Electrical properties of thin-film resistors in a wide temperature range

Circuit World ◽  
2015 ◽  
Vol 41 (3) ◽  
pp. 116-120 ◽  
Author(s):  
Paweł Winiarski ◽  
Adam Kłossowicz ◽  
Jacek Wróblewski ◽  
Andrzej Dziedzic ◽  
Wojciech Stęplewski
Keyword(s):  
Thin Film ◽  
Electrical Properties ◽  
Low Temperature ◽  
Wide Temperature Range ◽  
Linear Temperature Dependence ◽  
Content Type ◽  
Temperature Range ◽  
Wide Range ◽  
Thin Film Resistors ◽  
Thermal Shocks

Purpose – The purpose of this paper is to characterize electrical properties of nickel-phosphorus (Ni-P) thin-film resistors made on FR-4 laminate in a wide range of temperature (from −180 to 20°C). Design/methodology/approach – The study was performed using resistors made of Ni-P foil with two different thicknesses (0.1 or 0.05 μm) and sheet resistances (100 or 250 Ω/sq), respectively. The resistance rectangular resistors had length and width from the range between 0.59 and 5.91 mm. The resistance versus temperature characteristics and their distribution as well as resistors ' durability to low-temperature thermal shocks were investigated. Findings – The results showed almost linear temperature dependence of resistance with a negative temperature coefficient of resistance of about −95 ppm/°C for 250 Ω/sq layer and −55 ppm/°C for 100 Ω/sq layer. A very small dimensional effect was observed for sheet resistance as well as for R(T) characteristic. Thin-film resistors are also characterized by very high durability to low-temperature thermal shocks. Originality/value – The results presented in this paper can be very useful for low-temperature applications of thin-film resistors made on printed circuit boards. They suggest possibility of wide applications of these components in a wide temperature range.

Stability of electrical properties for mechanically exposed thick- and thin-film resistors on flexible substrates

2017 ◽  
Vol 29 (1) ◽  
pp. 54-58 ◽  
Author(s):  
Andrzej Dziedzic ◽  
Pawel Osypiuk ◽  
Wojciech Steplewski
Keyword(s):  
Thin Film ◽  
Electrical Properties ◽  
Thick Film ◽  
Flexible Substrates ◽  
Stability Parameters ◽  
Content Type ◽  
Thin Film Resistors ◽  
Mechanical Factors ◽  
The Stability ◽  
Almost All

Purpose The paper aims to verify the influence of mechanical factors (longitudinal elongation at constant stretching velocity, constant elongation strain and cyclic compressive and tensile stresses) on the electrical properties of thin-film and polymer thick-film resistors on flexible substrates. Design/methodology/approach Kapton foil was used as a substrate for all test samples. Designed resistive structures were made with the aid of two polymer thick-film resistive inks or OhmegaPly Ni-P resistive foil. Two different topologies – the horseshoe and triangular – were used. These topologies should have the opposite stability parameters. Findings Almost all presented data confirm the influence of the topology of resistors on stability of their electrical properties. The resistive materials applied for test structures also affect the stability under various mechanical exposures. Originality/value In general, the largest changes were caused by longitudinal elongation at constant stretching velocity, whereas other tests caused smaller changes of electrical properties. The measurements confirm the influence of topology on stability of electric properties.

scholarly journals Modeling of Inhomogeneous 4H-SiC Schottky and JBS Diodes in a Wide Temperature Range

2016 ◽  
Vol 858 ◽  
pp. 741-744 ◽  
Author(s):  
Besar Asllani ◽  
Maxime Berthou ◽  
Dominique Tournier ◽  
Pierre Brosselard ◽  
Phillippe Godignon
Keyword(s):  
Low Temperature ◽  
Schottky Barrier ◽  
Barrier Height ◽  
Wide Temperature Range ◽  
Reverse Bias ◽  
Schottky Contact ◽  
Bias Current ◽  
Strong Impact ◽  
Temperature Range ◽  
Wide Range

This paper presents a study of the Schottky barrier evolution on SBD and JBS diodes over a wide range of temperatures from 80 to 500 K. We show that inhomogeneities of the Schottky contact have a strong impact on the dependence of barrier characteristics with temperature, especially below 200 K. Analysis of the reverse bias current of such diodes at low temperature show that the barrier height depends on temperature but also on voltage.

Enabling highly reversible sodium metal cycling across a wide temperature range with dual-salt electrolytes

2021 ◽  
Author(s):  
Akila C. Thenuwara ◽  
Pralav P. Shetty ◽  
Neha Kondekar ◽  
Chuanlong Wang ◽  
Weiyang Li ◽  
...  
Keyword(s):  
Wide Temperature Range ◽  
High Energy ◽  
Liquid Electrolyte ◽  
Metal Cycling ◽  
Temperature Range ◽  
Sodium Metal ◽  
Wide Range

A new dual-salt liquid electrolyte is developed that enables the reversible operation of high-energy sodium-metal-based batteries over a wide range of temperatures down to −50 °C.

Environmental tests of embedded thin- and thick-film resistors in comparison to chip resistors

Circuit World ◽  
2014 ◽  
Vol 40 (1) ◽  
pp. 7-12 ◽  
Author(s):  
Wojciech Steplewski ◽  
Andrzej Dziedzic ◽  
Janusz Borecki ◽  
Grazyna Koziol ◽  
Tomasz Serzysko
Keyword(s):  
Thin Film ◽  
Thick Film ◽  
Electrical Resistance ◽  
Printed Circuit Boards ◽  
Base Material ◽  
Forming Process ◽  
Content Type ◽  
Thin Film Resistors ◽  
Embedded Resistors ◽  
The Impact

Purpose – The purpose of this paper is to investigate the influence of parameters of embedded resistive elements manufacturing process as well as the influence of environmental factors on their electrical resistance. The investigations were made in comparison to the similar constructions of discrete chip resistors assembled to standard printed circuit boards (PCBs). Design/methodology/approach – The investigations were based on the thin-film resistors made of NiP alloy, thick-film resistors made of carbon or carbon-silver inks as well as chip resistors in 0402 and 0603 packages. The polymer thick-film resistive films were screen-printed on the several types finishing materials of contact terminations such as copper, silver, and gold. To determine the sensitivity of embedded resistors versus standard assembled chip resistors on environmental exposure, the climatic chamber was used. The measurements of resistance were carried out periodically during the tests, and after the exposure cycles. Findings – The results show that the change of electrical resistance of embedded resistors, in dependence of construction and base material, is different and mainly not exceed the range of 3 per cent. The achieved results in reference to thin-film resistors are comparable with results for standard chip resistors. However, the results that were obtained for thick-film resistors with Ag and Ni/Au contacts are similar. It was not found the big differences between resistors with and without conformal coating. Research limitations/implications – The studies show that embedded resistors can be used interchangeably with chip resistors. It allows to save the area on the surface of PCB, occupied by these passive elements, for assembly of active elements (ICs) and thus enable to miniaturization of electronic devices. But embedding of passive elements into PCB requires to tackle the effect of each forming process steps on the operational properties. Originality/value – The technique of passive elements embedding into PCB is generally known; however, there are no detailed reports on the impact of individual process steps and environmental conditions on the stability of their electrical resistance. The studies allow to understand the importance of each factor process and the mechanisms of operational properties changes depending on the used materials.

A wide temperature range dual-mode luminescence thermometer based on Pr3+-doped Ba(Zr0.16Mg0.28Ta0.56)O3 transparent ceramic

2021 ◽  
Author(s):  
Wei Tang ◽  
Chuandong Zuo ◽  
Yingkui Li ◽  
Chaoyang Ma ◽  
Xuanyi Yuan ◽  
...  
Keyword(s):  
Single Crystals ◽  
Wide Temperature Range ◽  
Transparent Ceramic ◽  
Transparent Ceramics ◽  
Dual Mode ◽  
Temperature Range ◽  
Temperature Detection ◽  
Thermal Shocks

Compared to glasses and single crystals, transparent ceramics present extraordinarily large resistance to thermal shocks. Here, dual-mode LIR/FL temperature detection with a wide temperature range is realized with BZMT:Pr3+transparent ceramic.

Target Crystallography and the Growth of Pb(Mg1/3Nb2/3)O3 (PMN) Thin Films

1998 ◽  
Vol 541 ◽  
Author(s):  
M.H. Corbett ◽  
G. Catalan ◽  
J.M. Gregg ◽  
R.M. Bowman
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Electrical Properties ◽  
Dielectric Loss ◽  
Wide Temperature Range ◽  
Pulsed Laser ◽  
Lead Magnesium Niobate ◽  
Laser Deposition ◽  
Film Capacitor ◽  
Lead Magnesium

AbstractLead magnesium niobate thin films have been grown on {100} MgO substrates using pulsed laser deposition (PLD). Several series of films were made using targets of varying perovskite and PbO content. The conditions necessary to produce almost 100% perovskite Pb(Mg1/3Nb2/3)O3 (PMN) films were most sensitive to the growth temperature rather than the starting target crystallography. The electrical properties were determined by fabricating planar thin film capacitor structures and monitoring capacitance and dielectric loss as a function of temperature. Our best capacitors yielded a loss of 0.1 at 1 kHz over a wide temperature range.

Polymer hybrid thin films based on rare earth ion-functionalized MOF: photoluminescence tuning and sensing as a thermometer

2015 ◽  
Vol 44 (4) ◽  
pp. 1875-1881 ◽  
Author(s):  
Xiang Shen ◽  
Bing Yan
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Rare Earth ◽  
Wide Temperature Range ◽  
Rare Earth Ion ◽  
Temperature Range ◽  
Polymer Hybrid ◽  
Hybrid Thin Films

A series of photofunctional polymer hybrid thin films based on rare earth ion-functionalized MOFs have been synthesized and can display multi-colors (red, blue, blue-green and white). Interestingly, Tb0.999Eu0.001-2 thin film can be used as ratiometric luminescent thermometer in a wide temperature range.

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