Automated detection of dermatological disorders through image-processing and machine learning

Author(s):  
Yasha Hasija ◽  
Nikhil Garg ◽  
Soumya Sourav
2018 ◽  
Vol 7 (3.34) ◽  
pp. 61
Author(s):  
R Srividhya ◽  
K Shanmugapriya ◽  
K Sindhu Priya

In the field of industry, corrosion and defects are amongst the most frequent operations. Industrial Materials have periodic defects that are difficult to detect during production even by experienced human inspectors. Defects are difficult to detect during production even by experienced human inspectors. Usually, the colour transfer process contains an image segmentation phase and an image construction phase. Therefore, we introduce an image processing method for automatically detecting the defects in surfaces. We show how barely visible defect can be optically enhanced to improve annual assessment as well as how descriptor-based image processing and machine learning can be used to allow automated detection. Image enhancement is performed by applying manual calculation. We implement this simulation using MATLAB R2013a. Results show that the proposed allows training both tested classifiers with good classification rates around 98.9%.  


Bone ◽  
2011 ◽  
Vol 48 ◽  
pp. S125-S126
Author(s):  
A. Heindl ◽  
M. Schepelmann ◽  
R. Stumberger ◽  
A. Nussbaumer ◽  
P. Pietschmann ◽  
...  

Author(s):  
Matthew N. O. Sadiku ◽  
Chandra M. M Kotteti ◽  
Sarhan M. Musa

Machine learning is an emerging field of artificial intelligence which can be applied to the agriculture sector. It refers to the automated detection of meaningful patterns in a given data.  Modern agriculture seeks ways to conserve water, use nutrients and energy more efficiently, and adapt to climate change.  Machine learning in agriculture allows for more accurate disease diagnosis and crop disease prediction. This paper briefly introduces what machine learning can do in the agriculture sector.


2018 ◽  
Vol 1 (1) ◽  
pp. 236-247
Author(s):  
Divya Srivastava ◽  
Rajitha B. ◽  
Suneeta Agarwal

Diseases in leaves can cause the significant reduction in both quality and quantity of agricultural production. If early and accurate detection of disease/diseases in leaves can be automated, then the proper remedy can be taken timely. A simple and computationally efficient approach is presented in this paper for disease/diseases detection on leaves. Only detecting the disease is not beneficial without knowing the stage of disease thus the paper also determine the stage of disease/diseases by quantizing the affected of the leaves by using digital image processing and machine learning. Though there exists a variety of diseases on leaves, but the bacterial and fungal spots (Early Scorch, Late Scorch, and Leaf Spot) are the most prominent diseases found on leaves. Keeping this in mind the paper deals with the detection of Bacterial Blight and Fungal Spot both at an early stage (Early Scorch) and late stage (Late Scorch) on the variety of leaves. The proposed approach is divided into two phases, in the first phase, it identifies one or more disease/diseases existing on leaves. In the second phase, amount of area affected by the disease/diseases is calculated. The experimental results obtained showed 97% accuracy using the proposed approach.


Author(s):  
Navid Asadizanjani ◽  
Sachin Gattigowda ◽  
Mark Tehranipoor ◽  
Domenic Forte ◽  
Nathan Dunn

Abstract Counterfeiting is an increasing concern for businesses and governments as greater numbers of counterfeit integrated circuits (IC) infiltrate the global market. There is an ongoing effort in experimental and national labs inside the United States to detect and prevent such counterfeits in the most efficient time period. However, there is still a missing piece to automatically detect and properly keep record of detected counterfeit ICs. Here, we introduce a web application database that allows users to share previous examples of counterfeits through an online database and to obtain statistics regarding the prevalence of known defects. We also investigate automated techniques based on image processing and machine learning to detect different physical defects and to determine whether or not an IC is counterfeit.


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