scholarly journals Beamline K11 DIAD: a new instrument for dual imaging and diffraction at Diamond Light Source

2021 ◽  
Vol 28 (6) ◽  
Author(s):  
Christina Reinhard ◽  
Michael Drakopoulos ◽  
Sharif I. Ahmed ◽  
Hans Deyhle ◽  
Andrew James ◽  
...  
Keyword(s):  
Light Source ◽  
Field Of View ◽  
Phase Identification ◽  
Specific Information ◽  
Beam Design ◽  
Dual Beam ◽  
New Instrument ◽  
In Operando ◽  
Dual Imaging

The Dual Imaging and Diffraction (DIAD) beamline at Diamond Light Source is a new dual-beam instrument for full-field imaging/tomography and powder diffraction. This instrument provides the user community with the capability to dynamically image 2D and 3D complex structures and perform phase identification and/or strain mapping using micro-diffraction. The aim is to enable in situ and in operando experiments that require spatially correlated results from both techniques, by providing measurements from the same specimen location quasi-simultaneously. Using an unusual optical layout, DIAD has two independent beams originating from one source that operate in the medium energy range (7–38 keV) and are combined at one sample position. Here, either radiography or tomography can be performed using monochromatic or pink beam, with a 1.4 mm × 1.2 mm field of view and a feature resolution of 1.2 µm. Micro-diffraction is possible with a variable beam size between 13 µm × 4 µm and 50 µm × 50 µm. One key functionality of the beamline is image-guided diffraction, a setup in which the micro-diffraction beam can be scanned over the complete area of the imaging field-of-view. This moving beam setup enables the collection of location-specific information about the phase composition and/or strains at any given position within the image/tomography field of view. The dual beam design allows fast switching between imaging and diffraction mode without the need of complicated and time-consuming mode switches. Real-time selection of areas of interest for diffraction measurements as well as the simultaneous collection of both imaging and diffraction data of (irreversible) in situ and in operando experiments are possible.

To Eliminate Curtain Effect of FIB TEM Samples by a Combination of Sample Dicing and Backside Milling

2014 ◽  
Author(s):  
Jian-Shing Luo ◽  
Hsiu Ting Lee
Keyword(s):  
Sample Preparation ◽  
Focused Ion Beam ◽  
Preparation Method ◽  
Low Cost ◽  
Ion Beam ◽  
Sample Preparation Method ◽  
Site Specific ◽  
Dual Beam ◽  
Transmission Electron

Abstract Several methods are used to invert samples 180 deg in a dual beam focused ion beam (FIB) system for backside milling by a specific in-situ lift out system or stages. However, most of those methods occupied too much time on FIB systems or requires a specific in-situ lift out system. This paper provides a novel transmission electron microscopy (TEM) sample preparation method to eliminate the curtain effect completely by a combination of backside milling and sample dicing with low cost and less FIB time. The procedures of the TEM pre-thinned sample preparation method using a combination of sample dicing and backside milling are described step by step. From the analysis results, the method has applied successfully to eliminate the curtain effect of dual beam FIB TEM samples for both random and site specific addresses.

In-Situ Dual Beam (FIBSEM) Techniques for Probe Pad Deposition and Dielectric Integrity Inspection in 0.2 μm Technology DRAM Single Cells

1999 ◽  
Author(s):  
Gunnar Zimmermann ◽  
Richard Chapman
Keyword(s):  
Electron Beam ◽  
Single Cell ◽  
Single Cells ◽  
Ion Beam ◽  
Gate Oxide ◽  
Ion Milling ◽  
Dual Beam ◽  
Sem Imaging ◽  
Innovative Techniques

Abstract Dual beam FIBSEM systems invite the use of innovative techniques to localize IC fails both electrically and physically. For electrical localization, we present a quick and reliable in-situ FIBSEM technique to deposit probe pads with very low parasitic leakage (Ipara < 4E-11A at 3V). The probe pads were Pt, deposited with ion beam assistance, on top of highly insulating SiOx, deposited with electron beam assistance. The buried plate (n-Band), p-well, wordline and bitline of a failing and a good 0.2 μm technology DRAM single cell were contacted. Both cells shared the same wordline for direct comparison of cell characteristics. Through this technique we electrically isolated the fail to a single cell by detecting leakage between the polysilicon wordline gate and the cell diffusion. For physical localization, we present a completely in-situ FIBSEM technique that combines ion milling, XeF2 staining and SEM imaging. With this technique, the electrically isolated fail was found to be a hole in the gate oxide at the bad cell.

scholarly journals Development of a Field Deployable Firebrand Flux and Condition Measurement System

2020 ◽  
Author(s):  
Simone Zen ◽  
Jan C. Thomas ◽  
Eric V. Mueller ◽  
Bhisham Dhurandher ◽  
Michael Gallagher ◽  
...  
Keyword(s):  
Imaging Techniques ◽  
Time History ◽  
Infrared Camera ◽  
Thermal Conditions ◽  
Particle Characterization ◽  
Fire Dynamics ◽  
Rate Of Spread ◽  
New Instrument ◽  
History Of

AbstractA new instrument to quantify firebrand dynamics during fires with particular focus on those associated with the Wildland-Urban Interface (WUI) has been developed. During WUI fires, firebrands can ignite spot fires, which can rapidly increase the rate of spread (ROS) of the fire, provide a mechanism by which the fire can pass over firebreaks and are the leading cause of structure ignitions. Despite this key role in driving wildfire dynamics and hazards, difficulties in collecting firebrands in the field and preserving their physical condition (e.g. dimensions and temperature) have limited the development of knowledge of firebrand dynamics. In this work we present a new, field-deployable diagnostic tool, an emberometer, designed to provide measurement of firebrand fluxes and information on both the geometry and the thermal conditions of firebrands immediately before deposition by combining a visual and infrared camera. A series of laboratory experiments were conducted to calibrate and validate the developed imaging techniques. The emberometer was then deployed in the field to explore firebrand fluxes and particle conditions for a range of fire intensities in natural pine forest environments. In addition to firebrand particle characterization, field observations with the emberometer enabled detailed time history of deposition (i.e. firebrand flux) relative to concurrent in situ fire behaviour observations. We highlight that deposition was characterised by intense, short duration “showers” that can be reasonably associated to spikes in the average fire line intensity. The results presented illustrate the potential use of an emberometer in studying firebrand and spot fire dynamics.

scholarly journals Extrinsic Camera Calibration with Line-Laser Projection

Sensors ◽  
2021 ◽  
Vol 21 (4) ◽  
pp. 1091
Author(s):  
Izaak Van Crombrugge ◽  
Rudi Penne ◽  
Steve Vanlanduit
Keyword(s):  
Camera Calibration ◽  
Real World ◽  
Large Scale ◽  
State Of The Art ◽  
Bundle Adjustment ◽  
Field Of View ◽  
Extrinsic Calibration ◽  
Practical Procedure ◽  
Partial Overlap

Knowledge of precise camera poses is vital for multi-camera setups. Camera intrinsics can be obtained for each camera separately in lab conditions. For fixed multi-camera setups, the extrinsic calibration can only be done in situ. Usually, some markers are used, like checkerboards, requiring some level of overlap between cameras. In this work, we propose a method for cases with little or no overlap. Laser lines are projected on a plane (e.g., floor or wall) using a laser line projector. The pose of the plane and cameras is then optimized using bundle adjustment to match the lines seen by the cameras. To find the extrinsic calibration, only a partial overlap between the laser lines and the field of view of the cameras is needed. Real-world experiments were conducted both with and without overlapping fields of view, resulting in rotation errors below 0.5°. We show that the accuracy is comparable to other state-of-the-art methods while offering a more practical procedure. The method can also be used in large-scale applications and can be fully automated.

Uniform-intensity, visible light source for in situ imaging

2009 ◽  
Vol 14 (2) ◽  
pp. 024024 ◽  
Author(s):  
Eyal Bar-Kochba ◽  
Saagar Govil ◽  
Jon P. Longtin ◽  
Andrew Gouldstone ◽  
Mary D. Frame
Keyword(s):  
Visible Light ◽  
Light Source ◽  
In Situ Imaging

Analyses of Echo-traces of Individual Fish Obtained in situ by Dual-beam Method.

1993 ◽  
Vol 59 (6) ◽  
pp. 943-950 ◽  
Author(s):  
Yoichi Miyanohana ◽  
Koichi Sawada ◽  
Yoshimi Takao ◽  
Masahiko Furusawa
Keyword(s):  
Individual Fish ◽  
Dual Beam ◽  
Beam Method

scholarly journals A Planar, Chip-Based, Dual-Beam Refractometer Using an Integrated Organic Light-Emitting Diode (OLED) Light Source and Organic Photovoltaic (OPV) Detectors

2010 ◽  
Vol 82 (7) ◽  
pp. 2734-2742 ◽  
Author(s):  
Erin L. Ratcliff ◽  
P. Alex Veneman ◽  
Adam Simmonds ◽  
Brian Zacher ◽  
Daniel Huebner ◽  
...  
Keyword(s):  
Light Source ◽  
Light Emitting Diode ◽  
Organic Photovoltaic ◽  
Light Emitting ◽  
Organic Light Emitting Diode ◽  
Organic Light ◽  
Dual Beam
Sign in / Sign up

Export Citation Format

Share Document