Two-Dimensional Actuation of Liquid-Metal Droplets for Hot-Spot Cooling

Author(s):  
Saige J. Dacuycuy ◽  
Wayne A. Shiroma ◽  
Aaron T. Ohta
2021 ◽  
Vol 911 ◽  
Author(s):  
Y. Tasaka ◽  
T. Yanagisawa ◽  
K. Fujita ◽  
T. Miyagoshi ◽  
A. Sakuraba

Abstract


2013 ◽  
Vol 455 ◽  
pp. 466-469
Author(s):  
Yun Chuan Wu ◽  
Shang Long Xu ◽  
Chao Wang

With the increase of performance demands, the nonuniformity of on-chip power dissipation becomes greater, causing localized high heat flux hot spots that can degrade the processor performance and reliability. In this paper, a three-dimensional model of the copper microchannel heat sink, with hot spot heating and background heating on the back, was developed and used for numerical simulation to predict the hot spot cooling performance. The hot spot is cooled by localized cross channels. The pressure drop, thermal resistance and effects of hot spot heat flux and fluid flow velocity on the cooling of on-chip hot spots, are investigated in detail.


2020 ◽  
Vol 10 (1) ◽  
Author(s):  
Tammy Chang ◽  
Saptarshi Mukherjee ◽  
Nicholas N. Watkins ◽  
David M. Stobbe ◽  
Owen Mays ◽  
...  

AbstractThis article presents a millimeter-wave diagnostic for the in-situ monitoring of liquid metal jetting additive manufacturing systems. The diagnostic leverages a T-junction waveguide device to monitor impedance changes due to jetted metal droplets in real time. An analytical formulation for the time-domain T-junction operation is presented and supported with a quasi-static full-wave electromagnetic simulation model. The approach is evaluated experimentally with metallic spheres of known diameters ranging from 0.79 to 3.18 mm. It is then demonstrated in a custom drop-on-demand liquid metal jetting system where effective droplet diameters ranging from 0.8 to 1.6 mm are detected. Experimental results demonstrate that this approach can provide information about droplet size, timing, and motion by monitoring a single parameter, the reflection coefficient amplitude at the input port. These results show the promise of the impedance diagnostic as a reliable in-situ characterization method for metal droplets in an advanced manufacturing system.


Author(s):  
Chung Nguyen ◽  
Nitu Syed ◽  
Mei Xian Low ◽  
Ali Zavabeti ◽  
Azmira Jannat ◽  
...  

Metal oxychalcogenides are emerging as a new motif of group VI-A semiconductors with unique electronic properties. Among this family, two dimensional (2D) oxysulfide materials have been increasingly involved in the...


2018 ◽  
Vol 8 (1) ◽  
Author(s):  
M. S. Krivokorytov ◽  
Q. Zeng ◽  
B. V. Lakatosh ◽  
A. Yu. Vinokhodov ◽  
Yu. V. Sidelnikov ◽  
...  
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