Highly reliable ultrathin silicon oxide film formation at low temperature by oxygen radical generated in high-density krypton plasma
2001 ◽
Vol 48
(8)
◽
pp. 1550-1555
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2002 ◽
Keyword(s):
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1988 ◽
Keyword(s):
2009 ◽
Vol 48
(3)
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pp. 035502
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2006 ◽
Vol 19
(4)
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pp. 334-338
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1996 ◽
Vol 47
(4)
◽
pp. 372-375
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