Stress polarity dependence of the activation energy in time-dependent dielectric breakdown of thin gate oxides
2008 ◽
Vol 23
(6)
◽
pp. 1802-1808
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2000 ◽
Vol 39
(Part 1, No. 7B)
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pp. 4687-4691
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1998 ◽
Vol 45
(1)
◽
pp. 160-164
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1999 ◽
Vol 14
(10)
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pp. 892-896
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2011 ◽
Vol 88
(7)
◽
pp. 1376-1379
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Keyword(s):
2021 ◽
Vol 68
(5)
◽
pp. 2220-2225
Keyword(s):
2007 ◽
Vol 46
(No. 28)
◽
pp. L691-L692
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Keyword(s):