scholarly journals Asymmetric X-ray diffraction method to the measurement of elastic constants for epitaxially grown single crystal

1987 ◽  
Vol 43 (a1) ◽  
pp. C125-C125
Author(s):  
T. Tanaka ◽  
Y. Kashihara ◽  
J. Harada ◽  
N. Kashiwagura
2020 ◽  
Vol 10 (1) ◽  
Author(s):  
Durga Sankar Vavilapalli ◽  
Ambrose A. Melvin ◽  
F. Bellarmine ◽  
Ramanjaneyulu Mannam ◽  
Srihari Velaga ◽  
...  

AbstractIdeal sillenite type Bi12FeO20 (BFO) micron sized single crystals have been successfully grown via inexpensive hydrothermal method. The refined single crystal X-ray diffraction data reveals cubic Bi12FeO20 structure with single crystal parameters. Occurrence of rare Fe4+ state is identified via X-ray photoelectron spectroscopy (XPS) and X-ray absorption spectroscopy (XAS). The lattice parameter (a) and corresponding molar volume (Vm) of Bi12FeO20 have been measured in the temperature range of 30–700 °C by the X-ray diffraction method. The thermal expansion coefficient (α) 3.93 × 10–5 K−1 was calculated from the measured values of the parameters. Electronic structure and density of states are investigated by first principle calculations. Photoelectrochemical measurements on single crystals with bandgap of 2 eV reveal significant photo response. The photoactivity of as grown crystals were further investigated by degrading organic effluents such as Methylene blue (MB) and Congo red (CR) under natural sunlight. BFO showed photodegradation efficiency about 74.23% and 32.10% for degrading MB and CR respectively. Interesting morphology and microstructure of pointed spearhead like BFO crystals provide a new insight in designing and synthesizing multifunctional single crystals.


2014 ◽  
Vol 70 (a1) ◽  
pp. C1560-C1560
Author(s):  
Fumiko Kimura ◽  
Wataru Oshima ◽  
Hiroko Matsumoto ◽  
Hidehiro Uekusa ◽  
Kazuaki Aburaya ◽  
...  

In pharmaceutical sciences, the crystal structure is of primary importance because it influences drug efficacy. Due to difficulties of growing a large single crystal suitable for the single crystal X-ray diffraction analysis, powder diffraction method is widely used. In powder method, two-dimensional diffraction information is projected onto one dimension, which impairs the accuracy of the resulting crystal structure. To overcome this problem, we recently proposed a novel method of fabricating a magnetically oriented microcrystal array (MOMA), a composite in which microcrystals are aligned three-dimensionally in a polymer matrix. The X-ray diffraction of the MOMA is equivalent to that of the corresponding large single crystal, enabling the determination of the crystal lattice parameters and crystal structure of the embedded microcrytals.[1-3] Because we make use of the diamagnetic anisotropy of crystal, those crystals that exhibit small magnetic anisotropy do not take sufficient three-dimensional alignment. However, even for these crystals that only align uniaxially, the determination of the crystal lattice parameters can be easily made compared with the determination by powder diffraction pattern. Once these parameters are determined, crystal structure can be determined by X-ray powder diffraction method. In this paper, we demonstrate possibility of the MOMA method to assist the structure analysis through X-ray powder and single crystal diffraction methods. We applied the MOMA method to various microcrystalline powders including L-alanine, 1,3,5-triphenyl benzene, and cellobiose. The obtained MOMAs exhibited well-resolved diffraction spots, and we succeeded in determination of the crystal lattice parameters and crystal structure analysis.


2020 ◽  
Vol 53 (1) ◽  
pp. 99-106
Author(s):  
Andreas Johannes ◽  
Jura Rensberg ◽  
Tilman A. Grünewald ◽  
Philipp Schöppe ◽  
Maurizio Ritzer ◽  
...  

This work showcases a method to map the full deformation tensor in a single micro-sized crystal. It is shown that measuring the position of two Bragg reflections in reciprocal space is sufficient to obtain the full deformation tensor, if the condition of incompressibility of the material is imposed. This method is used to reveal the surface tension induced deformation at the edges of an as-grown single-crystal VO2 microwire. All components of the deformation tensor of the microwire were measured down to an absolute value of 10−4 in an 8 × 14 µm projected area of the wire. With a beam-defined spatial resolution of 150 × 150 nm, the measurement time was merely 2.5 h.


1976 ◽  
Vol 20 ◽  
pp. 53-62
Author(s):  
Alan D. Mighell

Single crystal X-ray diffraction methods for the study of crystalline materials, although reliable, have been, mainly confined to the academic laboratory because of the rather lengthy and complex procedure necessary to determine the unit cell and the space group. The situation has now changed. Several recent developments give single-crystal methods considerable potential for routine Industrial use. They Include growth of the data base, advances in lattice theory, and automation of the single-crystal X-ray diffractometer. To identify an unknown, one can start with a single crystal, mount it on the diffractometer, determine a refined primitive cell, reduce the cell, and check against a file of known reduced cells. The entire procedure can be automated. As a result, the single-crystal X-ray diffraction method can now complement the powder method for the routine analysis of crystalline materials.


2015 ◽  
Vol 48 (3) ◽  
pp. 853-856 ◽  
Author(s):  
V. R. Kocharyan ◽  
A. S. Gogolev ◽  
A. E. Movsisyan ◽  
A. H. Beybutyan ◽  
S. G. Khlopuzyan ◽  
...  

An X-ray diffraction method is developed for the determination of the distribution of temperature and interplanar spacing in a single-crystal plate. In particular, the temperature and the interplanar spacing differences in two different parts of a quartz single crystal of X-cut are experimentally determined depending on the value of the temperature gradient applied perpendicularly to the reflecting atomic planes (10\bar 11). The temperature distribution along the direction perpendicular to the reflecting atomic planes (10\bar 11) and the interplanar spacing distribution of atomic planes (10\bar 11) are determined as well.


2011 ◽  
Vol 170 ◽  
pp. 198-202 ◽  
Author(s):  
Junji Akimoto ◽  
Hiroshi Hayakawa ◽  
Norihito Kijima ◽  
Junji Awaka ◽  
Fuji Funabiki

Single crystals of Na0.44MnO2 (=Na4Mn9O18) have been synthesized by a flux method at 1173 K for the first time. The crystal structure of Na0.44MnO2 has been refined by single-crystal X-ray diffraction method. The framework structure consists of double and triple rutile-type chains of edge-sharing MnO6 octahedra and a single chain of edge-sharing MnO5. The Mn-O bond distance and bond valence analyses revealed the manganese valence Mn3+/Mn4+ ordering in the Na0.44MnO2 structure.


2021 ◽  
Author(s):  
Karuppasamy Pichan ◽  
T. Kamalesh ◽  
M. Senthilpandian ◽  
P. Ramasamy

Abstract Optical high quality semi-organic piperazinium tetrachlorozincate monohydrate, [C4H12N2] ZnCl4. H2O (PTCZ) single crystals were grown by conventional solution method. The structure of grown crystal was confirmed by the single crystal X-ray diffraction (SXRD) analysis. The material phase purities and its various (hkl) planes have been confirmed by the powder X-ray diffraction (PXRD) analysis at room temperature. The different functional groups were confirmed by the Fourier-transform infrared (FTIR) spectroscopy. The optical quality of the PTCZ single crystal and band gap energy have been identified by the UV-Vis NIR spectral analysis and also calculated refractive index of the material. The thermal stability of the PTCZ single crystal was investigated by TG-DTA. The hardness related properties were analyzed by microhardness tester. The dielectric properties have been measured on the grown single crystal and the electronic polarizability value has been calculated with various theoretical approach. The etching process was carried out on the grown crystal to finding the dislocation density. The crystal atomic perfection has been investigated by the high resolution X-ray diffraction (HRXRD) or Rocking curve (RC) analysis. The Z-scan measurement has been carried out to finding third-order optical susceptibility (χ(3)) of the grown single crystal using solid state laser (640 nm).


Sign in / Sign up

Export Citation Format

Share Document