Catastrophic defects oriented testability analysis of a class AB amplifier

2002 ◽  
Author(s):  
M. Sachdev
Keyword(s):  
Class Ab ◽  
Testability Analysis

Reason Analysis of Runway Incursions Based on Grey Theory

2011 ◽  
Vol 328-330 ◽  
pp. 2400-2404
Author(s):  
Zi Qi Ju
Keyword(s):  
Gray Relational Analysis ◽  
Grey Theory ◽  
Prevention Measures ◽  
Key Factors ◽  
Class Ab ◽  
Relational Analysis ◽  
Definition Of ◽  
Grey Relational ◽  
Runway Incursions ◽  
Runway Incursion

To prevent runway incursions, we should have the corresponding systematic prevent ideas. Based on the definition of runway incursions and classification of relevant criteria, it analyzed the runway incursion system, put forward the closed-loop management ideas to prevent runway incursions, and found the main contradictions of preventing runway incursions using the gray relational analysis. With the example of runway incursion dates of U.S.A, by means of Grey Relational Analysis of different severities and different factors for runway incursions, it have shown that the key factors leading to the class AB and class CD runway incursions are Vehicle/Pedestrian Deviations and Pilot Deviations respectively. Meanwhile, it proposed integrated prevention measures of runway incursions.

scholarly journals A Neural Network Classifier with Multi-Valued Neurons for Analog Circuit Fault Diagnosis

Electronics ◽  
2021 ◽  
Vol 10 (3) ◽  
pp. 349
Author(s):  
Igor Aizenberg ◽  
Riccardo Belardi ◽  
Marco Bindi ◽  
Francesco Grasso ◽  
Stefano Manetti ◽  
...  
Keyword(s):  
Analog Circuits ◽  
Analog Circuit ◽  
Machine Learning Techniques ◽  
Rigorous Approach ◽  
Testability Analysis ◽  
Learning Techniques ◽  
Fabrication Tolerances ◽  
Circuit Fault Diagnosis ◽  
Faulty Component ◽  
Ambiguity Groups

In this paper, we present a new method designed to recognize single parametric faults in analog circuits. The technique follows a rigorous approach constituted by three sequential steps: calculating the testability and extracting the ambiguity groups of the circuit under test (CUT); localizing the failure and putting it in the correct fault class (FC) via multi-frequency measurements or simulations; and (optional) estimating the value of the faulty component. The fabrication tolerances of the healthy components are taken into account in every step of the procedure. The work combines machine learning techniques, used for classification and approximation, with testability analysis procedures for analog circuits.

scholarly journals Implementation of Power-Efficient Class AB Miller Amplifiers Using Resistive Local Common-Mode Feedback

2021 ◽  
Vol 11 (3) ◽  
pp. 31
Author(s):  
Anindita Paul ◽  
Mario Renteria-Pinon ◽  
Jaime Ramirez-Angulo ◽  
Ricardo Bolaños-Pérez ◽  
Héctor Vázquez-Leal ◽  
...  
Keyword(s):  
Current Efficiency ◽  
Figure Of Merit ◽  
Small Signal ◽  
Common Mode ◽  
Power Efficient ◽  
Class Ab ◽  
Op Amp ◽  
Class A ◽  
Wide Range ◽  
Quiescent Current

An approach to implement single-ended power-efficient static class-AB Miller op-amps with symmetrical and significantly enhanced slew-rate and accurately controlled output quiescent current is introduced. The proposed op-amp can drive a wide range of resistive and capacitive loads. The output positive and negative currents can be much higher than the total op-amp quiescent current. The enhanced performance is achieved by utilizing a simple low-power auxiliary amplifier with resistive local common-mode feedback that increases the quiescent power dissipation by less than 10%. The proposed class AB op-amp is characterized by significantly enhanced large-signal dynamic, static current efficiency, and small-signal figures of merits. The dynamic current efficiency is 15.6 higher, the static current efficiency is 8.9 times higher, and the small-signal figure of merit is 2.3 times higher than the conventional class-A op-amp. A global figure of merit that determines an op-amp’s ultimate speed is 6.33 times higher than the conventional class A op-amp.

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