Development of a High Resolution Magnetic Field Position Sensor System Based on a Through Silicon Via First Integration Concept

Non-magnetic thin films for magnetic field position sensor

Sensors and Actuators A Physical ◽

10.1016/j.sna.2016.12.001 ◽

2017 ◽

Vol 254 ◽

pp. 89-94 ◽

Cited By ~ 13

Author(s):

Rizwan Ur Rehman Sagar ◽

Awais Siddique Saleemi ◽

Khurram Shehzad ◽

Sachin T. Navale ◽

Rajaram S. Mane ◽

...

Keyword(s):

Magnetic Field ◽

Thin Films ◽

Magnetic Thin Films ◽

Position Sensor ◽

Magnetic Field Position ◽

Field Position

Effects of the peak magnetic field position on Hall thruster discharge characteristics

Advances in Space Research ◽

10.1016/j.asr.2020.06.036 ◽

2020 ◽

Vol 66 (8) ◽

pp. 2024-2034

Author(s):

Haotian Fan ◽

Hong Li ◽

Yongjie Ding ◽

Liqiu Wei ◽

Daren Yu

Keyword(s):

Magnetic Field ◽

Hall Thruster ◽

Discharge Characteristics ◽

Magnetic Field Position ◽

Field Position

A machine learning approach for simultaneous measurement of magnetic field position and intensity with fiber Bragg grating and magnetorheological fluid

Optical Fiber Technology ◽

10.1016/j.yofte.2020.102184 ◽

2020 ◽

Vol 56 ◽

pp. 102184 ◽

Cited By ~ 2

Author(s):

Arnaldo G. Leal-Junior ◽

Vinícius Campos ◽

Camilo Díaz ◽

Rafhael M. Andrade ◽

Anselmo Frizera ◽

...

Keyword(s):

Magnetic Field ◽

Machine Learning ◽

Fiber Bragg Grating ◽

Simultaneous Measurement ◽

Magnetorheological Fluid ◽

Bragg Grating ◽

Learning Approach ◽

Machine Learning Approach ◽

Magnetic Field Position ◽

Field Position

PC-Based System for Calibration, Reconstruction, Processing, and Visualization of 3D Ultrasound Data Based on a Magnetic-Field Position and Orientation Sensing System

Computational Science - ICCS 2001 - Lecture Notes in Computer Science ◽

10.1007/3-540-45718-6_2 ◽

2001 ◽

pp. 13-22 ◽

Cited By ~ 1

Author(s):

Emad Boctor ◽

A. Saad ◽

Dar-Jen Chang ◽

K. Kamel ◽

A. M. Youssef

Keyword(s):

Magnetic Field ◽

3D Ultrasound ◽

Sensing System ◽

Position And Orientation ◽

Magnetic Field Position ◽

Field Position

Predictive calibration technique for magnetic field position sensors

5th IEEE International Workshop on Advances in Sensors and Interfaces IWASI ◽

10.1109/iwasi.2013.6576091 ◽

2013 ◽

Cited By ~ 2

Author(s):

Jose Luis Merino ◽

Catherine Dehollain

Keyword(s):

Magnetic Field ◽

Calibration Technique ◽

Magnetic Field Position ◽

Field Position

System for quantitative three-dimensional echocardiography of the left ventricle based on a magnetic-field position and orientation sensing system

IEEE Transactions on Biomedical Engineering ◽

10.1109/10.664205 ◽

1998 ◽

Vol 45 (4) ◽

pp. 494-504 ◽

Cited By ~ 86

Author(s):

M.E. Legget ◽

D.F. Leotta ◽

E.L. Bolson ◽

J.A. McDonald ◽

R.W. Martin ◽

...

Keyword(s):

Magnetic Field ◽

Left Ventricle ◽

Three Dimensional ◽

Sensing System ◽

Position And Orientation ◽

Dimensional Echocardiography ◽

Three Dimensional Echocardiography ◽

Magnetic Field Position ◽

Field Position

Imaging of ferroelectric domain walls by electron holography

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100121636 ◽

1992 ◽

Vol 50 (1) ◽

pp. 246-247

Author(s):

Xiao Zhang

Keyword(s):

Magnetic Field ◽

High Resolution ◽

Domain Walls ◽

Ferroelectric Domain ◽

Object Wave ◽

Electron Holography ◽

High Resolution Imaging ◽

Quantitative Measurements ◽

Resolution Imaging ◽

Electron Microscopes

Electron holography has recently been available to modern electron microscopy labs with the development of field emission electron microscopes. The unique advantage of recording both amplitude and phase of the object wave makes electron holography a effective tool to study electron optical phase objects. The visibility of the phase shifts of the object wave makes it possible to directly image the distributions of an electric or a magnetic field at high resolution. This work presents preliminary results of first high resolution imaging of ferroelectric domain walls by electron holography in BaTiO3 and quantitative measurements of electrostatic field distribution across domain walls.

A Super-High-Resolution HVEM (H-1500) Newly Installed in NIRIM

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100179464 ◽

1990 ◽

Vol 48 (1) ◽

pp. 142-143

Author(s):

S. Horiuchi ◽

Y. Matsui

Keyword(s):

Magnetic Field ◽

High Resolution ◽

Chromatic Aberration ◽

Inorganic Materials ◽

Electron Gun ◽

Resolving Power ◽

National Budget ◽

Voltage Electron ◽

Specimen Holder ◽

The Magnetic Field

A new high-voltage electron microscope (H-1500) specially aiming at super-high-resolution (1.0 Å point-to-point resolution) is now installed in National Institute for Research in Inorganic Materials ( NIRIM ), in collaboration with Hitachi Ltd. The national budget of about 1 billion yen including that for a new building has been spent for the construction in the last two years (1988-1989). Here we introduce some essential characteristics of the microscope.(1) According to the analysis on the magnetic field in an electron lens, based on the finite-element-method, the spherical as well as chromatic aberration coefficients ( Cs and Cc ). which enables us to reach the resolving power of 1.0Å. have been estimated as a function of the accelerating As a result of the calculaton. it was noted that more than 1250 kV is needed even when we apply the highest level of the technology and materials available at present. On the other hand, we must consider the protection against the leakage of X-ray. We have then decided to set the conventional accelerating voltage at 1300 kV. However. the maximum accessible voltage is 1500 kV, which is practically important to realize higher voltage stabillity. At 1300 kV it is expected that Cs= 1.7 mm and Cc=3.4 mm with the attachment of the specimen holder, which tilts bi-axially in an angle of 35° ( Fig.1 ). In order to minimize the value of Cc a small tank is additionally placed inside the generator tank, which must serve to seal the magnetic field around the acceleration tube. An electron gun with LaB6 tip is used.

Development of High-resolution Two-dimensional Magnetic Field Measurement System by Use of Printed-circuit Technology

IEEJ Transactions on Fundamentals and Materials ◽

10.1541/ieejfms.138.480 ◽

2018 ◽

Vol 138 (9) ◽

pp. 480-481

Author(s):

Moe Akimitsu ◽

Yasushi Ono ◽

Qinghong Cao ◽

Ryota Masuki ◽

Hiroshi Tanabe

Keyword(s):

Magnetic Field ◽

High Resolution ◽

Measurement System ◽

Field Measurement ◽

Magnetic Field Measurement ◽

Two Dimensional ◽

Printed Circuit ◽

Circuit Technology

High Resolution Current Imaging by Direct Magnetic Field Sensing

ISTFA 2003: Conference Proceedings from the 29th International Symposium for Testing and Failure Analysis ◽

10.31399/asm.cp.istfa2003p0006 ◽

2003 ◽

Author(s):

S.I. Woods ◽

Nesco M. Lettsome ◽

A.B. Cawthorne ◽

L.A. Knauss ◽

R.H. Koch

Keyword(s):

Magnetic Field ◽

High Resolution ◽

Spatial Resolution ◽

Great Promise ◽

Magnetoresistive Sensor ◽

Magnetic Sensitivity ◽

Current Lines ◽

Scanning Squid ◽

Scanning Fiber ◽

Ferromagnetic Probe

Abstract Two types of magnetic microscopes have been investigated for use in high resolution current mapping. The scanning fiber/SQUID microscope uses a SQUID sensor coupled to a nanoscale ferromagnetic probe, and the GMR microscope employs a nanoscale giant magnetoresistive sensor. Initial scans demonstrate that these microscopes can resolve current lines less than 10 µm apart with edge resolution of 1 µm. These types of microscopes are compared with the performance of a standard scanning SQUID microscope and with each other with respect to spatial resolution and magnetic sensitivity. Both microscopes show great promise for identifying current defects in die level devices.