Energy-Resolved Soft-Error Rate Measurements for 1–800 MeV Neutrons by the Time-of-Flight Technique at LANSCE

IEEE Transactions on Nuclear Science ◽

10.1109/tns.2020.3025727 ◽

2020 ◽

Vol 67 (11) ◽

pp. 2363-2369

Author(s):

Hidenori Iwashita ◽

Gentaro Funatsu ◽

Hirotaka Sato ◽

Takashi Kamiyama ◽

Michihiro Furusaka ◽

...

Keyword(s):

Time Of Flight ◽

Soft Error Rate

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High-accuracy estimation of soft error rate using PHYSERD with circuit simulation

2014 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) ◽

10.1109/sispad.2014.6931634 ◽

2014 ◽

Author(s):

Takashi Kato ◽

Taiki Uemura ◽

Hideya Matsuyama

Keyword(s):

Circuit Simulation ◽

High Accuracy ◽

Accuracy Estimation ◽

Soft Error Rate

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CLEAR: A Cross-Layer Soft Error Rate Reduction method based on mitigating DETs in nanoscale combinational logics

Microprocessors and Microsystems ◽

10.1016/j.micpro.2021.104282 ◽

2021 ◽

pp. 104282

Author(s):

Amir M. Hajisadeghi ◽

Hamid R. Zarandi

Keyword(s):

Reduction Method ◽

Cross Layer ◽

Rate Reduction ◽

Soft Error Rate

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Underground characterization and modeling of alpha-particle induced Soft-Error Rate in CMOS 65nm SRAM

2011 12th European Conference on Radiation and Its Effects on Components and Systems ◽

10.1109/radecs.2011.6131359 ◽

2011 ◽

Author(s):

S. Martinie ◽

J.L. Autran ◽

S. Sauze ◽

D. Munteanu ◽

S. Uznanski ◽

...

Keyword(s):

Alpha Particle ◽

Soft Error Rate

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Cosmic ray induced soft error rate in VLSI circuits

IEEE Electron Device Letters ◽

10.1109/edl.1983.25694 ◽

1983 ◽

Vol 4 (6) ◽

pp. 172-174 ◽

Author(s):

G.A. Sai-Halasz

Keyword(s):

Vlsi Circuits ◽

Soft Error Rate

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Scaling Trends in the Soft Error Rate of SRAMs from Planar to 5-nm FinFET

2021 IEEE International Reliability Physics Symposium (IRPS) ◽

10.1109/irps46558.2021.9405216 ◽

2021 ◽

Author(s):

B. Narasimham ◽

V. Chaudhary ◽

M. Smith ◽

L. Tsau ◽

D. Ball ◽

...

Keyword(s):

Soft Error Rate

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Neutron-induced soft error rate measurements in semiconductor memories

Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment ◽

10.1016/j.nima.2007.04.049 ◽

2007 ◽

Vol 579 (1) ◽

pp. 252-255 ◽

Author(s):

Kenan Ünlü ◽

Vijaykrishnan Narayanan ◽

Sacit M. Çetiner ◽

Vijay Degalahal ◽

Mary J. Irwin

Keyword(s):

Soft Error Rate

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A critical re-examination of body-bias on the soft error rate and single-event latch-up in automotive SRAMs

2017 IEEE International Reliability Physics Symposium (IRPS) ◽

10.1109/irps.2017.7936268 ◽

2017 ◽

Author(s):

N. N. Mahatme ◽

B. Min ◽

K. Loiko

Keyword(s):

Single Event ◽

Soft Error Rate ◽

Body Bias ◽

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GPU-Accelerated Soft Error Rate Analysis of Large-Scale Integrated Circuits

Soft Error Reliability of VLSI Circuits ◽

10.1007/978-3-030-51610-9_4 ◽

2020 ◽

pp. 45-54

Author(s):

Behnam Ghavami ◽

Mohsen Raji

Keyword(s):

Integrated Circuits ◽

Large Scale ◽

Soft Error Rate ◽

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Soft Error Rate Estimation of VLSI Circuits

Soft Error Reliability of VLSI Circuits ◽

10.1007/978-3-030-51610-9_2 ◽

2020 ◽

pp. 9-23

Author(s):

Behnam Ghavami ◽

Mohsen Raji

Keyword(s):

Vlsi Circuits ◽

Soft Error Rate ◽

Rate Estimation

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On the correlation between Static Noise Margin and Soft Error Rate evaluated for a 40nm SRAM cell

2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS) ◽

10.1109/dft.2013.6653597 ◽

2013 ◽

Author(s):

Elena I. Vatajelu ◽

G. Tsiligiannis ◽

L. Dilillo ◽

A. Bosio ◽

P. Girard ◽

...

Keyword(s):

Static Noise Margin ◽

Soft Error Rate ◽

Noise Margin ◽

Sram Cell ◽

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