Measuring the impact of voltage scaling for soft errors in SRAM-based FPGAs from a designer perspective

Author(s):  
Jorge Tonfat ◽  
Jose Rodrigo Azambuja ◽  
Gabriel Nazar ◽  
Paolo Rech ◽  
Fernanda Lima Kastensmidt ◽  
...  
Author(s):  
Qiang Guan ◽  
Nathan DeBardeleben ◽  
Sean Blanchard ◽  
Song Fu ◽  
Claude H. Davis IV ◽  
...  

As the high performance computing (HPC) community continues to push towards exascale computing, HPC applications of today are only affected by soft errors to a small degree but we expect that this will become a more serious issue as HPC systems grow. We propose F-SEFI, a Fine-grained Soft Error Fault Injector, as a tool for profiling software robustness against soft errors. We utilize soft error injection to mimic the impact of errors on logic circuit behavior. Leveraging the open source virtual machine hypervisor QEMU, F-SEFI enables users to modify emulated machine instructions to introduce soft errors. F-SEFI can control what application, which sub-function, when and how to inject soft errors with different granularities, without interference to other applications that share the same environment. We demonstrate use cases of F-SEFI on several benchmark applications with different characteristics to show how data corruption can propagate to incorrect results. The findings from the fault injection campaign can be used for designing robust software and power-efficient hardware.


2004 ◽  
Vol 14 (02) ◽  
pp. 299-309 ◽  
Author(s):  
R. C. BAUMANN

The once-ephemeral soft error has recently caused considerable concern for manufacturers of advanced silicon technology as this phenomenon now has the potential for inducing the highest failure rate of all other reliability mechanisms combined. We briefly review the three radiation mechanisms responsible for causing soft errors in commercial electronics and the basic physical mechanism by which ionizing radiation can produce a soft error. We then focus on the soft error sensitivity trends in commercial DRAM, SRAM, and peripheral logic devices as a function of technology scaling and discuss some of the solutions used for mitigating the impact of soft errors in high reliability systems.


Author(s):  
Burcu Ozcelik Mutlu ◽  
Gokcen Kestor ◽  
Joseph Manzano ◽  
Osman Unsal ◽  
Samrat Chatterjee ◽  
...  

Author(s):  
Gennaro Rodrigues ◽  
FELIPE ROSA ◽  
Adria de Oliveira ◽  
Fernanda Lima Kastensmidt ◽  
Luciano Ost ◽  
...  

Electronics ◽  
2021 ◽  
Vol 11 (1) ◽  
pp. 122
Author(s):  
Jiemin Li ◽  
Shancong Zhang ◽  
Chong Bao

With the development of large-scale CMOS-integrated circuit manufacturing technology, microprocessor chips are more vulnerable to soft errors and radiation interference, resulting in reduced reliability. Core reliability is an important element of the microprocessor’s ability to resist soft errors. This paper proposes DuckCore, a fault-tolerant processor core architecture based on the free and open instruction set architecture (ISA) RISC-V. This architecture uses improved SECDED (single error correction, double error detection) code between pipelines, detects processor operating errors in real-time through the Supervision unit, and takes instruction rollbacks for different error types, which not only saves resources but also improves the reliability of the processor core. In the implementation process, all error injection tests are passed to verify the completeness of the function. In order to better verify the performance of the processor under different error intensity injections, the software is used to inject errors, the running program is run on the FPGA (Field Programmable Gate Array), and the impact of the actual radiation environment on the architecture is evaluated through the results. The architecture is applied to three–five-stage open-source processor cores and the results show that this method consumes fewer resources and its discrete design makes it more portable.


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