Why is oxide-trap charge-pumping (OTCP) method appropriate for extracting the radiation-induced traps in mosfet?
2009 ◽
Vol 9
(2)
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pp. 222-230
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1992 ◽
Vol 39
(6)
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pp. 2192-2203
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2010 ◽
Vol 10
(1)
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pp. 18-25
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2004 ◽
Vol 51
(4)
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pp. 1732-1736
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Keyword(s):
1992 ◽
Vol 39
(6)
◽
pp. 2152-2157
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Keyword(s):