Two-dimensional bias dependent model for the screening length in double-gate Tunnel-FETs
Keyword(s):
Keyword(s):
Pseudo-Two-Dimensional Model for Double-Gate Tunnel FETs Considering the Junctions Depletion Regions
2010 ◽
Vol 57
(4)
◽
pp. 827-834
◽
2019 ◽
Vol 18
(3)
◽
pp. 882-892
◽