Correlating Interconnect Stress Test and Accelerated Thermal Cycling for Accessing the Reliabilities of High Performance Printed Circuit Boards

Author(s):  
Winco K. C. Yung ◽  
Hai Ming Liem ◽  
Henry H. S. Choy ◽  
Yuen Wah Man
2014 ◽  
Vol 2014 (HITEC) ◽  
pp. 000235-000245
Author(s):  
David Shaddock ◽  
Liang Yin

Printed circuit boards have been reported to have limited lifetime at 200 to 250°C. Characterization and modeling high temperature laminates for application at 200 to 250°C was conducted to better quantify the mean lifetime using accelerated testing of key functional parameters. Life testing and model development was applied for via cyclic life, peel strength, and weight loss. Four high temperature laminates consisting of 2 types were evaluated. Via lifetime was characterization using Interconnect Stress Test (IST) coupons. Peel strength was tested using IPC IPC-TM-650 method 2.4.8c. Weight loss was characterized using isothermal aging. Comparison of lifetime is made between the laminate samples.


2012 ◽  
Vol 565 ◽  
pp. 442-447 ◽  
Author(s):  
Taiji Funabiki ◽  
Toshiki Hirogaki ◽  
Eiichi Aoyama ◽  
Keiji Ogawa ◽  
Hiroyuki Kodama

This paper describes micro-drilling processes for printed circuit boards (PCBs) containing fillers with high hardness and high thermal conductivity. Inspired primarily by devices such as digital cameras, laptop computers, and wireless communications devices, the electronics field today is continuously demanding smaller, lighter, and more technologically advanced high performance devices. However, that the increase in semiconductor-generated heat tends to affect such devices negatively. Additionally, from the viewpoint of environmental problems, electric vehicles and LEDs are being developed actively. PCBs are one of the principal components for building such devices. In recent years, PCBs containing alumina fillers with high thermal conductivity have been developed and begun to be widely used. However, when processing these PCBs, the drill tools become severely worn because of the filler’s high hardness. We therefore examined the drill wear characteristics. The results show the filler is the main factor that causes drill wear, while the increase in cutting force does not affect it. The cutting force increases with the drill wear linearly. Moreover, the characteristic of PCBs with higher filler content rates is close to that of inorganic material like ceramics.


1982 ◽  
Vol 1 (1) ◽  
pp. 38-43 ◽  
Author(s):  
D. Fishman ◽  
N. Cooper

It is reasoned that wide penetration of chip carriers into equipment for professional and commercial applications depends on developing methods for mounting the leadless types directly on to conventional polymer type printed circuit boards. The main problem to be overcome is fatigue failure of the solder joints due to the mismatch in thermal expansion, evidenced by poor thermal cycling performance. In this paper the thermal cycling performance is compared when four sizes of ceramic leadless chip carrier are mounted on a selection of printed circuit board materials ranging from the conventional to those specially formulated, either on the basis of matching the coefficient of thermal expansion of the chip carrier material, or to provide a layer of compliant elastomer material underneath the layer bearing the copper contact layer, so that strain due to thermal expansion mismatch is not transmitted to the solder layer. Over 400 thermal cycles (−55 to + 125°C) were recorded using proprietary versions of elastomer coated substrates. For appropriate applications the basis is thus laid for an economic and technically acceptable solution. The practical implications of two methods of soldering—wave (jet) and vapour phase—are also discussed.


1990 ◽  
Vol 188 ◽  
Author(s):  
Richard Haynes

1. IntroductionIn VLSI processing and other applications such as printed circuit boards thin films of copper, usually used as conductors, undergo thermal cycling. This thermal cycling can cause loss of adhesion and mechanical failures thus decreasing reliability of the devices[l–7]. Understanding thermally induced stress due to mismatch of thermal expansion may assist in generating designs, processes and material replacement for increased reliability. This paper reports studies of the temperature dependence of stresses for plated and sputtered copper and plated copper-silver and copper-tin alloys. Studies of thermally annealed plated copper and copper-tin alloys are also reported.


2015 ◽  
Vol 2015 (HiTEN) ◽  
pp. 000100-000110 ◽  
Author(s):  
David Shaddock ◽  
Liang Yin

Printed circuit boards have been reported to have limited lifetime at 200 to 250°C. Characterization of high temperature laminates for application at 200 to 250°C was conducted to better quantify their lifetime using accelerated testing of key functional parameters. Eight high temperature laminates consisting of 3 material types was evaluated. Life testing was applied for via cyclic life, weight loss, peel strength, and surface insulation resistance. Via lifetime was characterization using Interconnect Stress Test (IST) coupons. Weight loss was measured at intervals during the life of the tests. Peel strength was tested using IPC IPC-TM-650 method 2.4.8c. Weight loss was characterized using isothermal aging. Comparison of lifetime is made between the laminate samples. The non-polyimide laminates exhibited the longer life times than polyimide laminates in most tests except peel strength. Peel strength is the life limiting parameter for the laminates. Parylene HT was found to improve stability in peel strength and weight loss of one PTFE laminate tested.


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