scholarly journals Measurement of persistence in YAG:Ce3+scintillator with pulsed synchrotron X-rays

2011 ◽  
Vol 18 (4) ◽  
pp. 601-604 ◽  
Author(s):  
Tatsuhito Matsuo ◽  
Naoto Yagi
Keyword(s):  
High Resolution ◽  
Decay Time ◽  
Periodic Variation ◽  
Frame Rate ◽  
X Rays ◽  
X Ray Diffraction ◽  
Cmos Camera ◽  
X Ray ◽  
Space Resolution ◽  
Focused Beam

The decay time of YAG:Ce3+phosphor was studied using a CMOS camera with a frame rate of 1302000 s−1and pulsed X-rays from SPring-8. A high-resolution X-ray detector with YAG:Ce3+was used with the camera to view the focused beam from the helical undulator. Mismatch between the ring circulation time and the frame time gave rise to a periodic variation of beam intensity in successive frames. Analysis of data obtained with two bunch modes showed that the decay time of YAG:Ce3+was 60 ns. The variation of the beam positions in isolated bunches was small enough to be neglected in experiments using the focused beam. The results also show the possibility of an X-ray diffraction study at high time and space resolution.

Applications of High-Resolution Powder X-Ray Diffraction

2007 ◽  
Vol 130 ◽  
pp. 7-14 ◽  
Author(s):  
Andrew N. Fitch
Keyword(s):  
High Resolution ◽  
Synchrotron Radiation ◽  
Powder Diffraction ◽  
X Rays ◽  
X Ray Diffraction ◽  
Crystalline Materials ◽  
X Ray ◽  
Structural Characterisation ◽  
Pdf Analysis

The highly-collimated, intense X-rays produced by a synchrotron radiation source can be harnessed to build high-resolution powder diffraction instruments with a wide variety of applications. The general advantages of using synchrotron radiation for powder diffraction are discussed and illustrated with reference to the structural characterisation of crystalline materials, atomic PDF analysis, in-situ and high-throughput studies where the structure is evolving between successive scans, and the measurement of residual strain in engineering components.

Use Of A Capillary X-Ray Focused Beam To Investigate The Chemical Composition Of CdZnTe Wafers With High Resolution CdZnTe Detectors

1997 ◽  
Vol 487 ◽  
Author(s):  
P. Fougères ◽  
Ch. Burggraf ◽  
Chr. Burggraf ◽  
J. M. Koebel ◽  
C. Koenig ◽  
...  
Keyword(s):  
High Resolution ◽  
High Sensitivity ◽  
X Rays ◽  
Position Resolution ◽  
X Ray ◽  
High Position ◽  
Cdznte Detector ◽  
Cdznte Detectors ◽  
Focused Beam ◽  
New System

AbstractThe control of the concentration of Zn and its fluctuation in the high pressure Bridgman grown CdZnTe crystals is part of our characterization work on the ternary grown ingots grown in house. In order to reach both high sensitivity and high position resolution, we have developed a new system consisting of a X-ray generator, coupled to a focusing X-ray capillary, delivering intense beams in the micron scale, since the intensity gain is around a factor of 100 compared to conventional methods.The characteristic X-rays are measured through a high resolution CdZnTe detector (225 eV at 5.9 keV FWHM) cooled by a Peltier system. The results of our investigations on different kinds of crystals will be discussed.

scholarly journals HiSPoD: a program for high-speed polychromatic X-ray diffraction experiments and data analysis on polycrystalline samples

2016 ◽  
Vol 23 (4) ◽  
pp. 1046-1053 ◽  
Author(s):  
Tao Sun ◽  
Kamel Fezzaa
Keyword(s):  
Diffraction Data ◽  
High Speed ◽  
Short Pulse ◽  
Frame Rate ◽  
Short Exposure ◽  
X Rays ◽  
X Ray Diffraction ◽  
Short Exposure Time ◽  
X Ray ◽  
Structure Information

A high-speed X-ray diffraction technique was recently developed at the 32-ID-B beamline of the Advanced Photon Source for studying highly dynamic, yet non-repeatable and irreversible, materials processes. In experiments, the microstructure evolution in a single material event is probed by recording a series of diffraction patterns with extremely short exposure time and high frame rate. Owing to the limited flux in a short pulse and the polychromatic nature of the incident X-rays, analysis of the diffraction data is challenging. Here,HiSPoD, a stand-alone Matlab-based software for analyzing the polychromatic X-ray diffraction data from polycrystalline samples, is described. WithHiSPoD, researchers are able to perform diffraction peak indexing, extraction of one-dimensional intensity profiles by integrating a two-dimensional diffraction pattern, and, more importantly, quantitative numerical simulations to obtain precise sample structure information.

Micro X-ray diffraction analysis of thin films using grazing-exit conditions

1998 ◽  
Vol 5 (3) ◽  
pp. 902-904 ◽  
Author(s):  
Takashi Noma ◽  
Atsuo Iida
Keyword(s):  
Sample Surface ◽  
Exit Angle ◽  
X Rays ◽  
X Ray Diffraction ◽  
X Ray ◽  
Surface Sensitivity ◽  
Refraction Effect ◽  
Glancing Angle ◽  
Diffraction Patterns ◽  
Focused Beam

An X-ray diffraction technique using a hard X-ray microbeam for thin-film analysis has been developed. To optimize the spatial resolution and the surface sensitivity, the X-ray microbeam strikes the sample surface at a large glancing angle while the diffracted X-ray signal is detected with a small (grazing) exit angle. Kirkpatrick–Baez optics developed at the Photon Factory were used, in combination with a multilayer monochromator, for focusing X-rays. The focused beam size was about 10 × 10 µm. X-ray diffraction patterns of Pd, Pt and their layered structure were measured. Using a small exit angle, the signal-to-background ratio was improved due to a shallow escape depth. Under the grazing-exit condition, the refraction effect of diffracted X-rays was observed, indicating the possibility of surface sensitivity.

Live small-animal X-ray lung velocimetry and lung micro-tomography at the Australian Synchrotron Imaging and Medical Beamline

2015 ◽  
Vol 22 (4) ◽  
pp. 1049-1055 ◽  
Author(s):  
Rhiannon P. Murrie ◽  
Kaye S. Morgan ◽  
Anton Maksimenko ◽  
Andreas Fouras ◽  
David M. Paganin ◽  
...  
Keyword(s):  
High Resolution ◽  
Propagation Distance ◽  
Frame Rate ◽  
X Rays ◽  
Live Animal ◽  
X Ray ◽  
Lung Motion ◽  
Animal Imaging ◽  
Micro Tomography ◽  
Live Animal Imaging

The high flux and coherence produced at long synchrotron beamlines makes them well suited to performing phase-contrast X-ray imaging of the airways and lungs of live small animals. Here, findings of the first live-animal imaging on the Imaging and Medical Beamline (IMBL) at the Australian Synchrotron are reported, demonstrating the feasibility of performing dynamic lung motion measurement and high-resolution micro-tomography. Live anaesthetized mice were imaged using 30 keV monochromatic X-rays at a range of sample-to-detector propagation distances. A frame rate of 100 frames s−1allowed lung motion to be determined using X-ray velocimetry. A separate group of humanely killed mice and rats were imaged by computed tomography at high resolution. Images were reconstructed and rendered to demonstrate the capacity for detailed, user-directed display of relevant respiratory anatomy. The ability to perform X-ray velocimetry on live mice at the IMBL was successfully demonstrated. High-quality renderings of the head and lungs visualized both large structures and fine details of the nasal and respiratory anatomy. The effect of sample-to-detector propagation distance on contrast and resolution was also investigated, demonstrating that soft tissue contrast increases, and resolution decreases, with increasing propagation distance. This new capability to perform live-animal imaging and high-resolution micro-tomography at the IMBL enhances the capability for investigation of respiratory diseases and the acceleration of treatment development in Australia.

Bayesian Analysis of In-Situ High-Resolution X-Ray Diffraction Synchrotron Experiments of Ti-6Al-4V Specimens Undergoing Tensile Loading

2019 ◽  
Author(s):  
Nicholas Armstrong ◽  
Peter A. Lynch ◽  
Sitarama R. Kada ◽  
Pavel Cizek ◽  
Justin A. Kimpton ◽  
...  
Keyword(s):  
High Resolution ◽  
Crack Initiation ◽  
Tensile Loading ◽  
Xrd Analysis ◽  
X Rays ◽  
X Ray Diffraction ◽  
Tem Analysis ◽  
X Ray ◽  
Microstructural Damage

Abstract Linking the accumulation of microstructural damage prior to crack initiation to the lifing of aero-engines components would help to better predict the time that a component spends in this crack initiation stage. We present the results and analysis of in-situ high-resolution X-ray diffraction (XRD) experiments of a Ti-6Al-4V specimen that experienced tensile loading using medium energy synchrotron X-rays (≤ 21 keV) carried out at the Australian Synchrotron. The XRD analysis characterised XRD line-broadening due to the build-up of dislocations and the formation of crystallites in α- and β-Ti-6Al-4V specimens. Using Bayesian XRD analysis methods, the density, spatial arrangement of dislocations, and crystallite size information for α- and β-phases of the Ti-6Al-4V was extracted from the XRD line-profiles, as a function of applied load. The XRD analysis was then compared and validated with transmission electron microscopy (TEM) analysis of the specimen before and after the loading. Comparison of the TEM and XRD analysis reveals broad agreement in terms of the microstructural damage of Ti-6Al-4V specimens.

scholarly journals HIGH-RESOLUTION HIGH ENERGY X-RAY DIFFRACTION STUDIES OF CHARGE ORDERING IN CMR MANGANITES AND NICKELATES

2000 ◽  
Vol 14 (29n31) ◽  
pp. 3753-3758 ◽  
Author(s):  
STUART B. WILKINS ◽  
PETER D. HATTON ◽  
KLAUS-DIETER LISS ◽  
M. OHLER ◽  
T. KATSUFUJI ◽  
...  
Keyword(s):  
High Resolution ◽  
High Energy ◽  
Charge Ordering ◽  
X Rays ◽  
X Ray Diffraction ◽  
Strong Electron ◽  
Near Surface ◽  
Correlation Lengths ◽  
X Ray ◽  
Charge Modulations

High-resolution, high-energy, X-ray diffraction results are presented for the study of weak charge ordering phenomenon. By utilizing X-rays in the 100 keV region the dramatic increase in the penetration depth allows for both bulk-sensitive and high-resolution measurements to be made. The strontium doped La 2 NiO 4 system is a prototypical system in the understanding of strong electron-phonon coupling, and the resultant effects on material properties. At doping levels of 1/3 and 1/2 commensurate charge modulations are observed indicating real-space charge stripes. We have measured the correlation lengths of these charge stripes using both 100 keV X-rays and 8.3 keV X-rays. In comparing our results we have observed that the charge stripes appear to be well correlated in the near-surface region with correlation lengths ξ≈2400Å. However, our bulk sensitive measurements show that the charge stripes appear in a possible stripe glass phase with a correlation length of only ξ≈300Å. Our measurements on the 3D charge order manganite system Nd 0.5 Sr 0.5 MnO 3 show that the charge ordering appears to be well correlated in the bulk of the sample in contrast to our nickelate results.

scholarly journals Using refractive optics to broaden the focus of an X-ray mirror

2017 ◽  
Vol 24 (4) ◽  
pp. 744-749 ◽  
Author(s):  
David Laundy ◽  
Kawal Sawhney ◽  
Vishal Dhamgaye
Keyword(s):  
Focal Spot ◽  
X Rays ◽  
Beam Size ◽  
X Ray Diffraction ◽  
Size Change ◽  
Optical Elements ◽  
X Ray ◽  
High Data ◽  
Radiation Sources ◽  
Focused Beam

X-ray mirrors are widely used at synchrotron radiation sources for focusing X-rays into focal spots of size less than 1 µm. The ability of the beamline optics to change the size of this spot over a range up to tens of micrometres can be an advantage for many experiments such as X-ray microprobe and X-ray diffraction from micrometre-scale crystals. It is a requirement that the beam size change should be reproducible and it is often essential that the change should be rapid, for example taking less than 1 s, in order to allow high data collection rates at modern X-ray sources. In order to provide a controlled broadening of the focused spot of an X-ray mirror, a series of refractive optical elements have been fabricated and installed immediately before the mirror. By translation, a new refractive element is moved into the X-ray beam allowing a variation in the size of the focal spot in the focusing direction. Measurements using a set of prefabricated refractive structures with a test mirror showed that the focused beam size could be varied from less than 1 µm to over 10 µm for X-rays in the energy range 10–20 keV. As the optics is in-line with the X-ray beam, there is no effect on the centroid position of the focus. Accurate positioning of the refractive optics ensures reproducibility in the focused beam profile and no additional re-alignment of the optics is required.

Structural Change Caused by Substitution of Nd for Sm in (Nd, Sm)AlO3: Application of Synchrotron High-Resolution Powder X-ray Diffraction

1998 ◽  
Vol 31 (5) ◽  
pp. 663-671 ◽  
Author(s):  
Akihiro Saitow ◽  
Akira Yoshikawa ◽  
Hiroyuki Horiuchi ◽  
Toetsu Shishido ◽  
Tsuguo Fukuda ◽  
...  
Keyword(s):  
Structural Change ◽  
High Resolution ◽  
Lattice Parameters ◽  
X Rays ◽  
X Ray Diffraction ◽  
Ionic Radii ◽  
X Ray ◽  
Cubic Lattice ◽  
Trigonal System ◽  
Structure Changes

Structural change caused by substitution of Nd for Sm in perovskite (Nd, Sm)AlO3was analysed by application of high-resolution powder X-ray diffraction using synchrotron radiation. The parallel, well monochromated and bright incident X-rays improved the full width at half-maximum (FWHM) to 0.027° in a wide 2θ range for the standard Si powder. Applying this high-resolution optical system, the lattice parameters of the solid solution (Ndx, Sm_{1-x})AlO3were precisely analysed for the phases fromx = 0.0 to 1.0 with an interval of 0.2. The lattice parameters of a series ofRAlO3vary systematically with the average ionic radii of R^{3+}, accompanying a structural change from orthorhombic to a trigonal system at around R^{3+}=1.11 Å corresponding to average ionic radii of 0.7{\rm Nd}^{3+}+0.3{\rm Sm}^{3+}. In orthorhombic phases, deformation of the crystal lattice from its ideal cubic lattice is minimized at aroundx = 0.0–0.2 in (Ndx, Sm_{1-x})AlO3and increased with increasing average ionic radii of Nd^{3+} and Sm^{3+}. The structure changes from orthorhombic to trigonal at aroundx = 0.7.

A High Resolution Study of G.P. Zones in Aluminum - 4.2 at % Silver

1982 ◽  
Vol 40 ◽  
pp. 722-723 ◽  
Author(s):  
R. Gronsky
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Resolution ◽  
Computer Simulations ◽  
Structural Characteristics ◽  
X Ray Diffraction ◽  
X Ray ◽  
Transmission Electron ◽  
Resolution Study

The phenomenon of clustering in Al-Ag alloys has been extensively studied since the early work of Guinierl, wherein the pre-precipitation state was characterized as an assembly of spherical, ordered, silver-rich G.P. zones. Subsequent x-ray and TEM investigations yielded results in general agreement with this model. However, serious discrepancies were later revealed by the detailed x-ray diffraction - based computer simulations of Gragg and Cohen, i.e., the silver-rich clusters were instead octahedral in shape and fully disordered, atleast below 170°C. The object of the present investigation is to examine directly the structural characteristics of G.P. zones in Al-Ag by high resolution transmission electron microscopy.

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