Using Oxide-Trap Charge-Pumping Method in Radiation-Reliability Analysis of Short Lightly Doped Drain Transistor
2010 ◽
Vol 10
(1)
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pp. 18-25
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2009 ◽
Vol 9
(2)
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pp. 222-230
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2004 ◽
Vol 51
(4)
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pp. 1732-1736
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1992 ◽
Vol 39
(6)
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pp. 2192-2203
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Keyword(s):
2000 ◽
Vol 47
(1)
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pp. 171-177
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