Memory Switching and Threshold Switching in a 3D Nanoscaled NbOX System

2019 ◽  
Vol 40 (5) ◽  
pp. 718-721 ◽  
Author(s):  
Qing Luo ◽  
Xumeng Zhang ◽  
Jie Yu ◽  
Wei Wang ◽  
Tiancheng Gong ◽  
...  
2020 ◽  
Author(s):  
zhiguo jiang ◽  
Dongliang Wang ◽  
Yan Li ◽  
Yong Zhang ◽  
Xinman Chen

Abstract In this work, the dependence of negative differential resistance (NDR) on compliance current (Icc) was investigated based on Ag/HfOx/Pt resistive memory device. Tunable conversion from bidirectional threshold switching (TS) to memory switching (MS) were achieved through enhancing Icc. NDR can be observed in TS as Icc is below 800μA but vanishes in MS. The switching voltages and readout windows of TS evolve with Icc. Furthermore, the dynamic conductance (dI/dV) as a function of time in NDR can be well illustrated by capacitor-like relaxation equation, and the relaxation time constant is significantly dependent on Icc. These phenomena were elucidated from viewpoint of nanofilament evolution controlled by Icc as well as nanocapacitor effects originated from nanofilament gap. The Icc-dependent NDR as well as conversion between TS and MS on Ag/HfOx/Pt resistive memory device indicates its potential application as a multifunctional electronic device.


2019 ◽  
Vol 7 (39) ◽  
pp. 12160-12169 ◽  
Author(s):  
Huiying Du ◽  
Jinghong Chen ◽  
Meilin Tu ◽  
Songwen Luo ◽  
Shangdong Li ◽  
...  

The transition from bipolar memory switching to bidirectional threshold switching in layered MoO3 nanobelts via changing electrodes from Au to Ag.


Author(s):  
Hannes Mahne ◽  
Helge Wylezich ◽  
Stefan Slesazeck ◽  
Thomas Mikolajick ◽  
Jozef Vesely ◽  
...  

2020 ◽  
Vol 12 (21) ◽  
pp. 24133-24140 ◽  
Author(s):  
Meilin Tu ◽  
Haipeng Lu ◽  
Songwen Luo ◽  
Hao Peng ◽  
Shangdong Li ◽  
...  

2014 ◽  
Vol 24 (36) ◽  
pp. 5679-5686 ◽  
Author(s):  
Haitao Sun ◽  
Qi Liu ◽  
Congfei Li ◽  
Shibing Long ◽  
Hangbing Lv ◽  
...  

1977 ◽  
Vol 3 (4) ◽  
pp. 217-224 ◽  
Author(s):  
D. P. Oxley

Experiments on electroforming of Metal-Oxide-Metal thin film sandwiches which have been electroformed to exhibit voltage-controlled negative resistance are summarized and an outline of recent evidence in favour of localized or filamentary conduction is given.A similar review is given of the experiments on oxide sandwich structures which have been formed to exhibit current-controlled negative resistance or threshold switching and memory switching. Current theories are reviewed briefly. Finally oxide memory devices are compared with those based upon the chalcogenide glasses.


Metals ◽  
2021 ◽  
Vol 11 (10) ◽  
pp. 1605
Author(s):  
Jooyoung Pyo ◽  
Seungjin Woo ◽  
Kisong Lee ◽  
Sungjun Kim

In this work, we observed the duality of threshold switching and non-volatile memory switching of Ag/SnOx/TiN memory devices by controlling the compliance current (CC) or pulse amplitude. The insulator thickness and chemical analysis of the device stack were confirmed by transmission electron microscope (TEM) images of the Ag/SnOx/TiN stack and X-ray photoelectron spectroscopy (XPS) of the SnOx film. The threshold switching was achieved at low CC (50 μA), showing volatile resistive switching. Optimal CC (5 mA) for bipolar resistive switching conditions with a gradual transition was also found. An unstable low-resistance state (LRS) and negative-set behavior were observed at CCs of 1 mA and 30 mA, respectively. We also demonstrated the pulse operation for volatile switching, set, reset processes, and negative-set behaviors by controlling pulse amplitude and polarity. Finally, the potentiation and depression characteristics were mimicked by multiple pulses, and MNIST pattern recognition was calculated using a neural network, including the conductance update for a hardware-based neuromorphic system.


2016 ◽  
Vol 52 (26) ◽  
pp. 4828-4831 ◽  
Author(s):  
Chaochao Zhang ◽  
Jie Shang ◽  
Wuhong Xue ◽  
Hongwei Tan ◽  
Liang Pan ◽  
...  

The coexistence and inter-conversion between threshold and memory resistance switching in a ferritin memristor makes it a promising candidate for physiological applications.


2016 ◽  
Vol 702 ◽  
pp. 37-42 ◽  
Author(s):  
K. Ramesh ◽  
Pumlianmunga ◽  
R. Venkatesh ◽  
N. Naresh ◽  
E.S.R. Gopal

Chalcogenide glasses switches from a high-resistance (OFF) state to a low-resistance (ON) state at a threshold voltage (Vth) under high electric fields. This electrical switching is of two types: (i) Threshold switching and (i) memory switching. Threshold switching device revert back to the OFF state immediately upon the removal of the applied voltage, whereas a memory device retains the ON state even after the removal of the applied voltage. Due to Joule heating, a filament is formed between the electrodes and the current is confined within this filament and there is an increase in current density. This increases the temperature inside the filament and there is a transition from high resistive amorphous/glass phase to a low resistive crystalline phase in memory switching materials. In the threshold switching glasses electronic processes like space charge, Poole-Frenkel effect, etc., are responsible. The structural transitions are irreversible whereas the electronic processes are reversible and hence the threshold glasses regain their original state (OFF) and memory glasses remain in the ON state.Interestingly, differential scanning calorimetric studies (DSC) show that both the threshold and memory switching glasses exhibit crystallization (structural transition). Accordingly, glasses which crystallize upon heating should exhibit memory switching behaviour. But the switching experiments indicate that among the glasses which undergo structural transition (crystallization) some show threshold switching and some show memory switching. To understand this, Cu-As-Se, Al-As-Te, Ge-As-Se-Te, Al-As-Se-Te glasses were thermally crystallized under vacuum in two ways: (i) by annealing at their respective crystallization temperatures (Tc) and (ii) heated up to their melting temperatures (Tm) and cooled back to room temperature. Interestingly, most of the threshold switching glasses shows amorphous nature or a huge amorphous background with crystalline peaks when cooled from their melting temperatures. The memory switching glasses crystallize in both the cases.We propose that both threshold and memory glasses undergo phase change and the crystalline phases formed from the melt state are responsible for switching to occur. Hence, at the time of switching the sample in between the electrodes undergo phase change by glass → melt → crystal transformation and not by the direct glass → crystal transformation.


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