A macromodeling approach to the synthesis of analog circuits using circuit decomposition and numerical circuit analysis

Author(s):  
H.A. Hamad ◽  
R.E. Massara
VLSI Design ◽  
2010 ◽  
Vol 2010 ◽  
pp. 1-12 ◽  
Author(s):  
Reza Hashemian

A new technique is presented for biasing of analog circuits. The biasing design begins with local biasing of the nonlinear components (transistors), done according to the pre-specified operating points (OPs) and for the best performance of the circuit. Next, the transistors are replaced with their linear models to perform the AC design. Upon finishing with the AC design we need to move from the local biasing to global (normal) biasing while the OPs are kept unchanged. Here fixators—nullators plus sources—are shown to be very instrumental and with norators—as the place holders for the DC supplies in the circuit—they make pairs. The solution of the circuit so prepared provides the DC supplies at the designated locations in the circuit. The rules to engage in circuit analysis with fixator-norator pairs are discussed, and numerous pitfalls in this line are specified. Finally, two design examples are worked out that clearly demonstrate the capability and power of the proposed technique for biasing any analog circuit.


2020 ◽  
Vol 13 (2) ◽  
pp. 1-6
Author(s):  
Alexandru Grib ◽  
Zoltan Erdei ◽  
Mihaela Cristina Turcu ◽  
Alina Constantin ◽  
Mihai Iordache

Abstract This paper is focused on some kind of mystery circuit nullator, nullor, current mirror, and voltage mirror, all of them known as pathological elements. These pathological elements can be used to perform circuit modelling, symbolic circuit analysis, circuit synthesis, circuit design and to develop applications that involve modern active devices. It is described a new modeling of nullor-based active devices from the circuit abstraction level. In this paper it is presented the way all types of equations which describe the circuit containing nullors can be directly formulated from the diagrams of these circuits if we took into account that a nullator is an over-determined two-port circuit element (zero voltage, zero current) and the norator is an undetermined two-port circuit element (any voltage and any current). To simulate the nullors with ideal voltage controlled voltage sources, ec = Ac_c uc, with the control gate an ideal independent current source, jC = 0.0 A and with the amplification (transfer) factor Ac_C very big (theoretically ∞), the analog circuits with nullors can be analyzed by using any of the existing simulation software. By this way, it was possible the elaboration of efficient algorithms for an automatic formulation of Kirchhoff’s equations, of loop equations, of modified nodal equations and of state equations for circuits with pathological elements. These procedures can be easily implemented in dedicated programs for the simulations of the complex analog circuits with pathological elements. The example presented in this paper validates the presented models for nullors.


2017 ◽  
pp. 47-53
Author(s):  
Konstantin Sergeyevich GORSHKOV ◽  
◽  
Sergei Aleksandrovich KURGANOV ◽  
Vladimir Valentinovich FILARETOV ◽  
◽  
...  

Author(s):  
B.J. Cain ◽  
G.L. Woods ◽  
A. Syed ◽  
R. Herlein ◽  
Toshihiro Nomura

Abstract Time-Resolved Emission (TRE) is a popular technique for non-invasive acquisition of time-domain waveforms from active nodes through the backside of an integrated circuit. [1] State-of-the art TRE systems offer high bandwidths (> 5 GHz), excellent spatial resolution (0.25um), and complete visibility of all nodes on the chip. TRE waveforms are typically used for detecting incorrect signal levels, race conditions, and/or timing faults with resolution of a few ps. However, extracting the exact voltage behavior from a TRE waveform is usually difficult because dynamic photon emission is a highly nonlinear process. This has limited the perceived utility of TRE in diagnosing analog circuits. In this paper, we demonstrate extraction of voltage waveforms in passing and failing conditions from a small-swing, differential logic circuit. The voltage waveforms obtained were crucial in corroborating a theory for some failures inside an 0.18um ASIC.


Author(s):  
Fubin Zhang ◽  
David Maxwell

Abstract Based on the understanding of laser based techniques’ physics theory and the topology/structure of analog circuit systems with feedback loops, the propagation of laser induced voltage/current alteration inside the analog IC is evaluated. A setup connection scheme is proposed to monitor this voltage/current alteration to achieve a better success rate in finding the fail site or defect. Finally, a case of successful isolation of a high resistance via on an analog device is presented.


Author(s):  
Ted Kolasa ◽  
Alfredo Mendoza

Abstract Comprehensive in situ (designed-in) diagnostic capabilities have been incorporated into digital microelectronic systems for years, yet similar capabilities are not commonly incorporated into the design of analog microelectronics. And as feature sizes shrink and back end interconnect metallization becomes more complex, the need for effective diagnostics for analog circuits becomes ever more critical. This paper presents concepts for incorporating in situ diagnostic capability into analog circuit designs. Aspects of analog diagnostic system architecture are discussed as well as nodal measurement scenarios for common signal types. As microelectronic feature sizes continue to shrink, diagnostic capabilities such as those presented here will become essential to the process of fault localization in analog circuits.


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