Highly reliable ultrathin silicon oxide film formation at low temperature by oxygen radical generated in high-density krypton plasma

2001 ◽  
Vol 48 (8) ◽  
pp. 1550-1555 ◽  
Author(s):  
K. Sekine ◽  
Y. Saito ◽  
M. Hirayama ◽  
T. Ohmi
1989 ◽  
Vol 157 ◽  
Author(s):  
Gikan H. Takaoka ◽  
Hiroshi Tsuji ◽  
Junzo Ishikawa

ABSTRACTSiO2 films were prepared at a substrate temperature of 100°C by the simultaneous use of a microwave ion source and an ICB system. Transparent and good insulating SiO2 films could be obtained by using 02 gas ions, and they were thermally and chemically stable. Furthermore, both the ionization energy and the incident energy of the 02 gas ions were found to enhance the chemical reaction between SiO and 02 molecules, resulting in the Si02 film formation at a low substrate temperature.


1990 ◽  
Vol 29 (Part 1, No. 1) ◽  
pp. 219C-219C
Author(s):  
Haruki Komano ◽  
Youji Ogawa ◽  
Tadahiro Takigawa

1988 ◽  
Author(s):  
Takuya Fukuda ◽  
Kazuo Suzuki ◽  
Yasuhiro Mochizuki ◽  
Michio Ohue ◽  
Naohiro Momma ◽  
...  

Author(s):  
Jun-Sik Kim ◽  
Ho-Kyoon Chung ◽  
Byoung-Deog Choi ◽  
Ki-Yong Lee ◽  
Jun-Sin Yi

1989 ◽  
Vol 28 (Part 1, No. 11) ◽  
pp. 2372-2375 ◽  
Author(s):  
Haruki Komano ◽  
Youji Ogawa ◽  
Tadahiro Takigawa

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