A Carrier Lifetime Sensitivity Probe Based on Transient Capacitance: A novel method to Characterize Lifetime in Z2FET
2010 ◽
Vol 31
(8)
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pp. 084005
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Keyword(s):
Keyword(s):
1968 ◽
Vol 24
(4)
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pp. 301-316
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Keyword(s):
2013 ◽
Vol 712-715
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pp. 341-344
1995 ◽
Vol 53
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pp. 1020-1021
1997 ◽
Vol 71-72
(1-3)
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pp. 403-425
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2020 ◽
Keyword(s):
1878 ◽
Vol 5
(109supp)
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pp. 1725-1726