Simulation driven design of novel integrated circuits - Part 1: Selection of the materials based on the Virtual DoE

Author(s):  
A. Sasi ◽  
A. Yadur ◽  
P. Gromala
Author(s):  
Arkadiusz Januszewski

The selection of the right cost calculation method is of critical importance when it comes to determining the real product profitability (as well as clients and other calculation objects). Traditional cost calculation methods often provide false information. The literature offers many examples of big companies that have given up traditional methods and applied a new method: activity-based costing (ABC). They discovered that many products that are manufactured generate losses and not profits. Managers, based on incorrect calculations, mistakenly believed in the profitability of each product. Turney (1991) reports on an example of an American manufacturer of over 4,000 different integrated circuits. The cost calculation with the allocation of direct production costs as machinery-hour markup demonstrated a profit margin of over 26% for each product. Implementing ABC showed that the production of more than half of the products was not profitable, and having factored in additional sales and management costs (which accounted for about 40% of the total costs), it was as much as over 75%.


1990 ◽  
Vol 199 ◽  
Author(s):  
R. J. Young ◽  
E. C. G. Kirk ◽  
D. A. Williams ◽  
H. Ahmed

ABSTRACTA new technique using a focused ion beam has been developed for the fabrication of transmission electron microscopy specimens in pre-selected regions. The method has been proven in the fabrication of both cross-sectional and planar specimens, with no induced artefacts. The lateral accuracy achievable in the selection of an area for cross-sectional analysis is better than one micrometre. The technique has been applied to a number of silicon and III-V based integrated circuits, and is expected to be suitable for many other materials and structures.


2014 ◽  
Vol 12 (6) ◽  
pp. 1005-1011
Author(s):  
Georgina Flores Becerra ◽  
Said Polanco Martagon ◽  
Miguel Aurelio Duarte Villasenor ◽  
Esteban Tlelo Cuautle ◽  
Luis Gerardo de la Fraga ◽  
...  

1985 ◽  
Vol 47 ◽  
Author(s):  
Robert Beyers

ABSTRACTThe drive to produce smaller devices in integrated circuits is wellknown. Concurrent with this drive is the need to incorporate new materials, such as silicides, as interconnects, diffusion barriers, and contacts. During circuit fabrication, these materials are in contact with other solids and gases at elevated temperatures. Consequently, reactions may occur which degrade the materials present. Since the reactions of interest typically involve three elements distributed in several phases, ternary phase diagrams are required to predict the occurrence of a reaction and the subsequent reaction products, or, conversely, the stability of the phases present. Hence, ternary diagrams can provide important guidance in the selection of optimal materials and the design of reliable processing schedules.


2004 ◽  
Vol 1 (2) ◽  
pp. 1-4
Author(s):  
Ricardo Reis ◽  
Fernando Moraes ◽  
Pascal Fouillat

The Editorial Board has the satisfaction to launch the second edition of the Journal of Integrated Circuits and Systems - JICS. This journal will present state-of-art papers on Integrated Circuits and Systems areas. It is an effort of both Brazilian Microelectronics Society - SBMicro and Brazilian Computer Society - SBC to create a new scientific journal covering the following microelectronic domains: Process and Materials, Device and Characterization, Design, Test and CAD of Integrated Circuits and Systems. This second edition includes a selection of papers from SBMicro symposium. We would like to thanks João Antonio Martino that worked as editor of the papers originated from SBMicro and included in this edition. We ask the researches all around the world to submit good papers to consolidate the journal as an international publication composed by a set of attractive and outstanding papers.The editors


Author(s):  
M. A. Artyukhova ◽  

Evaluation of reliability indicators is necessary procedure in the design of a technical system. The article consider two failure rate models for integrated circuits and a number of conclusions, derived from model comparison with operating experience.


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