Characterization and Lambert – W Function based modeling of FDSOI five-gate qubit MOS devices down to cryogenic temperatures

Author(s):  
E. Catapano ◽  
A. Apra ◽  
M. Casse ◽  
F. Gaillard ◽  
S. de Franceschi ◽  
...  

2021 ◽  
pp. 108175
Author(s):  
F. Serra di Santa Maria ◽  
L. Contamin ◽  
B. Cardoso Paz ◽  
M. Cassé ◽  
C. Theodorou ◽  
...  


Author(s):  
F. Serra Di Santa Maria ◽  
L. Contamin ◽  
M. Casse ◽  
C. Theodorou ◽  
F. Balestra ◽  
...  


Author(s):  
K. A. Fisher ◽  
M. G. L. Gustafsson ◽  
M. B. Shattuck ◽  
J. Clarke

The atomic force microscope (AFM) is capable of imaging electrically conductive and non-conductive surfaces at atomic resolution. When used to image biological samples, however, lateral resolution is often limited to nanometer levels, due primarily to AFM tip/sample interactions. Several approaches to immobilize and stabilize soft or flexible molecules for AFM have been examined, notably, tethering coating, and freezing. Although each approach has its advantages and disadvantages, rapid freezing techniques have the special advantage of avoiding chemical perturbation, and minimizing physical disruption of the sample. Scanning with an AFM at cryogenic temperatures has the potential to image frozen biomolecules at high resolution. We have constructed a force microscope capable of operating immersed in liquid n-pentane and have tested its performance at room temperature with carbon and metal-coated samples, and at 143° K with uncoated ferritin and purple membrane (PM).



Alloy Digest ◽  
2012 ◽  
Vol 61 (2) ◽  

Abstract SSC Invar 36 was developed for use in applications where dimensional stability is essential. It is a nickel-iron alloy with a very low coefficient of thermal expansion from cryogenic temperatures to 200 deg C (390 deg F). It is utilized in aerospace composite tooling and die applications, as well as laser components, and cryogenic components and piping: liquefied natural gas production, storage, and transportation. This datasheet provides information on composition, physical properties, and tensile properties. It also includes information on corrosion resistance as well as forming. Filing Code: Fe-158. Producer or source: Sandmeyer Steel Company. Originally published December 2011, revised February 2012.



Alloy Digest ◽  
1966 ◽  
Vol 15 (7) ◽  

Abstract INCONEL alloy X-750 is an age-hardenable, nickel-chromium alloy used for its corrosion and oxidation resistance and high creep rupture strength at temperature up to 1500 F. It also has excellent properties at cryogenic temperatures. It was originally developed for use in gas turbines, but because of its low cost, high strength and weldability it has become the standards choice for a wide variety of applications. This datasheet provides information on composition, physical properties, elasticity, and tensile properties as well as creep and fatigue. It also includes information on forming, heat treating, machining, joining, and surface treatment. Filing Code: Ni-115. Producer or source: Huntington Alloy Products Division, An INCO Company.



Alloy Digest ◽  
1975 ◽  
Vol 24 (2) ◽  

Abstract USS 18-8S (AISI Type 304) and USS 18-8I (AISI Type 304L) are austenitic chromium-nickel steels that are easy to fabricate and weld. They combine high strength with excellent stability and shock resistance, even at cryogenic temperatures. This datasheet provides information on composition, physical properties, hardness, elasticity, and tensile properties as well as fracture toughness, creep, and fatigue. It also includes information on low temperature performance and corrosion resistance as well as forming, heat treating, and joining. Filing Code: SS-305. Producer or source: United States Steel Corporation.



Author(s):  
LiLung Lai ◽  
Nan Li ◽  
Qi Zhang ◽  
Tim Bao ◽  
Robert Newton

Abstract Owing to the advancing progress of electrical measurements using SEM (Scanning Electron Microscope) or AFM (Atomic Force Microscope) based nanoprober systems on nanoscale devices in the modern semiconductor laboratory, we already have the capability to apply DC sweep for quasi-static I-V (Current-Voltage), high speed pulsing waveform for the dynamic I-V, and AC imposed for C-V (Capacitance-Voltage) analysis to the MOS devices. The available frequency is up to 100MHz at the current techniques. The specification of pulsed falling/rising time is around 10-1ns and the measurable capacitance can be available down to 50aF, for the nano-dimension down to 14nm. The mechanisms of dynamic applications are somewhat deeper than quasi-static current-voltage analysis. Regarding the operation, it is complicated for pulsing function but much easy for C-V. The effective FA (Failure Analysis) applications include the detection of resistive gate and analysis for abnormal channel doping issue.





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