VUV/O3 assisted single crystal quartz bonding with amorphous SiO2 intermedicate layer for manufacturing optical low pass filter

Author(s):  
Bo Ma ◽  
Hiroyuki Kuwae ◽  
Akiko Okada ◽  
Weixin Fu ◽  
Shuichi Shoji ◽  
...  
2017 ◽  
Vol E100.C (10) ◽  
pp. 858-865 ◽  
Author(s):  
Yohei MORISHITA ◽  
Koichi MIZUNO ◽  
Junji SATO ◽  
Koji TAKINAMI ◽  
Kazuaki TAKAHASHI

2016 ◽  
Vol 15 (12) ◽  
pp. 2579-2586
Author(s):  
Adina Racasan ◽  
Calin Munteanu ◽  
Vasile Topa ◽  
Claudia Pacurar ◽  
Claudia Hebedean

Author(s):  
Nanan Chomnak ◽  
Siradanai Srisamranrungrueang ◽  
Natapong Wongprommoon
Keyword(s):  

2021 ◽  
Vol 11 (15) ◽  
pp. 6733
Author(s):  
Mira Naftaly ◽  
Andrew Gregory

Z-cut single-crystal quartz and vitreous silica (silica glass or fused silica) were evaluated for use as reference materials for terahertz and microwave measurements of complex permittivity, with Z-cut quartz confirmed as being suitable. Measurements of refractive indices and absorption coefficients for o-ray and e-ray in quartz and for vitreous silica are reported at frequencies between 0.2 and 6 THz and at 36 and 144 GHz, and compared with data reported in the literature. A previously unreported broad band was seen in the extraordinary absorption of quartz. The Boson peak in silica glass absorption was examined, and for the first time, two negative relationships have been observed: between the refractive index and the Boson peak frequency, and between the Boson peak height and its frequency.


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