Single event transient pulse width measurements in a 65-nm bulk CMOS technology at elevated temperatures
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2011 ◽
Vol 11
(1)
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pp. 179-186
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2010 ◽
Vol 10
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pp. 157-163
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2014 ◽
Vol 30
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pp. 149-154
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2011 ◽
Vol 54
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pp. 3064-3069
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2013 ◽
Vol 60
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pp. 4421-4429
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2017 ◽
Vol 38
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pp. 085009
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2021 ◽
Vol 2137
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pp. 012031
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