Strain effects on transport properties of Si nanowire devices

Author(s):  
Viet-Hung Nguyen ◽  
Francois Triozon ◽  
Yann-Michel Niquet
Author(s):  
Hua Li ◽  
Gang Li

In this work, we model the strain effects on the electrical transport properties of Si/Ge nanocomposite thin films. We utilize a two-band k·p theory to calculate the variation of the electronic band structure as a function of externally applied strains. By using the modified electronic band structure, electrical conductivity of the Si/Ge nanocomposites is calculated through a self-consistent electron transport analysis, where a nonequilibrium Green’s function (NEGF) is coupled with the Poisson equation. The results show that both the tensile uniaxial and biaxial strains increase the electrical conductivity of Si/Ge nanocomposite. The effects are more evident in the biaxial strain cases.


2010 ◽  
Vol 21 (43) ◽  
pp. 435201 ◽  
Author(s):  
Wei-Chen Chen ◽  
Horng-Chih Lin ◽  
Zer-Ming Lin ◽  
Chin-Tsai Hsu ◽  
Tiao-Yuan Huang

2002 ◽  
Author(s):  
Xiaoxing Xi ◽  
Weidong Si ◽  
X. H. Zeng ◽  
A. Soukiassian ◽  
C. L. Jia ◽  
...  

RSC Advances ◽  
2016 ◽  
Vol 6 (84) ◽  
pp. 80431-80437 ◽  
Author(s):  
Xiaohui Yu ◽  
Huilong Dong ◽  
Lu Wang ◽  
Youyong Li

The band gap of TiO2 nanotubes can be effectively reduced or enhanced by applying isotropic strain along the axial direction. ΔE for the armchair (n,n) TiO2 nanotubes is reduced with tensile strain.


2006 ◽  
Vol 88 (14) ◽  
pp. 142903 ◽  
Author(s):  
W. Ramadan ◽  
S. B. Ogale ◽  
S. Dhar ◽  
S. X. Zhang ◽  
D. C. Kundaliya ◽  
...  

Nanoscale ◽  
2016 ◽  
Vol 8 (22) ◽  
pp. 11658-11673 ◽  
Author(s):  
V. Hung Nguyen ◽  
Trinh X. Hoang ◽  
P. Dollfus ◽  
J.-C. Charlier

2010 ◽  
Vol 87 (11) ◽  
pp. 2407-2410 ◽  
Author(s):  
Kyeong-Ju Moon ◽  
Ji-Hyuk Choi ◽  
Tae-Il Lee ◽  
Moon-Ho Ham ◽  
Wan-Joo Maeng ◽  
...  

MRS Advances ◽  
2016 ◽  
Vol 1 (56) ◽  
pp. 3755-3760 ◽  
Author(s):  
I. Zadorozhnyi ◽  
J. Li ◽  
S. Pud ◽  
M. Petrychuk ◽  
S. Vitusevich

ABSTRACTHere we report on the effect of gamma radiation treatment on transport properties and single-trap kinetics in Si nanowire (NW) field effect transistor (FET) structures. We used noise spectroscopy as a powerful method for advanced physical characterization of nanoscale devices. Our results demonstrate that transport properties of NW FETs can be changed using small doses of gamma radiation treatment. We reveal an enhancement of the gate coupling effect, which is explained as a result of the reorganization of the native defect structure after treatment. The radiation treatment approach allows the single-trap dynamic to be changed, which opens up prospects for a number of fundamental studies and applications of Si NW FET device structures, including biosensors.


Sign in / Sign up

Export Citation Format

Share Document