Phase analysis of currents and voltages in the On-Line Electric Bus (OLEB) system

Author(s):  
Yangsu Kim ◽  
Seungyong Shin ◽  
Guho Jung ◽  
Chunghee Lee ◽  
Seokhwan Lee ◽  
...  
Keyword(s):  
2014 ◽  
Vol 136 (04) ◽  
pp. 44-49 ◽  
Author(s):  
Jack Thornton

This article presents an overview of charging technology called Shaped Magnetic Field in Resonance (SMFIR). It has been developed by a team of engineers and technologists at the Korea Advanced Institute for Science and Technology. An all-electric bus developed in Korea recharges its battery when it travels over electric coils buried at intervals along its route. The concept is called on-line electric vehicles, and the heart of OLEV technology is the transfer of enough electricity across gaps of up to 10 inches to power a fully loaded bus. Specifically, underground cables transfer power from the electrical grid to drive motors and on-board batteries via pickups beneath the OLEV bus bodies. The OLEV system wirelessly charges a bus, stopped or in motion, for continuous operation. SMFIR transfers rely on electromagnetic field resonance rather than inductive coupling. In SMFIR technology, the sending unit and the vehicle receiver resonate at 20,000 hertz.


2004 ◽  
Vol 19 (2) ◽  
pp. 145-148 ◽  
Author(s):  
Svend Erik Rasmussen ◽  
Sidsel Grundvig ◽  
Walter L. Friedrich

Ten fragments of bronze age frescoes from the Greek group of volcanic islands known as Santorini have been examined by powder X-ray diffraction. A qualitative phase analysis based on line positions only was supplemented by the Rietveld method which uses complete diffraction profiles to increase the credibility of the phase analysis.


2014 ◽  
Vol 29 (S1) ◽  
pp. S102-S106 ◽  
Author(s):  
Joel N. O'Dwyer ◽  
James R. Tickner ◽  
Greg J. Roach

Rapid, on-line measurement of feedstock mineralogy is a highly attractive technology for the mineral processing industry. A Monte Carlo particle transport-based modelling technique has been developed to help design and predict the measurement performance of on-line energy-dispersive X-ray diffraction (EDXRD) analysers. The accuracy of the technique was evaluated by performing quantitative phase analysis on a suite of fifteen synthetic potash ore samples. The diffraction profile of each sample was measured with a laboratory EDXRD analyser and an equivalent profile was simulated in the Monte Carlo package. Linear regression analysis was used to determine the mineral abundances in each sample from both the measured and modelled profiles. Comparison of the results showed that the diffraction profiles and measurement accuracies obtained by simulation agree very well with the measured data.


Author(s):  
Christopher Sauer ◽  
Anders Lorén ◽  
Andreas Schaefer ◽  
Per-Anders Carlsson

The valorisation of 2,5-dimethylfuran (2,5-dmf) by catalytic fast pyrolysis (CFP) has been studied by online FTIR-MS gas phase analysis. Zeolite beta, H-ZSM-5 and Cu-ZSM-5 were characterised and used as catalysts....


Author(s):  
Guho Jung ◽  
Boyune Song ◽  
Seungyong Shin ◽  
Seokhwan Lee ◽  
Jaegue Shin ◽  
...  

Author(s):  
William Krakow

In the past few years on-line digital television frame store devices coupled to computers have been employed to attempt to measure the microscope parameters of defocus and astigmatism. The ultimate goal of such tasks is to fully adjust the operating parameters of the microscope and obtain an optimum image for viewing in terms of its information content. The initial approach to this problem, for high resolution TEM imaging, was to obtain the power spectrum from the Fourier transform of an image, find the contrast transfer function oscillation maxima, and subsequently correct the image. This technique requires a fast computer, a direct memory access device and even an array processor to accomplish these tasks on limited size arrays in a few seconds per image. It is not clear that the power spectrum could be used for more than defocus correction since the correction of astigmatism is a formidable problem of pattern recognition.


Author(s):  
A.M.H. Schepman ◽  
J.A.P. van der Voort ◽  
J.E. Mellema

A Scanning Transmission Electron Microscope (STEM) was coupled to a small computer. The system (see Fig. 1) has been built using a Philips EM400, equipped with a scanning attachment and a DEC PDP11/34 computer with 34K memory. The gun (Fig. 2) consists of a continuously renewed tip of radius 0.2 to 0.4 μm of a tungsten wire heated just below its melting point by a focussed laser beam (1). On-line operation procedures were developped aiming at the reduction of the amount of radiation of the specimen area of interest, while selecting the various imaging parameters and upon registration of the information content. Whereas the theoretical limiting spot size is 0.75 nm (2), routine resolution checks showed minimum distances in the order 1.2 to 1.5 nm between corresponding intensity maxima in successive scans. This value is sufficient for structural studies of regular biological material to test the performance of STEM over high resolution CTEM.


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