A Simulation Based Study on Gate Oxide Breakdown Characteristics for NMOS

2014 ◽  
Vol 696 ◽  
pp. 57-61
Author(s):  
Ling Sun ◽  
Yu Wei Zhou ◽  
Hong Wang ◽  
Xiang Dong Luo ◽  
Jia Yuan Guo
Keyword(s):  
Gate Oxide ◽  
Experimental Results ◽  
Electrical Characteristics ◽  
Oxide Breakdown ◽  
Simulation Based ◽  
Fundamental Understanding ◽  
Thin Gate Oxide ◽  
The Relationship

The relationship between the location of gate oxide breakdown in n-MOSFETs and its electrical characteristics has been studied by using TCAD software. The comparison of device terminal current with gate oxide breakdown at different locations suggests that the variation of the source and the drain currents can be directly correlated to the breakdown location in the ultra thin gate oxide. The results provide a fundamental understanding to the experimental results observed in our devices.

Thin-Gate-Oxide Breakdown and CPU Failure-Rate Estimation

2007 ◽  
Vol 7 (1) ◽  
pp. 74-83 ◽  
Author(s):  
Yung-Huei Lee ◽  
Neal R. Mielke ◽  
William McMahon ◽  
Yin-Lung Ryan Lu ◽  
Sangwoo Pae
Keyword(s):  
Failure Rate ◽  
Gate Oxide ◽  
Oxide Breakdown ◽  
Rate Estimation ◽  
Thin Gate Oxide

Prediction and Modeling of Thin Gate Oxide Breakdown Subject to Arbitrary Transient Stresses

2010 ◽  
Vol 57 (9) ◽  
pp. 2296-2305 ◽  
Author(s):  
David F. Ellis ◽  
Yuanzhong Zhou ◽  
Javier A. Salcedo ◽  
Jean-Jacques Hajjar ◽  
Juin J. Liou
Keyword(s):  
Gate Oxide ◽  
Oxide Breakdown ◽  
Thin Gate Oxide

Observation of Micro-Oxygen Precipitates in the Vicinity of the Oxidation-Induced Stacking Fault Ring and Their Effects on Thin Gate Oxide Breakdown

2001 ◽  
Vol 40 (Part 2, No. 12A) ◽  
pp. L1286-L1289 ◽  
Author(s):  
Hyun-Soo Kim ◽  
Ki-Sang Lee ◽  
Bo-Young Lee ◽  
Hak-Do Yoo ◽  
Seung-Ho Pyi ◽  
...  
Keyword(s):  
Gate Oxide ◽  
Stacking Fault ◽  
Oxide Breakdown ◽  
Thin Gate Oxide ◽  
Oxygen Precipitates

The Effect of Organic Compounds Contamination on the Electrical Characteristics of Ultra-Thin Gate Oxide Films

2000 ◽  
Author(s):  
Yoshihide Wakayama ◽  
Takeshi Ohkawa ◽  
Osamu Nakamura ◽  
Sadao Kobayashi ◽  
Shigetoshi Sugawa ◽  
...  
Keyword(s):  
Organic Compounds ◽  
Oxide Films ◽  
Gate Oxide ◽  
Electrical Characteristics ◽  
Thin Gate Oxide

Prediction of Logic Product Failure Due To Thin-Gate Oxide Breakdown

2006 ◽  
Author(s):  
Yung-huei Lee ◽  
Neal Mielke ◽  
Marty Agostinelli ◽  
Sukirti Gupta ◽  
Ryan Lu ◽  
...  
Keyword(s):  
Gate Oxide ◽  
Product Failure ◽  
Oxide Breakdown ◽  
Thin Gate Oxide
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