Vapor Treatment of Block Copolymer Thin Films: GISAXS and Simulations

2014 ◽  
Vol 70 (a1) ◽  
pp. C877-C877
Author(s):  
Jianqi Zhang ◽  
Dorthe Posselt ◽  
Alessandro Sepe ◽  
Jan Perlich ◽  
Detlef-M. Smilgies ◽  
...  

The structural evolution in poly(styrene-b-butadiene) (P(S-b-B)) diblock copolymer thin films during treatment with cyclohexane vapor is investigated in-situ and in real-time using grazing-incidence small-angle X-ray scattering (GISAXS) [1]. Both the swelling and the drying process are investigated. The lamellae are initially perpendicular to the film surface, i.e. the film is laterally nanostructured. Cyclohexane is a good solvent for PB and a theta solvent for PS, i.e., it is slightly selective. Using incident angles above and below the polymer critical angle, structural changes near the film surface and in the entire film are distinguished. We find that, during swelling, the initially perpendicular lamellae tilt within the film. Our computer simulations [2] show that this is due to the tendency of the copolymers to assume less stretched chain conformations, i.e. the lamellae shrink upon solvent uptake. Since long-range mass transport is not easily possible, tilting allows satisfying the space-filling condition when the lamellae are shrinking. Surface-sensitive GISAXS experiments show that, at the film surface, the lamellae eventually vanish at the expense of a thin PB wetting layer. During the subsequent drying, the perpendicular lamellae reappear at the surface, and finally, PS blocks protrude because of the solvent selectivity. By modeling the 2D GISAXS images, the time-dependent height of the protrusions can be quantitatively extracted. Figure 1. (a) 2D GISAXS images during swelling (top row) and drying (bottom row). The times after the beginning of the vapor treatment are indicated. (b) Snapshots from computer simulations of perpendicular lamellae which tilt during the film swelling. From left to right, the degree of swelling increases.

2018 ◽  
Vol 25 (6) ◽  
pp. 1664-1672 ◽  
Author(s):  
M. Berlinghof ◽  
C. Bär ◽  
D. Haas ◽  
F. Bertram ◽  
S. Langner ◽  
...  

Since the properties of functional materials are highly dependent on their specific structure, and since the structural changes, for example during crystallization, induced by coating and annealing processes are significant, the study of structure and its formation is of interest for fundamental and applied science. However, structure analysis is often limited to ex situ determination of final states due to the lack of specialized sample cells that enable real-time investigations. The lack of such cells is mainly due to their fairly complex design and geometrical restrictions defined by the beamline setups. To overcome this obstacle, an advanced sample cell has been designed and constructed; it combines automated doctor blading, solvent vapor annealing and sample hydration with real-time grazing-incidence wide- and small-angle scattering (GIWAXS/GISAXS) and X-ray reflectivity (XRR). The sample cell has limited spatial requirements and is therefore widely usable at beamlines and laboratory-scale instruments. The cell is fully automatized and remains portable, including the necessary electronics. In addition, the cell can be used by interested scientists in cooperation with the Institute for Crystallography and Structural Physics and is expandable with regard to optical secondary probes. Exemplary research studies are presented, in the form of coating of P3HT:PC61PM thin films, solvent vapor annealing of DRCN5T:PC71BM thin films, and hydration of supported phospholipid multilayers, to demonstrate the capabilities of the in situ cell.


2013 ◽  
Vol 28 (S2) ◽  
pp. S144-S160 ◽  
Author(s):  
Dieter Jehnichen ◽  
Peter Friedel ◽  
Romy Selinger ◽  
Andreas Korwitz ◽  
Martin Wengenmayr ◽  
...  

Semifluorinated (SF) side chain polymers show phase separation between polymer backbone and SF side chains. Due to strong interaction between SF segments the side chains determine the structure behaviour strongly, often resulting in layered structures in which backbones and layers of SF side chains alternate. The interest in this work was directed to find out the dependence of these structures on concentration of SF side chains. Thin films of random copolymers consisting of methylmethacrylate (MMA) and semifluorinated side chain methacrylate (SFMA) segments and with different fluorine content in the perfluoroalkyl side chains (abbreviated as H10F10 and H2F8) were prepared by spin-coating. Phase separation and structure changes were initiated by external subsequent annealing. Corresponding bulk material served as basic information. Generation of ordered structures and variation of film parameters were observed using different X-ray scattering methods (XRR, GIWAXS, and GISAXS). The phase behaviour in bulk is governed by the SF side chain amount and their specific fluorine content which control the self-organization tendency of SF side chains. Additionally, the confinement in thin films generates an orientation of side chains normally to film surface.


Polymers ◽  
2021 ◽  
Vol 14 (1) ◽  
pp. 141
Author(s):  
Edgar Gutierrez-Fernandez ◽  
Tiberio A. Ezquerra ◽  
Mari-Cruz García-Gutiérrez

We reported on the interaction between poly(3,4-ethylenedioxythiophene):polystyrene sulfonate (PEDOT:PSS) and high-boiling-point additives in PEDOT:PSS aqueous dispersions and in the final polymer films with the aim of stablishing correlations between the structure of both inks and solid thin films. By Small-Angle X-ray Scattering (SAXS) using synchrotron radiation, it was found that the structural changes of dispersions of PEDOT:PSS with high-boiling-point additives can be explained as a two-step mechanism depending on the additive concentration. A compaction of PEDOT:PSS grains was observed at low concentrations while a swelling of the grains together with a phase segregation between PEDOT and PSS segments was evidenced at larger concentrations. Thin films’ morphology and structure were investigated by atomic force microscopy (AFM) and synchrotron Grazing Incidence Wide-Angle X-ray Scattering (GIWAXS) respectively. Our two-step model provides an explanation for the small and sharp domains of PEDOT:PSS thin films observed for low-additive concentrations (first step) and larger domains and roughness found for higher-additive concentrations (second step). A reduction of the ratio of PSS in PEDOT:PSS thin films upon the presence of additives was also observed. This can be related to a thinning of the PSS shells of PEDOT:PSS grains in the dispersion. The results discussed in this work provide the basis for a controlled tuning of PEDOT:PSS thin films structure and the subsequent electrical properties.


1996 ◽  
Vol 436 ◽  
Author(s):  
B. M. Clemens ◽  
T. C. Hufnagel ◽  
M. C. Kautzky ◽  
J.-F. Bobo

AbstractWe have used grazing incidence x-ray diffraction to observe the structural evolution during growth of sputter-deposited epitaxial Fe films on Cu(001) and Pt(001). We find that on Cu(001), Fe is fcc up to a thickness of 10–12 monolayers, whereupon bcc Fe is observed in first the Pitsch and then the Bain orientations. The fcc Fe shows some relaxation of the misfit from the Cu, as do the Pitsch orientation bcc, which is in tension, and the Bain orientation bcc, which is in compression. All three Fe variants exist in a 40 monolayer thick film. On Pt(001) the Fe grows as bcc with the Bain orientation. However, a thin (20 å) bcc Fe film is transformed to fcc Fe with cube-on-cube orientation by subsequent deposition of Pt. This behavior is consistent with intermixing of Pt into the Fe layer, which lowers the mismatch and bulk chemical energies of the fcc phase relative to that of the bcc phase.


2013 ◽  
Vol 802 ◽  
pp. 242-246 ◽  
Author(s):  
Narathon Khemasiri ◽  
Chanunthorn Chananonnawathorn ◽  
Mati Horprathum ◽  
Yossawat Rayanasukha ◽  
Darinee Phromyothin ◽  
...  

Tantalum oxide (Ta2O5) thin films, 100 nm thick were deposited by D.C. reactive magnetron sputtering system at different operated pressure on unheated p-type silicon (100) wafer and 304 stainless substrates. Their crystalline structure, film surface morphology and optical properties, as well as anticorrosive behavior, were investigated. The structure and morphology of films were characterized by grazing-incidence X-ray diffraction (GIXRD) and atomic force microscopy (AFM). The optical properties were determined by spectroscopic ellipsometry (SE). The corrosion performances of the films were investigated through potentiostat and immersion tests in 1 M NaCl solutions. The results showed that as-deposited Ta2O5 thin films were amorphous. The refractive index varied from 2.06 to 2.17 (at 550 nm) with increasing operated pressure. The corrosion rate of Ta2O5 thin film improves as the operated pressure decreases. The Ta2O5 thin films deposited at 3 mTorr operated pressure could be exhibited high performance anticorrosive behavior.


2019 ◽  
Vol 4 (2) ◽  
pp. 41 ◽  
Author(s):  
Macis ◽  
Rezvani ◽  
Davoli ◽  
Cibin ◽  
Spataro ◽  
...  

Structural changes of MoO3 thin films deposited on thick copper substrates upon annealing at different temperatures were investigated via ex situ X-Ray Absorption Spectroscopy (XAS). From the analysis of the X-ray Absorption Near-Edge Structure (XANES) pre-edge and Extended X-ray Absorption Fine Structure (EXAFS), we show the dynamics of the structural order and of the valence state. As-deposited films were mainly disordered, and ordering phenomena did not occur for annealing temperatures up to 300 °C. At ~350 °C, a dominant α-MoO3 crystalline phase started to emerge, and XAS spectra ruled out the formation of a molybdenum dioxide phase. A further increase of the annealing temperature to ~500 °C resulted in a complex phase transformation with a concurrent reduction of Mo6+ ions to Mo4+. These original results suggest the possibility of using MoO3 as a hard, protective, transparent, and conductive material in different technologies, such as accelerating copper-based devices, to reduce damage at high gradients.


IUCrJ ◽  
2020 ◽  
Vol 7 (2) ◽  
pp. 268-275 ◽  
Author(s):  
Raphael S. Märkl ◽  
Nuri Hohn ◽  
Emanuel Hupf ◽  
Lorenz Bießmann ◽  
Volker Körstgens ◽  
...  

Efficient infiltration of a mesoporous titania matrix with conducting organic polymers or small molecules is one key challenge to overcome for hybrid photovoltaic devices. A quantitative analysis of the backfilling efficiency with time-of-flight grazing incidence small-angle neutron scattering (ToF-GISANS) and scanning electron microscopy (SEM) measurements is presented. Differences in the morphology due to the backfilling of mesoporous titania thin films are compared for the macromolecule poly[4,8-bis(5-(2-ethylhexyl)thiophen-2-yl)benzo[1,2-b;4,5-b′]dithiophene-2,6-diyl-alt-(4-(2-ethylhexyl)-3-fluorothieno[3,4-b]thiophene-)-2-carboxylate-2-6-diyl)] (PTB7-Th) and the heavy-element containing small molecule 2-pinacolboronate-3-phenylphenanthro[9,10-b]tellurophene (PhenTe-BPinPh). Hence, a 1.7 times higher backfilling efficiency of almost 70% is achieved for the small molecule PhenTe-BPinPh compared with the polymer PTB7-Th despite sharing the same volumetric mass density. The precise characterization of structural changes due to backfilling reveals that the volumetric density of backfilled materials plays a minor role in obtaining good backfilling efficiencies and interfaces with large surface contact.


2007 ◽  
Vol 14 (04) ◽  
pp. 773-777 ◽  
Author(s):  
J. GAO ◽  
E. G. FU ◽  
X. S. WU

Highly epitaxial thin films of YBa 2 Cu 3 O y (YBCO) have been successfully grown on Si using a double buffer of Eu 2 CuO 4 (ECO)/(yttrium-stabilized zirconia) YSZ. The severe reaction between Si and YBCO is blocked by YSZ, and the crystallinity and superconductivity of the grown YBCO due to the lattice mismatch between YBCO and YSZ are improved by the ECO layer. The grown films were characterized by high-resolution X-ray diffraction, grazing incidence X-ray reflection, scanning electron microscopy (SEM), and Doppler broadened annihilation radiation spectroscopy, respectively. Very clear interfaces were found at YBCO/ECO/YSZ boundaries without any intermediate layer. The YBCO film surface was more smooth and stable. The results obtained indicate that highly epitaxial YBCO thin films can be successfully grown on Si wafers, demonstrating advantages of such a double buffer structure.


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