Temperature acceleration of oxide breakdown and its impact on ultra-thin gate oxide reliability
2007 ◽
Vol 7
(1)
◽
pp. 74-83
◽
2010 ◽
Vol 57
(9)
◽
pp. 2296-2305
◽
1997 ◽
Vol 117-118
◽
pp. 237-240
◽
2001 ◽
Vol 40
(Part 2, No. 12A)
◽
pp. L1286-L1289
◽
2014 ◽
Vol 696
◽
pp. 57-61
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