Adhesive behavior study between cellulose and borosilicate glass using colloidal probe technique

Author(s):  
Yuli Lai ◽  
Pasi Kallio ◽  
Yasuhito Sugano ◽  
Johan Bobacka
2018 ◽  
Vol 2 (4) ◽  
pp. 65 ◽  
Author(s):  
Alexander Smith ◽  
Plinio Maroni ◽  
Michal Borkovec ◽  
Gregor Trefalt

The colloidal probe technique was used to measure the inner layer capacitance of an electrical double layer. In particular, the forces were measured between silica surfaces and sulfate latex surfaces in solutions of monovalent salts of different alkali metals. The force profiles were interpreted with Poisson-Boltzmann theory with charge regulation, whereby the diffuse layer potential and the regulation properties of the interface were obtained. While the diffuse layer potential was measured in this fashion in the past, we are able to extract the regulation properties of the inner layer, in particular, its capacitance. We find systematic trends with the type of alkali metal ion and the salt concentration. The observed trends could be caused by difference in ion hydration, variation of the binding capacitance, and changes of the effective dielectric constant within the Stern layer. Our results are in agreement with recent experiments involving the water-silica interface based on a completely independent method using X-ray photoelectron spectroscopy in a liquid microjet. This agreement confirms the validity of our approach, which further provides a means to probe other types of interfaces than silica.


2011 ◽  
Vol 115 (29) ◽  
pp. 9098-9105 ◽  
Author(s):  
Marco Finessi ◽  
Prashant Sinha ◽  
István Szilágyi ◽  
Ionel Popa ◽  
Plinio Maroni ◽  
...  

2012 ◽  
Vol 179-182 ◽  
pp. 85-98 ◽  
Author(s):  
Michal Borkovec ◽  
Istvan Szilagyi ◽  
Ionel Popa ◽  
Marco Finessi ◽  
Prashant Sinha ◽  
...  

2015 ◽  
Vol 17 (25) ◽  
pp. 16553-16559 ◽  
Author(s):  
Valentina Valmacco ◽  
Gregor Trefalt ◽  
Plinio Maroni ◽  
Michal Borkovec

Direct force measurements between silica particles were carried out using the colloidal probe technique, which is based on an atomic force microscope (AFM).


2016 ◽  
Vol 80 (1) ◽  
pp. 144-152 ◽  
Author(s):  
F. Javier Montes Ruiz-Cabello ◽  
Mohsen Moazzami-Gudarzi ◽  
Magdalena Elzbieciak-Wodka ◽  
Plinio Maroni

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