reflectance. Nanoporous thin-films made of SiO2 and TiO2 consisting of cylindrical nanopores and nanowires are investigated for different diameters and various porosities. Similarly, electromagnetic wave transport through dielectric medium with embedded metallic nanowires are simulated. Numerical results are compared with predictions from widely used effective property models including (1) Maxwell-Garnett Theory, (2) Bruggeman effective medium approximation, (3) parallel, (4) series, (5) Lorentz-Lorenz, and (6) VAT models. Very good agreement is found with the VAT model for both the effective index of refraction and absorption index. Finally, the effect of volume fraction on the effective complex index of refraction predicted by the VAT model is discussed. For certain values of wavelengths and volume fractions, the effective index of refraction or absorption index of the composite material can be smaller than that of both the continuous and dispersed phases. These results indicate guidelines for designing nanocomposite optical materials.


1994 ◽  
Vol 361 ◽  
Author(s):  
Bryan D. Dickerson ◽  
Masaya Nagata ◽  
Y.J. Song ◽  
H.D. Nam ◽  
Seshu B. Desu

ABSTRACTOptical properties of La2Ti2O7 thin films were investigated by spectroscopie ellipsometry and compared to those of bulk sintered ceramics. Thin films were prepared by pulsed laser deposition (PLD) from bulk targets. To separate the effects of thickness, porosity, and index of refraction on observed Ψ and δspectra in thin films, a Cauchy model for n vs. λ was developed from sintered samples, with known porosity. Assuming the effective bulk index of refraction followed the rule of mixtures, corrected models for La2Ti2O7 without porosity were used to determine thickness and porosity of thin films as a function of fabrication parameters such as laser energy, substrate material and temperature. Ellipsometry models were tested and refined through XRD, EDX, ESCA, and SEM.


2013 ◽  
Vol 690-693 ◽  
pp. 1707-1710
Author(s):  
Liang Yan Chen ◽  
Li Zhang ◽  
Hao Zhang ◽  
Fan Yang ◽  
Zhi Ming Luo ◽  
...  

Zinc selenide (ZnSe) quantum dot thin films have been deposited onto microscope glass through chemical bath deposition both from original amonia free alkaline precursors and modified precursors with the adding of sodium citrate as complexing agents. The growth and optical properties of samples from original and modified precursors have been investigated. Its shown that the samples obtained with sodium citrate precursors are uniform and with stable index of refraction. And with the adding of sodium citrate, there is an increase in transmittance.


1988 ◽  
Vol 128 ◽  
Author(s):  
G. A. Al-Jumaily ◽  
T. A. Mooney ◽  
W. A. Spurgeon ◽  
H. M. Dauplaise

ABSTRACTOptical thin films of nitrides, oxynitrides and oxides of aluminum and silicon were deposited using ion assisted deposition. Coatings were deposited by thermal evaporation of AlN and e-beam evaporation of Si with simultaneous bombardment with 300 eV ions of nitrogen, a mixture of nitrogen and oxygen or oxygen. The chemical composition and the index of refraction of the coating was varied by varying the gas mixture in the ion beam. Optical properties of and environmental stability of coatings were examined. Results indicated that coatings are stable even under severe conditions of humidity and temperature.


2002 ◽  
Vol 750 ◽  
Author(s):  
Caroline L. Schauer ◽  
Paul E. Schoen ◽  
Frances S. Ligler

ABSTRACTThe alternation of chitin layers with various compounds allows nature to create novel materials with selective refractive properties. Various organisms employ layered materials for survival; for example, in butterflies such materials cause the apparent disappearance and reappearance during flight to evade predators. The selective light refraction is achieved through control of the thickness and index of refraction of the multiple layers. With the ultimate goal of reproducing these layers, thin single films of chitosan, the soluble form of chitin, and poly(allyl amine) have been prepared and their optical properties analyzed. Ellipsometry, reflectance IR, reflectance spectroscopy, SEM and software modeling were used to characterize these films. Possible applications for optical layered materials range from medical diagnostics to environmental monitoring.


1948 ◽  
Vol 26a (4) ◽  
pp. 230-235 ◽  
Author(s):  
R. W. Stewart

The index of refraction of thin films deposited on an optical flat is obtained by comparison of the fringe system set up in the film with that in the air gap between the film and another optical flat. The use of the method is illustrated by application to films produced in high frequency discharge tubes. Films produced in Pyrex glass and quartz tubes are shown to be silica in the form of cristobalite. Films produced in polystyrene tubes prove to have an index of refraction that is very low and is a function of the thickness.


1999 ◽  
Vol 102 (1-3) ◽  
pp. 1091-1092 ◽  
Author(s):  
E.K. Miller ◽  
M.D. McGehee ◽  
M. Diaz-Garcia ◽  
V. Srikant ◽  
A.J. Heeger

1975 ◽  
Vol 53 (18) ◽  
pp. 1737-1742 ◽  
Author(s):  
J. H. Wohlgemuth ◽  
D. E. Brodie

A new method for determining the index of refraction from normal incidence reflection and transmission measurements has been developed. Several other methods are reviewed to explain why a new method is needed. The author's method used a thickness variational approach. For an accurate determination of n and k, the method requires normal incidence reflection and transmission measurements over a fairly broad spectral range for at least two different film thicknesses. These requirements are unavoidable for normal incidence methods.


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