A New Method to Extract Mobility Degradation and Parasitic Series Resistance of Nano-scaled MOSFETs

2021 ◽  
Author(s):  
Zixuan Yang ◽  
Qian Xie ◽  
Qiao He ◽  
Meng Zhao ◽  
Zheng Wang
Keyword(s):  
Series Resistance ◽  
New Method ◽  
Mobility Degradation

All-Contactless Measurement of Series Resistance Distributions on Solar Cells with Photoluminescence Imaging

2011 ◽  
Author(s):  
M. Kasemann ◽  
L.M. Reindl ◽  
B. Michl ◽  
W. Warta ◽  
A. Schütt ◽  
...  
Keyword(s):  
Solar Cells ◽  
Solar Cell ◽  
Current Flow ◽  
Series Resistance ◽  
Electrical Contacts ◽  
New Method ◽  
Contactless Measurement ◽  
Sample Handling ◽  
Imaging Methods ◽  
Lateral Current

Abstract Conventional series resistance imaging methods require electrical contacts for current injection or extraction in order to generate lateral current flow in the solar cell. This paper presents a new method to generate lateral current flow in the solar cell without any electrical contacts. This reduces the sample handling complexity for inline application and allows for measurements on unfinished solar cell precursors.

New Method to Determine the a-Si:H Pin Diode Series Resistance by Noise Measurements

1998 ◽  
Vol 507 ◽  
Author(s):  
F. Blecher ◽  
K. Seibel ◽  
M. Hillebrand ◽  
M. Böhm
Keyword(s):  
Series Resistance ◽  
Partial Information ◽  
Low Noise ◽  
Operating Conditions ◽  
New Method ◽  
Measuring System ◽  
Pin Diode ◽  
Noise Current ◽  
Current Voltage ◽  
Noise Measurements

ABSTRACTThe series resistance limits the linearity of photodiodes and decreases the efficiency of solar cells. It is usually determined from IV-measurements for moderate and high forward current density. This method, however, provides only partial information about Rs, since the series resistance depends on the operating point. An alternative method is based on noise measurements. System noise of the measuring system with a low-noise current-voltage converter has been investigated. A new method for extraction of photodiode series resistance from noise measurements is suggested. Noise measurements are carried out for a-Si:H pin diodes. The series resistance of an amorphous pin diode has been extracted for different operating conditions using the new measurement method.

A method to extract mobility degradation and total series resistance of fully-depleted SOI MOSFETs

2002 ◽  
Vol 49 (1) ◽  
pp. 82-88 ◽  
Author(s):  
F.J.G. Sanchez ◽  
A. Ortiz-Conde ◽  
A. Cerdeira ◽  
M. Estrada ◽  
D. Flandre ◽  
...  
Keyword(s):  
Series Resistance ◽  
Fully Depleted ◽  
Mobility Degradation

A New Method for Series Resistance Extraction of Nanometer MOSFETs

2017 ◽  
Vol 64 (7) ◽  
pp. 2797-2803 ◽  
Author(s):  
Renan Trevisoli ◽  
Rodrigo Trevisoli Doria ◽  
Michelly de Souza ◽  
Sylvain Barraud ◽  
Maud Vinet ◽  
...  
Keyword(s):  
Series Resistance ◽  
New Method

New method for extracting collector series resistance of bipolar transistors

1993 ◽  
Vol 29 (10) ◽  
pp. 931-933 ◽  
Author(s):  
G. Verzellesi ◽  
R. Turetta ◽  
M. Cappellin ◽  
P. Pavan ◽  
E. Zanoni ◽  
...  
Keyword(s):  
Series Resistance ◽  
Bipolar Transistors ◽  
New Method

A new method for the measurement of series resistance of solar cells

1981 ◽  
Vol 14 (9) ◽  
pp. 1643-1646 ◽  
Author(s):  
S K Agarwal ◽  
R Muralidharan ◽  
A Agarwala ◽  
V K Tewary ◽  
S C Jain
Keyword(s):  
Solar Cells ◽  
Series Resistance ◽  
New Method

scholarly journals Amendment of the measurement of the equivalent series resistance at high frequencies

2020 ◽  
Vol 5 (2) ◽  
Author(s):  
Huimin Liu ◽  
Baoquan Ai ◽  
Fengguo Li
Keyword(s):  
Linear Relation ◽  
Large Deviation ◽  
Series Resistance ◽  
New Method ◽  
Equivalent Series Resistance ◽  
Low Frequencies ◽  
High Frequencies

A new method is proposed in (Ivković, Marković, Ivković, & Cvetanović, 2017) to measure the equivalent series resistance (ESR) and the inductance of a coil at low frequencies. However, a special phenomenon has appeared at high frequencies. It is found that the intercept has appeared and the measured inductance value had a large deviation from its nominal value. According to the analysis of result, an amended method is proposed in this paper. The inductance value should be amended according to the linear relation between the measured value and the nominal value.

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