Impact of Structural Strained Layer near SiO2/Si Interface on Activation Energy of Time-Dependent Dielectric Breakdown
2000 ◽
Vol 39
(Part 1, No. 7B)
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pp. 4687-4691
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2008 ◽
Vol 23
(6)
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pp. 1802-1808
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2021 ◽
Vol 68
(5)
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pp. 2220-2225
Keyword(s):
2007 ◽
Vol 46
(No. 28)
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pp. L691-L692
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Keyword(s):
Keyword(s):
2013 ◽
Vol 26
(3)
◽
pp. 281-296