An area efficient asynchronous gated ring oscillator TDC with minimum GRO stages

Author(s):  
Kyu-Dong Hwang ◽  
Lee-Sup Kim
2015 ◽  
Vol 25 (01) ◽  
pp. 1640002 ◽  
Author(s):  
Stefan Gehrer ◽  
Georg Sigl

Physically unclonable functions (PUFs) are an innovative way to generate device unique keys using uncontrollable production tolerances. In this work, we present a method to use PUFs on modern FPGA-based system-on-chips (SoCs). The processor system part of the SoC is used to configure the FPGA part. We propose a reconfigurable PUF design that can be changed by using the partial reconfiguration (PR) feature of modern FPGAs. Multiple ring oscillator PUF (RO PUF) designs are loaded on the same logic blocks of the FPGA in order to make use of different resources, i.e., sources of entropy, on the FPGA. Their frequencies are read out individually and the differences between neighbored oscillators are used to generate a bit response. The responses of each design can be concatenated to a larger response vector that can be used to generate a cryptographic key. We present an implementation that is able to decrease the needed resources by 87.5% on a Xilinx Zynq.


Author(s):  
Mike Bruce ◽  
Rama R. Goruganthu ◽  
Shawn McBride ◽  
David Bethke ◽  
J.M. Chin

Abstract For time resolved hot carrier emission from the backside, an alternate approach is demonstrated termed single point PICA. The single point approach records time resolved emission from an individual transistor using time-correlated-single-photon counting and an avalanche photo-diode. The avalanche photo-diode has a much higher quantum efficiency than micro-channel plate photo-multiplier tube based imaging cameras typically used in earlier approaches. The basic system is described and demonstrated from the backside on a ring oscillator circuit.


2018 ◽  
Author(s):  
Satish Kodali ◽  
Liangshan Chen ◽  
Yuting Wei ◽  
Tanya Schaeffer ◽  
Chong Khiam Oh

Abstract Optical beam induced resistance change (OBIRCH) is a very well-adapted technique for static fault isolation in the semiconductor industry. Novel low current OBIRCH amplifier is used to facilitate safe test condition requirements for advanced nodes. This paper shows the differences between the earlier and novel generation OBIRCH amplifiers. Ring oscillator high standby leakage samples are analyzed using the novel generation amplifier. High signal to noise ratio at applied low bias and current levels on device under test are shown on various samples. Further, a metric to demonstrate the SNR to device performance is also discussed. OBIRCH analysis is performed on all the three samples for nanoprobing of, and physical characterization on, the leakage. The resulting spots were calibrated and classified. It is noted that the calibration metric can be successfully used for the first time to estimate the relative threshold voltage of individual transistors in advanced process nodes.


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