scholarly journals Quantitative investigation of linear arbitrary polarization in an APPLE-II undulator

2018 ◽  
Vol 25 (2) ◽  
pp. 378-384
Author(s):  
Matthew Hand ◽  
Hongchang Wang ◽  
Francesco Maccherozzi ◽  
Marco Apollonio ◽  
Jingtao Zhu ◽  
...  
Keyword(s):  
Electron Beam ◽  
Synchrotron Radiation ◽  
Light Source ◽  
Polarization State ◽  
Measured Data ◽  
Beam Polarization ◽  
Quantitative Investigation ◽  
X Ray ◽  
The World

Insertion devices are utilized at synchrotron radiation facilities around the world for their capability to provide a high-brilliance X-ray beam. APPLE-II type undulators are especially important for their capacity to switch between a variety of photon beam polarization states. A high-precision soft X-ray polarimeter has been used to investigate the polarization calibration of an APPLE-II undulator (period length λu= 64 mm) installed on beamline I06 at Diamond Light Source. Systematic measurement of the beam polarization state at a range of linear arbitrary angles has been compared with the expected result for a given set of undulator gap and row phase parameters calculated from theory. Determination of the corresponding Stokes–Poincaré parameters from the measured data reveals a discrepancy between the two. The limited number of energy/polarization combinations included in the undulator calibration tables necessitates the use of interpolated values for the missing points which is expected to contribute to the discrepancy. However, by modifying the orbit of the electron beam through the undulator by at least 160 µm it has been found that for certain linear polarizations the discrepancies can be corrected. Overall, it is suggested that complete correction of the Stokes–Poincaré parameters for all linear angles would require alteration of both these aspects.

Determination of the electron beam size at the Kurchatov synchrotron radiation source using an X-ray refractive lens

2007 ◽  
Vol 1 (5) ◽  
pp. 528-532 ◽  
Author(s):  
A. N. Artemiev ◽  
A. A. Snigirev ◽  
V. N. Korchuganov ◽  
A. G. Valentinov ◽  
V. V. Kvardakov ◽  
...  
Keyword(s):  
Electron Beam ◽  
Synchrotron Radiation ◽  
Radiation Source ◽  
Synchrotron Radiation Source ◽  
Beam Size ◽  
X Ray ◽  
Refractive Lens

scholarly journals The Diamond Light Source and the challenges ahead for structural biology: some informal remarks

2015 ◽  
Vol 373 (2036) ◽  
pp. 20130156 ◽  
Author(s):  
V. Ramakrishnan
Keyword(s):  
Synchrotron Radiation ◽  
Light Source ◽  
Structural Biology ◽  
Complex Structures ◽  
Biological Processes ◽  
Short Article ◽  
X Ray ◽  
X Ray Crystallography ◽  
The Past

The remarkable advances in structural biology in the past three decades have led to the determination of increasingly complex structures that lie at the heart of many important biological processes. Many of these advances have been made possible by the use of X-ray crystallography using synchrotron radiation. In this short article, some of the challenges and prospects that lie ahead will be summarized.

X‐ray determination of the Debye temperature at high pressure using high‐energy synchrotron radiation

1990 ◽  
Vol 68 (6) ◽  
pp. 2719-2722 ◽  
Author(s):  
A. Matsumuro ◽  
M. Kobayashi ◽  
T. Kikegawa ◽  
M. Senoo
Keyword(s):  
High Pressure ◽  
Synchrotron Radiation ◽  
Debye Temperature ◽  
High Energy ◽  
X Ray

Determination of the alloying content in the matrix of Zr alloys using synchrotron radiation microprobe X-ray fluorescence

2003 ◽  
Vol 321 (2-3) ◽  
pp. 221-232 ◽  
Author(s):  
A Yilmazbayhan ◽  
O Delaire ◽  
A.T Motta ◽  
R.C Birtcher ◽  
J.M Maser ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
X Ray ◽  
The Matrix ◽  
Zr Alloys

Complete determination of polarization state in the hard X-ray region

1991 ◽  
Vol 24 (6) ◽  
pp. 982-986 ◽  
Author(s):  
T. Ishikawa ◽  
K. Hirano ◽  
S. Kikuta
Keyword(s):  
Phase Shift ◽  
Linear Polarization ◽  
Amplitude Ratio ◽  
Polarization State ◽  
Perfect Crystal ◽  
Electric Vector ◽  
X Ray ◽  
Complete Determination ◽  
Unpolarized Radiation

A new method for complete determination of polarization state in the hard X-ray region is described. The system consists of a perfect-crystal phase retarder and a linear polarization analyzer. This method gives not only the amplitude ratio of mutually perpendicular electric vector components and the phase shift between them but also the proportion of unpolarized radiation.

scholarly journals Determination of X-ray flux using silicon pin diodes

2009 ◽  
Vol 16 (2) ◽  
pp. 143-151 ◽  
Author(s):  
Robin L. Owen ◽  
James M. Holton ◽  
Clemens Schulze-Briese ◽  
Elspeth F. Garman
Keyword(s):  
Light Source ◽  
Energy Deposition ◽  
Photon Flux ◽  
Macromolecular Crystallography ◽  
Pin Diodes ◽  
Web Based ◽  
X Ray ◽  
Swiss Light Source ◽  
Flux Incident

Accurate measurement of photon flux from an X-ray source, a parameter required to calculate the dose absorbed by the sample, is not yet routinely available at macromolecular crystallography beamlines. The development of a model for determining the photon flux incident on pin diodes is described here, and has been tested on the macromolecular crystallography beamlines at both the Swiss Light Source, Villigen, Switzerland, and the Advanced Light Source, Berkeley, USA, at energies between 4 and 18 keV. These experiments have shown that a simple model based on energy deposition in silicon is sufficient for determining the flux incident on high-quality silicon pin diodes. The derivation and validation of this model is presented, and a web-based tool for the use of the macromolecular crystallography and wider synchrotron community is introduced.

scholarly journals Protein–ligand complex structure from serial femtosecond crystallography using soaked thermolysin microcrystals and comparison with structures from synchrotron radiation

2017 ◽  
Vol 73 (8) ◽  
pp. 702-709 ◽  
Author(s):  
Hisashi Naitow ◽  
Yoshinori Matsuura ◽  
Kensuke Tono ◽  
Yasumasa Joti ◽  
Takashi Kameshima ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
Room Temperature ◽  
Complex Structure ◽  
Binding Mode ◽  
Ligand Complex ◽  
X Ray ◽  
Cell Parameters ◽  
Serial Femtosecond Crystallography ◽  
Small Molecule Ligand

Serial femtosecond crystallography (SFX) with an X-ray free-electron laser is used for the structural determination of proteins from a large number of microcrystals at room temperature. To examine the feasibility of pharmaceutical applications of SFX, a ligand-soaking experiment using thermolysin microcrystals has been performed using SFX. The results were compared with those from a conventional experiment with synchrotron radiation (SR) at 100 K. A protein–ligand complex structure was successfully obtained from an SFX experiment using microcrystals soaked with a small-molecule ligand; both oil-based and water-based crystal carriers gave essentially the same results. In a comparison of the SFX and SR structures, clear differences were observed in the unit-cell parameters, in the alternate conformation of side chains, in the degree of water coordination and in the ligand-binding mode.

Diffuse x-ray scattering from InGaAs/GaAs quantum dots

2003 ◽  
Vol 799 ◽  
Author(s):  
Rolf Köhler ◽  
Daniil Grigoriev ◽  
Michael Hanke ◽  
Martin Schmidbauer ◽  
Peter Schäfer ◽  
...  
Keyword(s):  
Quantum Dots ◽  
Synchrotron Radiation ◽  
Diffuse Scattering ◽  
Data Evaluation ◽  
X Ray ◽  
X Ray Scattering ◽  
Gaas Matrix ◽  
Wetting Layers ◽  
Ray Scattering

ABSTRACTMulti-fold stacks of In0.6Ga0.4As quantum dots embedded into a GaAs matrix were investigated by means of x-ray diffuse scattering. The measurements were done with synchrotron radiation using different diffraction geometries. Data evaluation was based on comparison with simulated distributions of x-ray diffuse scattering. For the samples under consideration ((001) surface) there is no difference in dot extension along [110] and [-110] and no directional ordering. The measurements easily allow the determination of the average indium amount in the wetting layers. Data evaluation by simulation of x-ray diffuse scattering gives an increase of Incontent from the dot bottom to the dot top.

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