New capabilities for `colouring in' the chemistry of crystal defects atom-by-atom
2014 ◽
Vol 70
(6)
◽
pp. 521-523
Keyword(s):
X Ray
◽
The latest generation of scanning transmission electron microscopes equipped with high-efficiency energy-dispersive X-ray detectors are breaking new ground with respect to high-resolution elemental imaging of materials. In this issue, Paulauskaset al.[Acta Cryst.(2014), A70, 524–531] demonstrate impressive results when applying this technique to improve understanding of CdTe dislocation structures.
1991 ◽
Vol 49
◽
pp. 986-987
2010 ◽
pp. 291-351
◽
2017 ◽
Vol 23
(S1)
◽
pp. 388-389
◽
2014 ◽
Vol 94
(9)
◽
pp. 539-547
◽
1982 ◽
Vol 40
◽
pp. 420-423
2000 ◽
Vol 161-163
◽
pp. 221-226
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