Bayesian Analysis of In-Situ High-Resolution X-Ray Diffraction Synchrotron Experiments of Ti-6Al-4V Specimens Undergoing Tensile Loading

2019 ◽  
Author(s):  
Nicholas Armstrong ◽  
Peter A. Lynch ◽  
Sitarama R. Kada ◽  
Pavel Cizek ◽  
Justin A. Kimpton ◽  
...  
Keyword(s):  
High Resolution ◽  
Crack Initiation ◽  
Tensile Loading ◽  
Xrd Analysis ◽  
X Rays ◽  
X Ray Diffraction ◽  
Tem Analysis ◽  
X Ray ◽  
Microstructural Damage

Abstract Linking the accumulation of microstructural damage prior to crack initiation to the lifing of aero-engines components would help to better predict the time that a component spends in this crack initiation stage. We present the results and analysis of in-situ high-resolution X-ray diffraction (XRD) experiments of a Ti-6Al-4V specimen that experienced tensile loading using medium energy synchrotron X-rays (≤ 21 keV) carried out at the Australian Synchrotron. The XRD analysis characterised XRD line-broadening due to the build-up of dislocations and the formation of crystallites in α- and β-Ti-6Al-4V specimens. Using Bayesian XRD analysis methods, the density, spatial arrangement of dislocations, and crystallite size information for α- and β-phases of the Ti-6Al-4V was extracted from the XRD line-profiles, as a function of applied load. The XRD analysis was then compared and validated with transmission electron microscopy (TEM) analysis of the specimen before and after the loading. Comparison of the TEM and XRD analysis reveals broad agreement in terms of the microstructural damage of Ti-6Al-4V specimens.

Applications of High-Resolution Powder X-Ray Diffraction

2007 ◽  
Vol 130 ◽  
pp. 7-14 ◽  
Author(s):  
Andrew N. Fitch
Keyword(s):  
High Resolution ◽  
Synchrotron Radiation ◽  
Powder Diffraction ◽  
X Rays ◽  
X Ray Diffraction ◽  
Crystalline Materials ◽  
X Ray ◽  
Structural Characterisation ◽  
Pdf Analysis

The highly-collimated, intense X-rays produced by a synchrotron radiation source can be harnessed to build high-resolution powder diffraction instruments with a wide variety of applications. The general advantages of using synchrotron radiation for powder diffraction are discussed and illustrated with reference to the structural characterisation of crystalline materials, atomic PDF analysis, in-situ and high-throughput studies where the structure is evolving between successive scans, and the measurement of residual strain in engineering components.

Portable Apparatus for In Situ X-Ray Diffraction and Fluorescence Analyses of Artworks

2011 ◽  
Vol 17 (5) ◽  
pp. 667-673 ◽  
Author(s):  
Myriam Eveno ◽  
Brice Moignard ◽  
Jacques Castaing
Keyword(s):  
Thick Layer ◽  
Xrd Analysis ◽  
X Rays ◽  
X Ray Diffraction ◽  
Laboratory Equipment ◽  
Polycapillary Optics ◽  
X Ray ◽  
Analytical Technique ◽  
Lead Compounds

AbstractA portable X-ray fluorescence/X-ray diffraction (XRF/XRD) system for artwork studies has been designed constructed and tested. It is based on Debye Scherrer XRD in reflection that takes advantage of many recent improvements in the handling of X-rays (polycapillary optics; advanced two-dimensional detection). The apparatus is based on a copper anode air cooled X-ray source, and the XRD analysis is performed on a 5–20 μm thick layer from the object surface. Energy dispersive XRF elemental analysis can be performed at the same point as XRD, giving elemental compositions that support the interpretation of XRD diagrams. XRF and XRD analyses were tested to explore the quality and the limits of the analytical technique. The XRD diagrams are comparable in quality with diagrams obtained with conventional laboratory equipment. The mineral identification of materials in artwork is routinely performed with the portable XRF-XRD system. Examples are given for ceramic glazes containing crystals and for paintings where the determination of pigments is still a challenge for nondestructive analysis. For instance, lead compounds that provide a variety of color pigments can be easily identified as well as a pigment such as lapis lazuli that is difficult to identify by XRF alone. More than 70 works of art have been studied in situ in museums, monuments, etc. In addition to ceramics and paintings, these works include bronzes, manuscripts, etc., which permit improvement in the comprehension of ancient artistic techniques.

X-RAY DIFFRACTION FOR SURFACES AND BURIED INTERFACES

2000 ◽  
Vol 07 (04) ◽  
pp. 437-446 ◽  
Author(s):  
G. RENAUD
Keyword(s):  
Grazing Incidence ◽  
X Rays ◽  
X Ray Diffraction ◽  
X Ray ◽  
Grain Sizes ◽  
Buried Interfaces ◽  
Surfaces And Interfaces ◽  
Coherent Interfaces

The application of X-rays to the structural characterization of surfaces and interfaces, in situ and in UHV, is discussed on selected examples. Grazing incidence X-ray diffraction is not only a very powerful technique for quantitatively investigating the atomic structure of surfaces and interfaces, but is also very useful for providing information on the interfacial registry for coherent interfaces or on the strain deformation, island and grain sizes for incoherent epilayers.

In situ time-resolved X-ray diffraction of tobermorite formation process under hydrothermal condition: Influence of reactive al compound

2011 ◽  
Vol 26 (2) ◽  
pp. 134-137 ◽  
Author(s):  
K. Matsui ◽  
A. Ogawa ◽  
J. Kikuma ◽  
M. Tsunashima ◽  
T. Ishikawa ◽  
...  
Keyword(s):  
Hydrothermal Reaction ◽  
High Energy ◽  
Saturated Steam ◽  
Array Detector ◽  
Time Interval ◽  
X Rays ◽  
X Ray Diffraction ◽  
Formation Reaction ◽  
X Ray

Hydrothermal formation reaction of tobermorite in the autoclaved aerated concrete (AAC) process has been investigated by in situ X-ray diffraction. High-energy X-rays from a synchrotron radiation source in combination with a newly developed autoclave cell and a photon-counting pixel array detector were used. XRD measurements were conducted in a temperature range 100–190°C throughout 12 h of reaction time with a time interval of 4.25 min under a saturated steam pressure. To clarify the tobermorite formation mechanism in the AAC process, the effect of Al addition on the tobermorite formation reaction was studied. As intermediate phases, non-crystalline calcium silicate hydrate (C-S-H), hydroxylellestadite (HE), and katoite (KA) were clearly observed. Consequently, it was confirmed that there were two reaction pathways via C-S-H and KA in the tobermorite formation reaction of Al containing system. In addition, detailed information on the structural changes during the hydrothermal reaction was obtained.

MECHANICAL PROPERTIES OF A POLYURETHANE/MONTMORILLONITE NANOCOMPOSITE FEATURING ORGANOMODIFICATION SYNTHESIZED VIA IN SITU POLYMERIZATION

2015 ◽  
Vol 88 (1) ◽  
pp. 138-146 ◽  
Author(s):  
Rouhollah Bagheri ◽  
Reza Darvishi
Keyword(s):  
Mechanical Properties ◽  
In Situ Polymerization ◽  
Xrd Analysis ◽  
Silicate Layer ◽  
X Ray Diffraction ◽  
X Ray ◽  
End Groups ◽  
Layer Sample ◽  
Silicate Layers

ABSTRACT In this study, polyurethane (PU)/organomodified montmorillonite (cloisite®30B) is synthesized via in situ polymerization by reaction of an ether-based prepolymer with the isocyanate end groups and adiamine chain extender (4, 4-methylene-bis(2-chloroaniline)) in the presence of different amounts of nanoparticles dispersed in the prepolymer matrix by an ultrasonic mixer for 1 h. The synthesized polymers are cast on a pretreated carbon steel sheet and cured at 120 °C in an oven. The PU and its composites have been characterized by using Fourier transform infrared spectroscopy, X-ray diffraction (XRD), and mechanical testing. The XRD analysis of the cured samples containing 1 to 3 wt% cloisite30B showed intercalation segments in the silicate layers and exfoliation for 0.5 wt% nanoparticles. The highest mechanical properties were obtained using the cured exfoliated silicate layer sample. A twofold increase in the ultimate tensile strength and a 2.3 times increase in the adhesion strength were found for 0.5 wt% organoclay/PU as compared with that of pure PU. In addition, the exfoliated structure sample exhibited a 16% reduction in abrasion compared with that of pure PU.

Transformation of ferrihydrite to hematite: anin situinvestigation on the kinetics and mechanisms

2008 ◽  
Vol 72 (1) ◽  
pp. 217-220 ◽  
Author(s):  
H. P. Vu ◽  
S. Shaw ◽  
L. G. Benning
Keyword(s):  
High Resolution ◽  
Growth Mechanism ◽  
Elevated Temperatures ◽  
X Ray Diffraction ◽  
Electron Microscopic ◽  
Time Resolved ◽  
X Ray ◽  
Resolution Electron ◽  
Stage Process

AbstractThe kinetics and mechanisms of the transformation of 2-line ferrihydrite (FH) to hematite (HM), in the presence of Pb at elevated temperatures and high pH condition, were elucidated using synchrotron-based,in situenergy dispersive X-ray diffraction (EDXRD). The time-resolved diffraction data indicated that HM crystallization occurred via a two-stage process. Based on the EDXRD data, combined with high-resolution electron microscopic images, an aqueous-aided 2D growth mechanism is proposed for both HM crystallization stages.

Bi-Based Superconducting Multilayers Obtained by Molecular Beam Epitaxy

1999 ◽  
Vol 13 (09n10) ◽  
pp. 991-996
Author(s):  
M. Salvato ◽  
C. Attanasio ◽  
G. Carbone ◽  
T. Di Luccio ◽  
S. L. Prischepa ◽  
...  
Keyword(s):  
Molecular Beam Epitaxy ◽  
Molecular Beam ◽  
Xrd Analysis ◽  
High Energy ◽  
X Ray Diffraction ◽  
One Dimensional ◽  
X Ray ◽  
Diffraction Model ◽  
Different Thickness

High temperature superconducting multilayers have been obtained depositing Bi2Sr2CuO6+δ(2201) and ACuO2 layers, where A is Ca or Sr, by Molecular Beam Epitaxy (MBE) on MgO and SrTiO3 substrates. The samples, formed by a sequence of 2201/ACuO2 bilayers, have different thickness of ACuO2 layers while the thickness of the 2201 layers is kept constant. The surface structure of each layer has been monitored by in situ Reflection High Energy Electron Diffraction (RHEED) analysis which has confirmed a 2D nucleation growth. X-ray diffraction (XRD) analysis has been used to confirm that the layered structure has been obtained. Moreover, one-dimensional X-ray kinematic diffraction model has been developed to interpret the experimental data and to estimate the period of the multilayers. Resistive measurements have shown that the electrical properties of the samples strongly depend on the thickness of the ACuO2 layers.

IN SITU STUDIES OF EPITAXIAL GROWTH BY SYNCHROTRON X-RAY DIFFRACTION

2006 ◽  
Vol 13 (02n03) ◽  
pp. 155-166 ◽  
Author(s):  
WOLFGANG BRAUN ◽  
KLAUS H. PLOOG
Keyword(s):  
Ostwald Ripening ◽  
Crystal Surface ◽  
High Energy ◽  
Molecular Beam Epitaxy Growth ◽  
X Rays ◽  
Surface Kinetics ◽  
X Ray Diffraction ◽  
X Ray ◽  
Kinetics Of

X-rays are ideal to study the structure of crystals due to their weak interaction with matter and in most cases allow a quantitative analysis using kinematical theory. To study the incorporation of atoms during crystal growth and to analyze the kinetics on the crystal surface high primary beam intensities available at synchrotrons are required. Our studies of the molecular beam epitaxy growth of III–V semiconductors reveal that, despite their similarity in crystal structure, the surface kinetics of GaAs (001), InAs (001) and GaSb (001) differ strongly. GaAs shows an unexpectedly large coarsening exponent outside the predicted range of Ostwald ripening models during recovery. GaSb exhibits dramatically different surface morphology variations during growth and recovery. Overgrowth of GaAs by epitaxial MnAs demonstrates the ability of X-ray diffraction to follow an interface as it is buried during heteroepitaxy, which is not possible by reflection high-energy electron diffraction.

Recrystallization of AA1050 Studied by 3DXRD

2006 ◽  
Vol 519-521 ◽  
pp. 1569-1578
Author(s):  
Dorte Juul Jensen
Keyword(s):  
Single Crystals ◽  
High Energy ◽  
Nucleation And Growth ◽  
X Rays ◽  
X Ray Diffraction ◽  
Orientation Relationships ◽  
X Ray ◽  
3 Dimensional ◽  
Kinetics Of

By 3 dimensional X-ray diffraction (3DXRD) using high energy X-rays from synchrotron sources it is possible to study in-situ the nucleation and growth during recrystallization. In this paper it is described and discussed how 3DXRD can supplement EBSP measurements of nucleation and growth. Three types of studies are considered: i) orientation relationships between nuclei and parent deformed matrix, ii) recrystallization kinetics of individual bulk grains and iii) filming of growing grains in deformed single crystals.

Effects of Phosphorus Exposure on Arsenic-Stabilized GaAs 2×4 Surface

1993 ◽  
Vol 312 ◽  
Author(s):  
A. H. Bensaoula ◽  
A. Freundlich ◽  
A. Bensaoula ◽  
V. Rossignol
Keyword(s):  
High Resolution ◽  
Electron Diffraction ◽  
Growth Process ◽  
High Energy ◽  
Ex Situ ◽  
Chemical Beam Epitaxy ◽  
High Energy Electron ◽  
X Ray Diffraction ◽  
X Ray

AbstractPhosphorus exposed GaAs (100) surfaces during a Chemical Beam Epitaxy growth process are studied using in-situ Reflection High Energy Electron Diffraction and ex-situ High Resolution X-ray Diffraction. It is shown that the phosphorus exposure of a GaAs (100) surface in the 500 – 580 °C temperature range results in the formation of one GaP monolayer.

Sign in / Sign up

Export Citation Format

Share Document